Laser Systems
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System And Customization
Fastwel also provides extra services, like coating, customization and assembling, which are often required by customers.
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Electronic Load System
Electronic loads are required for testing fuel cells such as PEMFC, AFC, PAFC, MCFC, SOFC. These electronic loads are designed either in IGBT technology with power, current and voltage ranges according to specific requirements or in transistor technology. Electronic loads in IGBT technology are designed for high voltage ranges up to 900 V, current ranges up to 1000 A, and power ranges up to 480 kW.
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Carbon Dioxide Systems
Teledyne Analytical Instruments
Carbon Dioxide Systems by Teledyne Analytical Instruments
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Preparative HPLC Systems
Nexera Prep
*Easy optimization of preparative parameters and scale up Fractionation simulation for rapid setup of collection logic Column line-up for scale-up from analytical to preparative*Time- and energy-saving by automation of the purification workflow Collection of target components at high purity by automated desalting*Expandable to suit the sample/fraction number and volume Choose from a wide range of options for recovery scale and analytical detection Problems are resolved simply, to accommodate a variety of needs.
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External Cavity Diode Lasers
ECDLs
High-performance ECDLs and injection-locked optical amplifier.
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Optics Test Systems
MTF Measuring Device For Endoscopes
Optik Elektronik Gerätetechnik GmbH
Manual MTF measuring device for endoscopes. The measurement setup is based on modular individual components that can be arranged on a breadboard according to the type of endoscope (angle between light entrance and eyepiece).
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Exposure Systems
sX series
Exposure systems are equipment or systems designed for the assessment of, for example, health risk, efficacy of therapies or mechanisms associated with exposure to electromagnetic fields. The systems designed by the IT''IS Foundation are the sX series, where sX stands for "System for eXposure" with options for cells (c), vertebrates (v), and humans (h).
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CrystalCalHP Calibration System
AMETEK Sensors, Test & Calibration
This portable gauge and transmitter calibration system is 7 to 10 times faster than a deadweight tester. It allows you to do a 10 point up and down calibration in less than 3 minutes including printing out a calibration certificate.
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CMOS Type Micro Laser Distance Sensor
HG-C1000L
Panasonic Industrial Devices Sales Company of America
The IO-Link technology makes it possible to continuously collect and process data and to control the HG-C1000L. This allows users to implement predictive maintenance and to monitor the operation in machines and assembly lines. Processing the multitude of data requires users to invest know-how and time. To reduce the workload for the customers, Panasonic has developed a self-diagnosis function specifically for this sensor. This function sends sensor data via IO-Link to a higher-level fieldbus, thus informing about the state of the sensor directly. This way, the amount of production data and the work needed to analyze the data is reduced.
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Automated Potentiometer Systems
Measurements International Ltd.
Intrinsically Accurate Self-Calibrating Ratio Divider, Best Accuracy < 0.05 ppm, Built-in 20-Channel Scanner, Arbitrary Voltages from 1 mV to 1200 V, Bipolar Voltage Measurements, Calibration of Fluke 5700A/5720A, Calibration of 3458A and 8508A, Calibration of Voltage Ratio Dividers (F752A, MI 1340A, G7520), Linearity Calibration of Digital Volt Meters (DVM), Traceability to 10 V Zener Reference.
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LHe/LN2 Cryostat System
129610A
Liquid nitrogen (LN2) or liquid helium (LHe) can be used as the cryogen depending on the required operating temperature range. This allows standard tests to be performed using relatively low cost LN2 as the cryogen. Higher cost LHe can be substituted for the duration of tests where very low temperature is required, providing an economical solution to your test requirements.
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Cable Identification System
After excavation, sometimes it is confusing to identify the right cable from a bunch of cables. Cable Identification is very important for the safety of field personnel – Cutting a wrong cable can be fatal. So, we require a Cable Identification System to identify the wanted cable.
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Vacuum Probing Systems
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
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Torque Measurement Systems
Proper torque measurement is critical in many assembly operations. AIMCO provides expertise and measurement equipment for all three phases - before, during, and after assembly. Tool testing and capability studies can be easily performed in the tool crib or lab. Fine tuning of torque settings and process verification are achieved on the assembly line with rotary transducers. Use our complete line of electronic wrenches for final residual torque testing.
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Silicon Inspection System
NIR-01
The NIR-01 imaging system is made of CNC engineered Aluminium alloy. The suruface protection is powder painting and electrolitic oxidation on pure aluminium surfaces. The frame of the system is a high quality industrial design. All components are designed for long term heavy usage with minimal maintenance needs. Electrical components are also selected for stability and durability. The block like electronics gives the advantage of easy and quick repair.
