IC Test
See Also: IC, Digital IC Testers, IC Clips, IC Probes, IC Test Systems
-
Product
Test Port Cable, 1 Mm
11500I
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 8.8-cm cable featuring a return loss of 17 dB minimum.
-
Product
High Voltage ICs
-
Hitachi Power Semiconductor Device offers intelligent power devices and high voltage analog switch ICs integrating high voltage output devices and control circuits on a single chip/single package using dielectric isolation technology. *High voltage ICs are suitable for household apparatus fields such as home electric appliances and beauty appliances.* These ICs can be easily used for various purposes, and market-leading companies in air conditioner fan motors have adopted them.※We have continued to improve performance and quality of the ICs since sales start in 1994 and have more than 20 years of sales results.
-
Product
Amplifiers And Linear ICs
-
For the simplest to the most complex designs, our extensive portfolio of amplifiers and comparators enables you to develop low-risk solutions with minimal risk of a forced redesign. These devices are also backed by our client-driven obsolescence practice of continuing to supply a product for as long as possible and while demand for the product exists.
-
Product
ICE 3000 Series
ICE3001
-
This subsystem is an agile filter for the SATCOM frequency band, capable of acting as either a receive or a transmit filter. It enables simultaneous operation of multiple transceivers in extreme cosite environments. The ICE3001 provides multiple poles of RF selectivity to reduce broadband noise, harmonics, and spurious signals for either receive or transmit applications. This filter is a highly integrated design incorporating complete Built-in-Test capability. The design has been qualified for military applications. A dual-mount tray is also available as an option for easy incorporation on your platform. Cost-effective modifications are available on the ICE3001.
-
Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
-
Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
-
Product
Analogue IC Tester
SYSTEM 8 (AICT)
-
The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
-
Product
NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
-
Product
Radio Frequency, Communications, & Navigation Test Systems
Test System
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
-
-
Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
-
Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
-
Product
BMS Manufacturing Test System
Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
-
Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
-
Product
Battery Backup IC
-
Analog Devices offers a range of supervisory circuits that offer a complete single chip solution for power supply monitoring and battery control functions in microprocessor systems. Functions include microprocessor reset, backup battery switchover, watchdog timers, CMOS RAM write protection, and power failure warning.
-
Product
Data Converter ICs
-
We offer a complete range of high-performance, low-power,and small-size data converter integrated circuits (ICs) for demanding industrial, automotive and consumer applications. Whether you need an Analog-to-Digital Converter (ADC), Digital-to-Analog Converter (DAC), digital potentiometer, AC and DC power and energy measurement device, voltage reference or a combinationof data converter ICs, we have the right solution for your application and world-class support to make sure you meet your design goals.
-
Product
Ice Point Calibrators
-
These ice point calibrators are designed to accurately calibrate probes at the freezing point of water. These devices have multiple thermowells to calibrate multiple sensors simultaneously.
-
Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
-
Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
-
Product
Display ICs For Automotive
-
Renesas has invested in key technologies to address the latest trends within the automotive market. Offering both standard and AEC-Q100 qualified products for automotive applications, Renesas' automotive display IC product line is defined by feature rich, highly integrated semiconductor solutions that incorporate many key function blocks for front console, rear seat entertainment, and rear camera display applications.
-
Product
Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
-
Product
Counterfeit IC Detector
Sentry
-
The ABI SENTRY is a unique solution for the quick and easy detection of Counterfeit ICs and components. ABI Electronics has over 27 years of experience in the field of Test & Measurement equipment as well as Contract Electronics Manufacturing. Knowledge of both industries has allowed ABI to design this product around two main concepts:
-
Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
-
Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
Test System
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
-
Product
End of Line Test System for Automotive Seats
AS519
Test Platform
AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
-
Product
Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
-
Product
Power Management ICs
PMICs
-
Renesas' power management ICs (PMICs) are integrated circuits that perform various functions related to power requirements of a host system. A PMIC may have a combination of the following functions: DC to DC conversion, battery charging, linear regulation, power sequencing and other miscellaneous system power functions.
-
Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
-
Product
Communications ICs
-
Renesas' broad portfolio of communication ICs includes subscriber line interface circuits (SLICs), DSL line drivers, general purpose ringing SLICs, isolated PWM controllers, line card access switches, PABX short-loop SLICs, PLC line drivers, and serializer/deserializer (SerDes) ICs.
-
Product
IC Design & Verification
-
Mentor Graphics provides best-in-class products for IC design. Calibre for physical verification, extraction, resolution enhancement and mask data preparation, ADVance MS for analog/mixed-signal simulation and an integrated tool flow for custom IC design
