IC Test
See Also: IC, Digital IC Testers, IC Clips, IC Probes, IC Test Systems
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Ethernet and Fibre Channel Test Platform
SierraNet M648
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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ICE 3000 Series
ICE3006
The ICE3006 is an agile filter/amplifier cascade for the UHF frequency band with a VHF bypass. It enables simultaneous operation of multiple transceivers in the cosite environment. This filter/amplifier provides multiple poles of RF selectivity to reduce broadband noise, harmonics, and spurious signals while still providing full output power in transmit mode and excellent selectivity to interfering signals at the transceiver’s RF input in receive mode. All transmit, receive, and bypass switching is incorporated into the three-port design (LOS and SATCOM). The ICE3006 incorporates extensive Built-in-Test capability and is qualified for airborne applications. A mounting tray is available as an option for easy incorporation on your platform. Cost-effective modifications are available on the ICE3006. Please contact your sales representative at 513.870.9060 or Support@PoleZero.com for details.
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Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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68-Pin PLCC with Die Flipped-to-68-Pin PGA for 87C196 IC and Others
68-304538-10
68P PLCC WITH DIE FLIPPED TO 68 PGA FOR 87C196 IC AND OTHERS. Correct-A-Chip technology solves problems associated with the use of alternative ICs (due to availability, obsolescence, need for better performance, etc.) by eliminating the need for new PCBs.
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Ka-Band Silicon 5G Quad Core IC
AWMF-0108
The AWMF-0108 is a highly integrated silicon quad core IC intended for 5G phased array applications. The device supports four Tx/Rx radiating elements, includes 5 bit phase and 5 bit gain control for analog RF beam steering, and operates in half duplex fashion to enable a single antenna to support both Tx and Rx operation. The device provides 26 dB gain and +9 dBm output power during transmit mode and 28 dB coherent gain, 5.0 dB NF, and -28 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, Tx power telemetry, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 48 lead 6x6 mm QFN for easy installation in planar phased array antennas.
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Energy Metering ICs
Analog Devices’ ADE energy measurement ICs address the challenges of next-generation smart meter architectures and are ideal for measuring active energy (kWh), apparent energy (kVA), reactive energy (kVAR), rms, and power quality with the highest accuracy in single phase and polyphase revenue meters, industrial instruments, and energy monitoring applications. ADI’s ADE energy measurement ICs combine analog-to-digital converters with fixed-function digital signal processors to perform critical measurements, while providing unparalleled functionality and ease of use.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Communications ICs
Renesas' broad portfolio of communication ICs includes subscriber line interface circuits (SLICs), DSL line drivers, general purpose ringing SLICs, isolated PWM controllers, line card access switches, PABX short-loop SLICs, PLC line drivers, and serializer/deserializer (SerDes) ICs.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Data Converter ICs
We offer a complete range of high-performance, low-power,and small-size data converter integrated circuits (ICs) for demanding industrial, automotive and consumer applications. Whether you need an Analog-to-Digital Converter (ADC), Digital-to-Analog Converter (DAC), digital potentiometer, AC and DC power and energy measurement device, voltage reference or a combinationof data converter ICs, we have the right solution for your application and world-class support to make sure you meet your design goals.
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Rad-Hard Analog ICs
ST's wide range of rad-hard QML-V qualified analog ICs covers analog-to-digital converters (ADC) and digital-to-analog converters (DAC) for telemetry, instrumentation and imaging applications. Our portfolio also includes rad-hard op amps, high-speed differential amplifiers up to 1 GHz, shunt voltage references and comparators to ensure a complete solution for signal conditioning, referencing and data conversion.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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SOA Testing, Cloud Testing, Web Application Testing
SOAtest
Automate complete end-to-end testing for business and security-critical transactions. Parasoft SOAtest is widely recognized as the leading enterprise-grade solution for API testing and API integrity. Thoroughly test composite applications with robust support for REST and web services, plus an industry-leading 120+ protocols/message types.
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Test Fixtures & Test Sets
Keysight test fixtures are used to hold electronic components or materials (physically and electrically) in order to perform various measurements. Keysight offers a variety of test fixtures from Parametric, Dialectrice, Liquid test fixtures and more.Some of our test fixtures allow you to connect directly to your measurement instrument, while others require various adapters.
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Environmental Sensor And Automotive Sensor IC Solutions
With more than 20 years of industry experience, Renesas is an expert in providing sensor technologies that enable our customers to design and build best-in-class sensor solutions. As we expand the breadth of our sensor technologies, Renesas will create unique and differentiated sensor solutions.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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IEC Testing
International Electrotechnical Commission
F2 Labs can assist you in testing your electrical products to the applicable IEC standards. The IEC is the world’s leading organization for the preparation and publication of International Standards for all electrical, electronic and related technologies.
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Non-Destructive Tests
Non-destructive tests on reinforced concrete and masonry structures are the first method of investigation for verifying the real conditions of a building or structure, existing or under construction. As indicated by the anti-seismic legislation, these tests can be performed by all authorized operators.
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In-circuit Test
Medalist i1000 Systems
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Vibration Testing
Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Test Handler
M4841
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Qualification Testing
Qualification testing is an important step in evaluating how well spacecraft and launch vehicles perform under severe loading conditions that occur during launch and operation. ATA has conducted acoustic and vibration qualification testing of numerous launch vehicles and spacecraft components.
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Battery Test
1260
*Basic Battery Load Test*Battery Analysis*Mac*Test*Bad Cell Indicators*Testing the Starter Motor*Low Temperatures Effects
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Continuous Testing
Continuous testing is the practice of embedding quality through every phase of the software delivery lifecycle - from planning to production. The goal is to ensure that testing continuously reduces risk and improves application quality.
