IC Test
See Also: IC, Digital IC Testers, IC Clips, IC Probes, IC Test Systems
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Wafer Test
Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Test And Measurement
Standardized instruments used to evaluate individuals, populations, or processes.
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Motor Driver ICs
The ST product portfolio offers a wide range of motor control ICs, well-suited for the most demanding automotive environments, covering the requirements of brushed DC motors, stepper motors and brushless DC motors, over an extensive range of voltage and current ratings. Efficiency and accuracy of our motor drivers are guaranteed by a unique combination of low-loss PowerMOS output stages and advanced control circuitry. Robustness and reliability are provided by the integration of a comprehensive set of protection and diagnostic features.
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Transformer Testing
Measuring bridges or electronic burdens can be individually integrated into existing CT/VT test systems. Customized solutions are our core competence.
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5G Testing
Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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Test Set
TS® 22
The TS22 Test Set’s unique built-in one-way amplified speaker provides three audio levels for hands-free listening and use with automated voice response systems. Multiple memories enable storage of nine 18 digit telephone numbers in repertory dialer (speed dialing) for easy access to test boards, the central office and other frequently called numbers. The last number redial feature eliminates the need to re-key your last entry. The TS22 Test Set offers an unbeatable combination of reliability, durability and expanded utility.
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Test Chambers
The left-hand axis scales the level of the 100 measurements and the right-hand axis displays the uncertainty to a statistical confidence level of 95%; proving the repeatability is better than +/-0.25dB between the measured values. Guaranteeing repeatability, accuracy and correlation across Lab’s, across Production lines and across the World
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Pack Testing
PEC offers a 600V-600A and a 1000V-500A system with either 1 or 2 channels. The systems are programmable using the standard PEC LifeTest application, offering a user-friendly environment for configuring and analyzing drive cycles and other energy storage simulations.
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Telecoms Testing
KTL offers an extensive range of telecoms testing services, wired and wireless, for voluntary and regulatory markets worldwide. Conformance services are complemented by interoperability telecoms testing and by our commitment to provide market access through procurement specification testing.KTL provides telecoms testing to customer specific requirements and, as an independent third party test laboratory.
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Test Automation
Write tests in plain-speak and refactor fearlessly so your test suite adapts as your application evolves. Gauge’s pluggable architecture allows you to customize your environment so you can write tests in the language and IDE of your choice.
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Massively Parallel Parametric Test System
P9001A
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Cable Testing
MET Labs performs a wide range of cable tests required by a wide range of vendor and government specifications, including simultaneous temperature and vibration testing.
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X-Band Silicon Radar Quad Core IC
AWS-0103
The AWS-0103 is a highly integrated silicon quad core IC intended for radar and 5G phased array applications. The device supports four radiating elements, single beam transmit, and dual beam receive and includes all requisite beam steering controls for 6 bit phase and gain control. The device provides 21 dB gain and +15 dBm output power during transmit mode and 7 dB gain and +7 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8V supply, and is packaged in a 56 lead 7x7 mm QFN for easy installation in planar phased array antennas.
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Test Capabilities
Eltek International Laboratories
ELTEK Labs has conducted more Electrical Insulation Systems (EIS) and Component Compatibility Testing (CCT) than all other laboratories worldwide combined. ELTEK Labs is proud to be a Third-Party Testing Laboratory for internationally recognized certifying bodies.
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Unit Testing
Hitex offers a unit testing service for C/C++ application source code using the well-known test tool TESSY. For this service, the customer provides their source code of the C/C++ functions to be tested, ideally along with the specifications of the functionality and comprehensive comments in the source code.
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Portable Testing
Whether you need handheld testers, digital hydrometers, ground fault detectors or discharge testing equipment, we offer the cutting-edge technology you need to stay ahead in managing and maintaining your power systems.
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COM-HPC Server Type Ice Lake-D Starter Kit
The COM-HPC Server Type Starter Kit consists of a COM-HPC Server Type module, memory, and thermal solution of your choice with an extended ATX size COM-HPC Server Type reference carrier board, as well as necessary cabling. It allows you to quickly emulate the functionality of your end product for software development and hardware verification. Carrier board design files (schematics, mechanical drawings), COM-HPC module drivers, BSP, and user manual are also offered to aid you in designing your own custom carrier board.
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Laboratory Testing
Rosenberger Hochfrequenztechnik GmbH & Co. KG
To fulfill the highest demands of R&D, test labs, or quality assurance departments, Rosenberger offers a comprehensive range of high-precision RF test & measurement products. Our portfolio is synonymous with precise, reliable and repeatable measurements – to meet the ever-increasing requirements of industrial lab test applications.
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Environment Testing
The measurement of the performance of equipment under specified environmental conditions.
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Game Testing
Here at UpDoerTech, we strive to improve the gaming industry by providing the most comprehensive, accurate, and efficient testing mechanism. We've built an A/B testing framework so that you don't have to guess or speculate what gamers think of all your features. Our team of QA experts will help you find bugs early in the development process so that your product ships with fewer issues.
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Test Connectors
A wide range of standard test Connectors that can fit many of your applications and services. We offer a ideal solution for your testing needs in automatic or manual mode.
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Quad Flat Pack IC Clip Pair (Yellow/Green) (Qty.1 Pair)
PK-ZS-025
Quad Flat Pack IC Clip Pair (Yellow/Green) (Qty.1 Pair)
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Load Testing
OctoPerf
Use auto-correlations rules and frameworks as well as test validation to quickly create virtual users.
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Optical Test
Optical components such as micro-lenses, diffractive optical elements (DOE), meta optical elements (MOE) and micro lens arrays (MLA) are now largely used on consumer electronics and even more optical elements need to be integrated into smaller and smaller packages. Nowadays mass-production industries key to success lies in increasing the yield by means of strongly automatized testing machines, with statistical analysis.
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Testing Software
SMC supplies as standard several types of software adapted to each set, for automatic testing, unit operation and reports or results acquisition, which allows the full functionality of the equipment; the following programs are included with the corresponding equipment:
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