Debug
See Also: Debuggers
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Product
Debug Probe
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High-performance Debug Probe for embedded development with support for multiple target architectures.
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Product
Multipurpose Debug Board
DB40 Debug Module
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The DB40 Debug Card is designed for debugging of COM Express and PC/104 boards. It includes the following features: - Port 80/81 decoding for Power On Self Test (POST) via LPC - Interface to SPI Flash for BIOS update - Interface to Board Management Controller (BMC) for update - Power and Reset buttons and status LEDs The DB40 Debug card can only be used on products that have the appropriate FFC debug connector designed for this purpose. (Includes DB40 Debug Module, two 40-pin FFC cables, and 14-pin cable for SP100 DediProg USB to SPI programmer.)
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Product
Multipurpose Debug Board For EC
DB30 x86 Debug Module
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The DB30 x86 Debug Card is designed for debugging of COM Express modules with FFC (FlexFoil Cable) debug connector. It includes an 80 port for Power on and Self-test (POST) via I2C interface, interface to SPI Flash for BIOS update, interface to EC for Embedded Controller (EC) update, Power and Reset buttons, and Status LEDs and Test Point for various debug tests.
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Product
Debug Probes
J-Link and J-Trace
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SEGGER Microcontroller GmbH & Co. KG
SEGGER J-Links are the most widely used line of debug probes available today. They've been proven for more than 10 years with over 250,000 units sold, including OEM versions and on-board solutions. This popularity stems from the unparalleled performance, extensive feature set, large number of supported CPUs, and compatibility with all popular development environments.
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Product
DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
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NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
Test System
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
Hardware Debug Interface & Stand Alone Programmer
Cyclone PRO
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P&E Microcomputer Systems' Cyclone PRO is an extremely flexible tool designed for in-circuit flash programming, debugging, and testing of Freescale HC08, HCS08, HC12, HC(S)12(X), and RS08 microcontrollers. Now featuring support for Freescale's ColdFire V1.
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Product
Debug Adapters
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One thing is sure in the life of an embedded developer - your next microcontroller development board will be fitted with a different debug connector to the one used in your previous design.
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Product
LPDDR5 Protocol Debug And Analysis Solution
U4971A
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The LPDDR5 Solution Bundle provides a systemized hardware, probing, and software solution for LPDDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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Product
Protocol Test Solutions to Analyze, Debug and Validate Your Products
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Teledyne LeCroy offers a wide range of protocol test solutions - from protocol analyzers to conformance testers we've got the tools you need to thoroughly test your products. Select from the below technologies to see how we can help.
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Product
DDR5 Protocol Debug And Analysis Solution
U4970A
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The DDR5 solution bundle provides a systemized hardware, probing, and software solution for DDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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Product
Debug probe for ARM Cortex processors
USB Multilink ACP
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P&E’s USB Multilink ACP is a debug probe which allows a PC/laptop access to JTAG/SWD on ARM Cortex devices from several manufacturers (see complete list below). It connects between a USB port on a Windows machine and the standard debug connector on the target. The product photos to the left of this page show how the headers can be accessed by simply flipping open the plastic case. Ribbon cables suitable for a variety of architectures are included. By using the USB Multilink ACP, the user can take advantage of the debug mode to halt normal processor execution and use a PC to control the processor. The user can then directly control the target’s execution, read/write registers and memory values, debug code on the processor, and program internal or external FLASH memory devices.
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Product
Logic Analyzer
FS2352B
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The FS2352B is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR3 DIMMs. This logic analyzer probe has a CKE qualification circuit that allows for the use of older Keysight logic analysis modules when testing systems using power saving modes.
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
100 Pin Breakout Interface
VSI-Breakout-100
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The VSI-Breakout-100 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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Product
Basic Desktop Appliance for PCI Express® Gen5
DE200-G5
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Is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols.
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Product
Gen-Z
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Gen-Z is a data-access technology designed to provide high-speed, low-latency, memory-semantic access to data and devices via direct-attached, switched or fabric topologies. Gen-Z components use low-latency read and write operations to directly access data and use a variety of advanced operations to move data with minimal application or processor involvement. Gen-Z fabric utilizes memory-semantic communications to move data between memories on different components with minimal overhead. Memory-semantic communications are extremely efficient and simple, which is critical to delivering optimal performance and power consumption. Teledyne LeCroy provides protocol analysis and error injection test equipment to support development and debug of Gen-Z based devices
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Product
Logic Analyzer Probes
FS2354 & FS2355
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The FS2354 and FS2355 are logic analyzer probes used to test DDR3 SO-DIMM memory modules. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 SO-DIMM systems.
