Laser Systems
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Universal Test System
LS6601A
LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Immunity Development System
Used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken.
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Dynamic Test System
3430-SW
The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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IN-SIGHT VISION SYSTEMS
7000 Series
The In-Sight 7000 series is a full-featured, powerful vision system that performs fast, accurate inspections of a wide range of parts across all industries. Its compact footprint easily fits into space-constrained production lines and the unique, modular design is highly field-customizable to your application requirements. Along with the internal and external power/control lighting options, the In-Sight 7000 series also has a highly visible pass/fail LED indicator light ring around the camera body, making it easy to see the inspection status no matter where the system is installed.
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Wafer Inspection System
INSPECTRA® Series
INSPECTRA® series meet the requests of 100% automatic inspection with high speed and high specifications from front-end to back-end of semiconductor processing. INSPECTRA® series are wafer inspection systems with high speed and high sensitivity. Our original "Die-to-Statistical-Image" comparison method achieves the target defects detection controlling process variation and overkill.
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Intrusion Prevention System
TippingPoint
Powered by XGen™ security, TippingPoint® NGIPS delivers best-of-breed next-generation intrusion prevention that is easy to deploy and manage while maintaining a high level of performance and security accuracy.
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FLIM Camera Systems
The Excelitas pco.flim camera system consists of the pco.flim camera and pco.flim laser, with a complete frequency synthesizer, which is required for the generation of the modulation signals in the frequency domain. The pco.flim series features a high frequency modulated CMOS image sensor that enables pixel-wise measurements of sample luminescence lifetime distributions in frequency domain suitable for fluorescence lifetime imaging. At a maximum speed of 10 Hz, full luminescence lifetime distributions can be measured at 1 Mpixel resolution. With flexible coupling and easy setup, the pco.flim is an ideal choice for wide-field FD-FLIM instruments and suitable for a variety of biomedical applications requiring a large frame and high-speed acquisition.
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CO2 Laser Marker
LP-400
Panasonic Industrial Devices Sales Company of America
The LP-400 Series is a CO2 Laser Marker best suited for glass and most plastic applications.
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Laser Scattering Particle Size Distribution Analyzer
Partica LA-960V2
This latest evolution in the LA series advances scientific knowledge for tomorrow's world through intuitive software, unique accessories, and high performance.The LA-960V2 continues HORIBA's proud tradition of leading the industry with innovative design.
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Turnable Laser
CoBrite DX Series
It makes this instrument an ideal choice for demanding coherent applications and advanced modulation formats. It’s competitive price still allows its usage for general purpose applications with lower technical requirements.
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Live-Cell Analysis System
Analyze your cells for days, weeks or even months as they sit stationary in the stable environment of your tissue culture incubator.
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EMI Test System
EMI-9KA
EMI-9KA is an automatic EMI receiver. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KA is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem. The test results are according to the international format test report. The EMI Test System EMI-9KA fully meets CISPRl6-1, GB17743, FCC, EN55015 and EN55022.
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SMART Systems Software
The SMART Systems Architecture consists of a development environment that provides quick application construction and refinement, and a runtime environment that enables high application availability. This system-wide architecture is designed to deliver high compute performance and interconnect bandwidth.
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Transducer Calibrator Systems
Unholtz-Dickie Calibration Systems have earned their place in industry as the standard for calibrating accelerometers and velocity transducers. The Models 660C & 680C are UD''s latest generation of automatic calibration systems, both utilizing the expanded features of the i5 based APEX SL Windows vibration control system.
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Tunable Laser Source Module
Keysight's has a wide range of tunable laser sources to fit your needs for various applications. In addition to the proven 81600B tunable laser source family, Keysight recently introduced a new family of tunable laser sources - the 8160xx family. The 8160xx tunable laser sources offer the full wavelength range from 1260 nm to 1650 nm with no wavelength gaps. All 8160xx tunable laser sources are modules for the Keysight 8164B lightwave measurement system mainframe. This provides test instrumentation with maximum flexibility. Investing in the Keysight 8160xx family of tunable laser sources can realize the cost efficiency and performance required to test components for coarse and dense wavelength division multiplexing (CWDM, DWDM) and passive optical networks (PON).