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Start-Stop Walk Behind Laser Guide
GL1700
The GL1700 laser guide precisely locates start and stop points, eliminating any guess work. It features a 5/8 mounting bracket with quick disconnect allowing it to attach to virtually any walk behind machine in just minutes!
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Brinell Optical Systems
Newage Testing Instruments, Inc.
Newage offers optical solutions for your hardness testing include the popular B.O.S.S. Brinell Optical Scanning System, HiLight optical scope and pocket optical scope.
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Blackbody System
IR-564/301
Infrared Systems Development Corp.
The IR-564 extends the temperature range of the IR-563 to 1200 º C by changing cavity materials to Silicon Carbide and high purity Alumina ceramics, otherwise the two units are virtually identical.
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Emissions Test System
PC-114
Perform Radiated & Conducted EMI pre-compliance testing at your facility up to 1 GHz. Com-Power PC-114 EMI emissions test system is a ideal solution performing pre-compliance EMC testing from 9 kHz - 1 GHz.. It has essential equipment needed for radiated and conducted EMI emissions measurements. The system includes a spectrum analyzer, antennas, near field probes, a preamplifier, LISN and a non conductive antenna tripod. Pre-compliance testing in EMC is a commonly used term not easy to define. In general, it implies testing done prior to formal testing for legal compliance. Formal legal compliance is performed at a facility designed and equipped with test instrumentation that is fully compliant with the applicable EMC standards. Such facility and instrumentation is capital intensive and can be expensive even to rent and not easily available. Compliance testing is performed per exacting requirements of the Standards and other reference documents adhering to the test methods and last detail. In addition, the test facility may require to be accredited by an accreditation body such as NVLAP, A2LA. Often it is desirable to know prior to compliance testing at such facility, whether a product is close to compliance and also how close. Pre-compliance testing is specially useful for specifications such as FCC, Part 15, EN 55022 or EN 55011 (CISPR 22 or CISPR11). Pre-compliance testing usually means using the full compliance methods but making a few educated compromises in use of site or equipment to reduce costs and testing time. Here are some benefits of pre-compliance testing.
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Display Test System
PIMACS provides the broadest range of display optical performance measurement system for optical testing of various samples including flat panel displays. We are specialized in testing all sizes of display modules and panels ranging from various field.
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PC Control Tunable Laser Source Modules
GM82009xx
The GM82009C, GM820093L and GM82009CL tunable laser modules offer superior performance in testing DWDM components, AWG & PLC components, and optical amplifiers, and performing other general- purpose fiber optical test and measurement applications particularly in fiber grating sensor fast sweep testing.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Automatic System
By combining with Hardness Tester, stage control is automated in indent/multi-pointmeasurement to reduce the dispersion caused by each operator. This system is very effective for large-scale rationalization and energy saving.
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Tunable CW Laser Source
IQTLS
The IQTLS is a continuous wave (CW) laser source combining high-power output, narrow 100kHz linewidth and 0.01pm resolution tunability. Available in single or dual laser configurations, this tunable laser source can be controlled locally via USB or Ethernet ports and is SCPI VXI-11 compliant.
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Laser Rangefinders
A rangefinder that uses a laser beam to determine the distance to an object.
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Meter Test System
MTS-100
Kongter Test & Measurement Co., Limited
This Meter Test System features state-of-art designing with high accuracy. It is composed of high accurate (class 0.05% or 0.1%) standard reference meter and power source (up to 120A). This system is particularly designed with modular structure for calibration and test of different single phase/3 phase electronic/inductive active and reactive energy meters.
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DWDM High Power DFB Buttterfly Laser
CA1782-XXX-XX-BT
The CA1782-XXX-XX-BT DWDM High Power DFB Buttterfly Laser component is characterized for use as a CW optical source in CATV and DWDM networks. The CA1782-XXX-XX-BT is dc-coupled with a built-in TEC, thermistor, and monitor photodiode. The device is mounted in a 14-pin, OC-48 pinout compatible butterfly package with the optical isolator mounted on the TEC. The CA1782-XXX-XX-BT incorporates a high efficiency coupling scheme to deliver 40 mW, 50 mW, 63 mW and 100 mW of CW optical power.
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Personal Dosemeter System
05NK003
Measure personal noise levels with the Dosemeter System. Kits consist of either 1 or 5 non-logging dosemeters with calibrator and case. Ideal for checking worker's exposure to noise and adhering to Control Of Noise At Work Regulations.
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Vacuum Handling Systems
RECIF Technologies history started in 1982 offering its first wafer handling solution: Vacuum handling Systems.Based on this historical technical mastery, Recif Technologies provides today a full range of single wafer manual vacuum handling solutions adapted to our customers’ and current Semiconductor industry’s’ requirements.





