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Product
DH Series QuickLink Adapter, 8 GHz BW
DH-QL
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Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Product
DisplayPort v1.3 Protocol Analysis Probe
FS4500
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The FuturePlus FS4500 DisplayPort Analysis Probe provides a mechanical, electrical and software interface to the DisplayPort bus, a digital display interface standard supported by the Video Electronics Standards Association (VESA). The FS4500 is used to design and debug computer motherboards, monitors, home theater systems, and silicon chips incorporating DisplayPort technology.
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Product
RF Test Spectrum Measurements over CPRI
Integris 3000
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Most modern cell tower network configurations place the Remote Radio Head (RRH) at the top of the tower and the baseband unit(BBU) at the bottom of the tower. While this configuration is advantageous for both computational efficiency and mitigation of RF loss across the cable, it means the only place along RF can be accessed is at the top of the tower. This forces field technicians to have to climb the tower to measure and debug RF noise problems.
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Product
Signal Generator
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Tektronix signal generators cover a wide range of applications, from replicating sensor signals to creating RF and the fastest high speed serial data signals. Each versatile signal generator can create a virtually unlimited number of signals - analog or digital, ideal or distorted, standard or custom. From the world's only direct synthesis of high-speed serial data waveforms for simplified receiver testing, to the world's most versatile arbitrary function generator for common stimulus signals, Tektronix has a signal generator to meet your debug challenge.
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Product
PXI Digital Pattern Instrument
Digital Pattern
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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Product
HEVC Analyzer for Rapid Prototyping
HARP
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HARP is an open source toolkit for rapid prototyping of new HEVC / H.265 video codec extensions. Our motivation for creating HARP lies in the simple idea that a well-chosen development environment allows to focus time and resources more on the design stage of new HEVC extensions and less on subsequent implementation and debugging tasks.
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Product
LabVIEW Full Development System
System
LabVIEW is engineering software designed specifically for test, measurement, and control applications that require rapid access to hardware and data insights. The LabVIEW Full Development System is recommended to customize your engineering application with advanced inline analysis and control algorithms. For applications that require software engineering tools to develop, debug, and deploy professional applications, consider LabVIEW Professional Development System.
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Product
Analyze RTL
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ASICs and FPGA routinely have millions of gates with memories, transceivers, third party IP and processor cores. Problems can be time consuming and complex to debug in the lab and through simulations. Designers need verification tools that can identify problems quickly to reduce their verification and debug time before simulation, before synthesis, and definitely before burning chips in the lab.
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Product
Oscilloscope
2563-MSO
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The 2560 Digital Storage and Mixed Signal Oscilloscope (MSO) Series delivers advanced features and debug capabilities for a wide range of applications. With up to 300 MHz bandwidth in a 4-channel configuration, each model offers a maximum sample rate of 2 GSa/s, and a maximum memory depth of 140 Mpts. In addition, these oscilloscopes provide an 8” color display with 256 levels of color grading combined with a high waveform update rate up to 140,000 wfms/s, which allows the instruments to capture infrequent glitches with excellent signal fidelity.
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Product
SSD Test Systems
MPT3000ES / MPT3000ES2
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Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Product
High-Performance Intelligent Pod for Corelis Boundary-Scan Controllers
ScanTAP 4 & 8
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Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires equipment with high-performance specifications and extended features.Corelis ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities such as analog voltage measurement, the ScanTAP family of intelligent pods is the ideal JTAG interface for high-performance environments.
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Product
cRIO-9042, 1.60 GHz Quad-Core CPU, 4 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller
785622-01
Controller
1.60 GHz Quad-Core CPU, 4 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller - The cRIO-9042 is a rugged, high-performance, customizable embedded controller that offers Intel Atom quad-core processing, NI-DAQmx support, and an SD card slot for data-logging, embedded monitoring, and control. It includes a Kintex-7 70T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