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Analysis System
Pegasus (EDS-EBSD)
The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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Laser Tracker Targets
Lightweight hand-held solutions for faster and more accurate measurement.
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Temperature Measurement System
Spider-80Ti
The Spider-80Ti is a front-end from the Spider-80Xi hardware platform that enables temperature measurement. Spider-80Ti supports temperature measurements from Thermocouples and RTD (Resistance Temperature Detector) sensors.
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Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer
MALDI-8020
The MALDI-8020 is the latest in a long line of MALDI-TOF products from Shimadzu. This benchtop, linear MALDI-TOF mass spectrometer delivers outstanding performance in a compact footprint, making it an ideal choice for today’s increasingly demanding laboratories.
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Raman Spectrometer System
IndiRAM EDU Series
TechnoS Instruments is proud to introduce IndiRAM TM EDU Series Raman Spectrometer system which is ideal research tool for science faculty or UG/PG students to have a hands-on practical experience of Raman Spectroscopy and Spectrometer during their masters
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Spectral Single-Mode Diode Laser
The diode lasers are compact, single-mode light sources with a spectral width in the sub-MHz range (cw). A modulation input is optional. The wavelength for standard products is in the range 1530nm-1565nm (other wavelength can be tested).
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Ethernet-based Distributed Systems
DMC-3425
The DMC-3425 is the first product in Galil's new E-Series line designed specifically for Ethernet-based distributed systems. The DMC-3425 provides a highly versatile and powerful form of distributed control where multiple DMC-3425 controllers are linked together. When linked, one DMC-3425 is designated as the master over the other DMC-3425 controllers in the distributed system.
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Automated Warning System
Is a safety system consisting of 3 different magnet types (AWS 1, 2 and 3) and a locomotive-mounted detector (MagSense), designed to aid drivers in observing the fixed signals, particularly under adverse weather conditions, and is supplementary to the fixed signals which the driver must observe.
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*High Power Laser Beam Dumps & Low Power Beam Traps
Laser beam dumps for high power laser processing, laser measurement and other applications, and low power beam traps
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Kelvin Probe Systems
Kelvin probe measures the work function difference between the tip and the sample when in thermoequilibrium state (a), and measures the electrical potential when the sample is illuminated (b), which is the sum of the difference in workfunction and internal/external-applied voltages.
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Laser Distance Meter for 40m With 10 Memories and Min. Measurement
MS-LDM340
*Measuring distance: 0.05 to 40m*Accuracy: ±1.5mm (±0.06in)*Unit conversion: mm/in/ft*Laser classification: Class 2*Laser type: 635nm <1mW*Dynamic measurement*Area, volume measurement*Pythagorean proposition measurement
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Custom Systems
ORTEC strives to meet your measurement needs in every aspect. If one of our standard solutions is not the answer, we have the expertise, equipment, and commitment to design and develop robust solutions that satisfy your particular application requirements.
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Integrated Systems
Power, flexible and based on commercial open standards, Integrated Systems from Abaco are pre-integrated and pre-qualified, so they're ready for immediate deployment - minimizing cost, risks and program lead time.
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Profiling Systems
ICK profiling systems measure, detect, classify, count, and check vehicles in 3D. They determine the number of axles on heavy goods trucks for vehicle classification and measure vehicle dimensions to rectify loading errors. The systems recognize overheated vehicles approaching tunnels and other entrances and activate diversions. They also monitor external train contours. If a limit value is exceeded, the system triggers an alarm. All this contributes to safety on roads and railroads.
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Spectrometer Systems
ZEISS spectrometer systems leverage our longstanding experience in process optimization and expertise as a pioneer in scientific optics. Regardless of whether it’s in the lab, on the production line or in the field, plan your next project with ZEISS and benefit from:
