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Showing results: 1291 - 1305 of 1719 items found.

  • Analysis

    DENKEN Co., Ltd.

    External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.

  • ADVANCE | Drop Shape

    KRÜSS GmbH

    ADVANCE is an example of how even the most complex measuring tasks, such as determining the surface free energy (SFE) of a solid, can be represented on a clear and easy to use interface. With just a few intuitive editing steps you can prepare software-controlled contact angle measurements utilizing every degree of automation up to complete SFE measurement, position mapping, or tilting experiments. Using our Liquid Needle dosing technique, ADVANCE even accesses the SFE of a surface within just one second.

  • Switch Probes

    Smiths Interconnect

    A Switch Probe is a spring contact probe and receptacle combination that is normally open, and after a designated travel the switch probe closes. The most common use for switch probes is in the cable harness testing industry. The switch probe is used to verify the correct location of a terminal in a connector while checking the retention force as well. Switch probes also verify the presence of nonconductive components such as caps for connectors or devices on a circuit board. Smiths Interconnect offers three standard sizes of switch probes.

  • Compact Converters

    Virginia Diodes, Inc.

    Virginia Diodes offers compact converters (CCs) for frequency up and down-conversion. These converters are easy to use and well suited for high performance up and down conversion of wide band modulated millimeter-wave signals. VDI CCs offer full waveguide band coverage and are available from WR28 (22.5-40 GHz) to WR2.2 (330-500 GHz) with additional CCs under development. Compact converters can typically be delivered within 9-11 weeks ARO or less. Contact VDI for more information.

  • Wavefront Measurement Systems Using the Shack-Hartmann Sensor

    Lumetrics Inc.

    Lumetrics has applied the ingenious Shack-Hartmann sensor to a range of wavefront measurement systems ideal for analyzing optics-related products and materials, from contact lenses to intraocular lenses to laser beam analysis, surface measurement, and phase parameters. While Shack-Hartmann technology may be widely adopted in the wavefront metrology industry, Lumetrics has applied the technology in unique ways and added industry-leading hardware and software features to our systems that offer you significant advantages over our competitors.

  • Atomic Oven

    AOSense

    Atomic oven with collimated output for ultra-high vacuum systems, loaded with Sr, Yb or Ca. The oven provides superior heat isolation while achieving high atomic flux. Its low power consumption results in exceptionally low pressures during normal operation for temperatures up to 650 °C. The chamber is shipped in an ultra-high vacuum storage chamber supplied by AOSense. Customers can provide AOSense with a previously purchased storage chamber for repeat orders. Please contact us for more information.

  • Dimensional Inspection (3D Inspection)

    Exact Metrology

    The 3D measurement data from our scanners and PCMMs offers a comprehensive definition of a physical object that is used for measurement, inspection, comparison and reporting. When a part is defined by millions of points, you can see subtle deviations, slight variations and fine details, which gives you the confidence that a part (or mold) meets your specifications. To deliver the best of both worlds, we combine 3D scanning with our contact, touch-probe measurement tools to deliver precise dimensions on geometric shapes.

  • Combination Contact/Laser Photo Tachometer

    Extech 461995 - Extech Instruments Corporation

    This Tachometer provides both contact (0. 5 to 19,999 RPM) and non-contact (10 to 99,999 RPM) RPM measurement functions for use in virtually all applications. Laser guided non-contact measurements up to 6.5 ft. (2 meter) away for added safety and convenience. Comes with wheels for linear surface speed (0.2 to 6560 ft. /minute; 0.05 to 1999.9 m/minute) or RPM measurements, 4 AA batteries, 23 in. (0.6 m) reflective tape, carrying case, and user manual.

  • Testing Services

    Koehler Instrument Company, Inc.

    A complete source for your testing solutions, Koehler offers a wide range of in-house testing services based on selected standard test methods. Our staff is comprised of technical experts and the best instrumentation for fast, accurate and reliable results. We specialize in all tests for which we offer instrumentation as well as additional test methods. You are invited to send us samples for testing and evaluation at any time. Please contact your Koehler representative for additional information.

  • High Level of Customization at an Affordable Price

    TLP - Impulse Semiconductor Inc.

