Unit Under Test
assures a constituent's interoperability in a system.
See Also: UUT, EUT, System Under Test, Device Under Test
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Product
SSD Test Systems
MPT3000ES / MPT3000ES2
Test System
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Product
Precision Source/Measure Unit, 1 Ch, 10 FA Resolution, 210 V, 1.5 A
B2910BL
Source Measure Unit
The Keysight B2910BL Precision Source / Measure Unit (SMU) is a 1-channel, compact and cost-effective bench-top SMU with the capability to source and measure both voltage and current. It is versatile to perform I/V (current vs. voltage) measurement easily with high accuracy. Integration of 4 quadrant source and measurement capabilities enables I/V measurement simply and easily without configuring multiple instruments.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131C
Test Port Cable
The Keysight 85131C is an 81 cm (32 in) long1 semi-rigid cable with a 3.5 mm female2-to-PSC-3.5 mm female connector. Cable frequency range is DC to 26.5 GHz with a return loss of 17 dB or better. Insertion loss is 0.43 * sqrt(f) + 0.3, where f is frequency in gigahertz, for the test port connector and 2.5 dB at maximum frequency for the device connector. Phase stability of the semi-rigid / flexible cables is specified with a 90-degree bend using a 4 to 3-inch radius. Stability1 of the 85131C is less than 0.06 dB, and phase is 0.16 * f + 0.5, where f is frequency in gigahertz.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
CAN/FlexRay/Differential Bus PCI Fault Insertion Switch - 8 Channel
50-200-008
Fault Insertion Unit
This PCI Fault Insertion card is designed to simulate common faults on two wire communication interfaces such as CAN Bus. This card supports 4 or 8-channels of two wire serial interfaces. Each channel can simulate an open fault in either or both wires, a short between both wires or a short to one of eight externally applied fault connections, such as a battery connection or ground, via four fault buses.
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Product
3U OpenVPX Sensor Interface Unit - SIU36
SIU36
Sensor Interface Unit
The SIU36 is a highly configurable rugged system or subsystem ideally suited to support a multitude of Mil-Aero applications that require high-density I/O, communications, Ethernet switching and processing. The SIU36 leverages NAI’s 3U boards to deliver off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
VLT Chassis Dynamometers for Diesel Smoke Testing under Road Conditions (CDST)
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Diesel Smoke Testing by Free Acceleration Test is one! But how accurate is this Test? We all know that it is a not valuable test, but still better as none testing of Vehicle Diesel Engines. The results are not realistic in many cases. And not as good for the Engine we know.
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Product
Instrument Test Unit
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Instrument Test Unit For Advanced Inertial Sensors (INTU) is used for testing and evaluation of Ring Laser Gyro (used in GSLV/PSLV launch vehicles), that detects the angular displacement during rotation. The INTU receives displacement signals from the sensor (RLG) to evaluate the sensor characteristics and also generates signals required towards initiating the action of the sensor.
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
Automatic Test Equipment, Test Interface Units and Test Program Sets
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Axis Aerospace & Technologies Ltd.
AXISCADES is a pioneer in Test Solutions and has a long pedigree in developing Test Systems. AXISCADES has designed and developed Automatic Test Equipment, Test Interface Units/Interface Test Adapters and associated Test Program Set Software for Indian and Global, Aerospace and Defence OEMs and End Users.
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Product
PXI Dual Bus 64-Chan 2A Fault Insertion Switch
40-190B-102
Fault Insertion Unit
The Dual Bus, 64 Channel PXI Fault Insertion switch is part of our family of 2 Amp fault insertion solutions, The range includes modules with 74, 64 or 32 channels and single or dual fault buses. This version has normally closed through relays, so in the default state, there is a path between input and output for all signal channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
Mixed Signal Battery Test System
Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Product
Source Measurement Unit
DPS16
Source Measure Unit
The DPS16 offers high voltage DPS in a compact, 3U PXI form factor. The DPS16 supports 0V to +4V 0.3A or 0V to 12V 25.6mA with FVMI, FVMV, FIMV, FIMI modes. 16 channel can be ganged to support high current driving.
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Product
Compression Unit
BK1611
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The BaKo BK1611 is a Compression Unit that uses a real time feedback loop to create a frequency sweep with constant level output. This would normally be used for either research or for calibration rather than product line testing and is useful because of its extreme stability. The BK1611 is not a dedicated system so it can be integrated into a variety of systems to be used for microphones, speakers or vibration motors.
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Product
Handset Noise Under RF Test System
BK8021
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If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When testing is complete, you can print the data as an MS Excel report or save it for comparison and analysis.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Fixed Units
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A task type that keeps the assigned resources' percentage of time (availability) constant, even if the duration or total work required for the task changes.
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Product
Flying Prober Test System
QTOUCH1404C
Test System
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Product
Test Workflow Standard
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Test Set With Control Unit
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Supreme Instrument Laboratories
Single Phase A.C. High Voltage Test set (BDV Flash Test) suitable for operation on 230 Volts, A.C. 50 Hz., designed for carrying out dielectric test on transformers, electrical switchgears, and installations. It operates on single phase A.C. and provides an output voltage zero to maximum rated voltage.
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Product
RF Testing Platform for ATx05
AT118
Test Platform
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Product
PXI Single Bus 74-Ch 2A Fault Insertion Switch
40-190B-001
Fault Insertion Unit
The Single Bus, 74 Channel PXI Fault Insertion switch is part of our family of 2 Amp fault insertion solutions, The range includes modules with 74, 64 or 32 channels and single or dual fault buses. This version has normally closed through relays, so in the default state, there is a path between input and output for all signal channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
Optical/Electrical Clock Recovery
N1077B
Clock and Data Recovery Unit
N1077B Optical/Electrical Clock Recovery provides standards-compliant clock recovery capabilities for multimode and single-mode optical as well as electrical signals from 125 MBd up to 64 GBd PAM4 and NRZ
