Primary Current Injection Test
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
ARINC 818 Tester
Test Platform
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Product
Standard- 27.20 (771.00) - 64.00 (1814.00) Godzilla High Current Probe
HC375F-4
High Current Probe
Current Rating (Amps): 100Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 360Full Travel (mm): 9.14Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,110Overall Length (mm): 78.99
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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
Automatic Test System
Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
Standard - 22.08 (626.00) - 220.80 (6259.60) Godzilla High Current Probe
HC500F
High Current Probe
Current Rating (Amps): 150Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 260Full Travel (mm): 6.60Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,215Overall Length (mm): 81.66
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Product
NI-9203, 200 kS/s, ±20 mA, 8-Channel C Series Current Input Module
783731-01
Current Input Module
200 kS/s, ±20 mA, 8-Channel C Series Current Input Module - The NI‑9203 is intended for high-performance control and monitoring applications. It features programmable input ranges and variable connectivity options. To protect against signal transients, the NI‑9203 … includes a channel‑to‑earth ground double‑isolation barrier (250 Vrms isolation) for safety and noise immunity.
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
CATR Benchtop Antenna Test System
ATS800B
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
EOL RF Functional Test
AS652
Test Platform
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Product
sbRIO-9207, Non-Enclosed, 500 S/s, 16-Channel C Series Voltage and Current Input Module
781069-01
Current Input Module
Non-Enclosed, 500 S/s, 16-Channel C Series Voltage and Current Input Module - The sbRIO‑9207 is a combination voltage and current input module designed with industrial systems in mind. It features eight current and eight voltage input channels, with built-in noise rejection. Non-enclosed modules are designed for OEM applications.
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Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Test Fixture
Stopper kit includedYAVCANCON2 for fixture identification not included
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Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
FPD Tester Model
27014
Test Platform
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
NI-9265, 4-Channel C Series Current Output Module
779334-01
Current Output Module
4-Channel C Series Current Output Module - The NI‑9265 is ideal for interfacing and controlling industrial current-driven actuators at high rates. The module has built-in open-loop detection, which generates an interrupt in software when an open loop is detected as well as zeroing … outputs to ensure safety and avoid driving actuators at system power on. The NI‑9265 requires an external power supply and includes a channel‑to‑earth ground double isolation barrier for safety and noise immunity.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
2m BNC Test Cable
16048D
Test Port Cable
The 16048D test leads extend the measurement port with a 4-terminal pair configuration. It provides a BNC female connector board to allow attachment of user-fabricated test fixtures.
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Product
sbRIO-9208, Non-Enclosed, 500 S/s, ±20 mA, 16-Channel C Series Current Input Module
780979-01
Current Input Module
Non-Enclosed, 500 S/s, ±20 mA, 16-Channel C Series Current Input Module - The sbRIO‑9208 is designed with industrial systems in mind. It includes a high-resolution mode with 50/60 Hz rejection to remove low frequency noise. It has high-channel density to reduce the number of modules needed, which leaves slots open for other measurement types or for reducing the overall per channel cost of the system. The sbRIO‑9208 uses a standard D‑SUB connection for use with cables and connector blocks. Non-enclosed modules are designed for OEM applications.
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Product
NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
NI-9253, 50 kS/s/ch, ±20 mA, 24-Bit, 8-Channel C Series Current Input Module
785989-01
Current Input Module
50 kS/s/ch, ±20 mA, 24-Bit, 8-Channel C Series Current Input Module - The NI-9253 is an 8-channel analog input module for ComapctDAQ and CompactRIO systems. Each channel provides a ±20 mA input range and 24 bits of resolution at a 50 kS/s sample rate. The NI-9253 has several diagnostic features to ensure your system is operating nominally at all times with open channel detection, power supply detection, and configurable thresholds. The NI-9253 has eight LEDs to indicate the status of each channel and the power supply so that a user in the field can easily validate that the system is operating normally. The NI-9253 also features a number of programmable hardware filters. By choosing the specific Butterworth and comb filters for your application, you can significantly reduce the noise in your system.
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Product
Flying Prober Test System
QTOUCH1404C
Test System
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Product
Standard - 1.44 (41.00) - 4.50 (128.00) High Current Probe
HCP-13P
High Current Probe
Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
HPC High Current Probes, 100 – 187 mil (2.54 – 4.75 mm)
HPC
High Current Probe
100 – 187 mil (2.54 – 4.75 mm)
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Product
Test Handler
M6242
Test Handler
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
Primary Injection Test Systems
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Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