    The Impulse transmission line pulser (TLP) discharge networks are easily integrated with other instruments for a custom system matched for your device and process applications. Specifications include 1-10 nanosecond rise times, up to 40 amps peak, for 10-500 nanosecond pulse widths. It is a proven design incorporating 15 years of hardware and device development experience. Reliable performance over hundreds of processes, and thousands of products. All TLP systems are built by special request, contact us with your specifications or application.

  • Accelerometers

    Lumetronics

    Endevco accelerometers are used in the most demanding shock and vibration test environments.  Whether your application requires measuring DC response or high frequency bandwidth, surviving cryogenic temperatures or up to 1400˚F, sensing low frequency vibration or high-g shock, Meggitt offers a high reliability accelerometer in a variety of packages.  If you need assistance selecting the right sensor for your application, please contact us and we will help you select the best accelerometer for your test.

  • Slot Test Connector

    Meritec

    Meritec's 1MM Slot Test Connector was developed to eliminate many of the common problems associated with using a standard connector in a test application. When testing, the PCB is plugged in and out of the connector many times. The wiping action that occurs between the contacts and the board starts to wear down the plating on the contacts and the plastic housing itself.At some point in time the connector becomes a liability and can no longer be considered reliable. The standard connectors being used today for test applications have a life cycle of 250 to 500 (the number of insertion and withdrawals applied to the connector). Meritec's Slot Test Connector has a life cycle greater than 100,000!

  • Controllers

    BKM91 - Techna-Tool Inc.

    Clockwise and/or counter-clockwise rotation of the wand is programmable allowing an optimum adaptation to the machine.The scanning intensity is adjustable in 8 steps. Even rotating drills with small diameters can be checked.The scanning results are display as "OK" or "KO" and signaled by LEDs on the front side of the device.The PROFIBUS is a standard Sub-D 9 pin connection; the USB connection is a USB-mini plug / type B and meets the 2.0 specification.Three digital inputs serve to activate the functions "Teach-in" to learn the position to be scanned, "Start" to initialize the scanning process and "Configurable" for receiving a stop command.Two digital outputs provide the signals for the message "OK" or "KO".The relay contacts are configurable as N/C or N/O connections. They can be set as momentary (valid with start or timed) or latching.Convenient configuration software for programming and setting of tool data is available at no cost.Mini USB for PC connection3 digital control inputs (positive or negative logic) Start and teach signal One configurable input2 relay outputs selectable as N/C or N/O contact Signal all clear message ("OK") Signal error message ("KO") Scanner connection4 LEDs for status display Opening for top hat plug for optional connection to I/O extension module Din rail mounting

  • Controllers

    BKM91PN - Techna-Tool Inc.

    Clockwise and/or counter-clockwise rotation of the wand is programmable allowing an optimum adaptation to the machine.The scanning intensity is adjustable in 8 steps. Even rotating drills with small diameters can be checked.The scanning results are display as "OK" or "KO" and signaled by LEDs on the front side of the device.The PROFIBUS is a standard Sub-D 9 pin connection; the USB connection is a USB-mini plug / type B and meets the 2.0 specification.Three digital inputs serve to activate the functions "Teach-in" to learn the position to be scanned, "Start" to initialize the scanning process and "Configurable" for receiving a stop command.Two digital outputs provide the signals for the message "OK" or "KO".The relay contacts are configurable as N/C or N/O connections. They can be set as momentary (valid with start or timed) or latching.Convenient configuration software for programming and setting of tool data is available at no cost.Mini USB for PC connection3 digital control inputs (positive or negative logic) Start and teach signal One configurable input2 relay outputs selectable as N/C or N/O contact Signal all clear message ("OK") Signal error message ("KO") Scanner connection4 LEDs for status display Opening for top hat plug for optional connection to I/O extension module Din rail mounting

  • CCD/CPA Level 1 Card Testing

    EMVeriCard - FIME SAS

    EMVeriCard is an EMVCo qualified tool to test contact smart cards. The tool helps to enhance global interoperability of smart cards and prepare for certification testing for Level 1 electrical and protocol requirements according to EMVCo Common Core Definition (CCD) test plan.

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