Unit Under Test
assures a constituent's interoperability in a system.
See Also: UUT, EUT, System Under Test, Device Under Test
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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PXI 10A Fault Insertion Switch 10-Chan 1-Bus
40-199-001
The 40-199 is a 10 Channel Fault Insertion switch designed for the simulation of fault conditions in automotive/avionics applications, involving the reliability testing of safety critical controllers.
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PXI Source Measure Unit
PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility. These features include high channel density for building parallel SMU test systems, deterministic hardware sequencing for minimizing software overhead, and high-speed update and sample rates for quickly changing setpoints and acquiring data. Additionally, the flexible sampling rate and streaming capability of PXI SMUs allows you to use the instrument as a digitizer to capture transient behavior, and the digital control loop gives you the ability to adjust the transient response of the instrument. The ability to change the transient behavior of the SMU, called SourceAdapt, reduces SMU settling time and minimizes overshoot and oscillations, even with highly capacitive loads.
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2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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ECM Noise Under RF Test System
BK8020
The BaKo Type BK8020 ECM Noise Under RF Test System tests microphones under RF noise, using a ‘Direct Injection Test’ in the frequency range of 5MHz~2.5GHz with an amplitude modulated (AM) disturbance signal of 1kHz. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When you finish testing, you can print data as an MS Excel report or save it for comparison and analysis.
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Electronics Testing Solutions
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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Handset Noise Under RF Test System
BK8021
If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When testing is complete, you can print the data as an MS Excel report or save it for comparison and analysis.
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
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64-Ch 1-Bus Fault Insertion
YAV91082
64 channels 1 thread 2A 250V 1 Fault Insertion Buses Switching up 60W CAN Control (or Ethernet with Ethernet to CAN Gateway) Drivers dll & VIs available
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PXIe-4144, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit
782432-01
PXIe, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit - The PXIe-4144 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4144 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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High Speed Test Bench
AT444
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Test Fixture
16047E
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-01
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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PXI 22-Channel 2A Fault Insert Switches
40-202-001
This is the 22 Channel version of the 40-202 Fault Insertion Switch. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test.
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Software UNIT TESTING product
C-TestIt
Unit testing, in the case of C, is understood as the ability to test a function regardless of the rest of the application.Unit testing is a complement to traditional testing, for those Customers who want to improve the quality of their software and therefore reduce future maintenance costs.
