Wireless Test Fixtures
Typically use a PCB in lieu of wire to route IO connections between ATE interface and UUT connections.
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Functional Test Fixtures
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Businesses rely on Circuit Check’s functional test fixture expertise. Functional test typically applies full operational power to a loaded printed circuit board in order to determine if the PCBA performs functions as designed. This type of test often involves custom built test equipment and custom test fixturing. Circuit Check supports all forms of functional test strategies.
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Battery Management (BMS) Environmental Test System
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The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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GPS/FMS Universal Test Fixture
TA-3000
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This panel was designed to give the avionics shop the capability to test and troubleshoot many of the GPS, GPS/COMM and FMS units on the market today. Breakout jacks are provided for both analog and digital signals that need to be monitored or simulated. A data port update jack is provided as well as Arinc 429 and RS232 loopback switches. Switches for Gillham altitude are provided as well as fuel flow adjustments. An array of annunciators and configuration switches are also provided to verify those outputs and inputs. Optional UUT configuration overlays also availabl
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Test Port Cable, 1 Mm
11500K
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Connect test ports to devices, fixtures, or probe tips with this 20-cm cable featuring a return loss of 16 dB minimum
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6TL19 Off-Line Base Test Platform
H71001900
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The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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EV Power Components End of Line Test Platform
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Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Custom Test Fixtures
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Intrinsic Quality is proud to offer a variety of Test Fixture Development Services that include fixture building, tester interface building, harness building, troubleshooting, maintenance, design, and engineering. IQ’s fixtures are built to exacting specifications and configured to deliver quality production testing. Our global customers have trusted us for over 35 years to provide custom solutions applying leading edge technology. IQ consistently delivers cost-effective solutions with our client’s recognition and gratitude.
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EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Wireless
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Equipped with Bluetooth technology, our wide range of wireless force and torque sensors allows you to take measurements remotely, connected to one of our displays or directly to a PC. Our sensors offer a data transfer rate of up to 1,000Hz and an open-field range of 65 ft. We can adapt this technology to any strain gage sensor.
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Test Handler
M4841
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High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
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The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Semiconductor Test Software
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Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Fixture Interface Module 2 Test Matrices
OTP2 module no.193
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PXI offers the optimal approach to validation and production testing. You can meet timing, synchronization, and throughput requirements across devices. PXI is a robust PC-based platform for measurement and automation systems, supported by software. PXI combines PCI electrical bus characteristics with CompactPCI's modular Eurocard packaging, and then adds special synchronization buses and important software functions. PXI is both a powerful and cost-effective platform for applications such as manufacturing test, military, aerospace, machine monitoring, automotive, and industrial test.
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Wireless Connectivity
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A product portfolio for advanced WiFi solutions that support 802.11ax/ac/n/a/g/b standard and wireless RF transceivers that operate in the sub-GHz and 2.4 GHz bands.
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Wireless Networks
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GrayStone Automation offers our Phalanx family of state-of-the-art, sustainable, energy efficient wireless remote control products for industrial, scientific and general automation applications.Our Phalanx wireless family include products for monitor & control instrumentation, wireless remote controls and off-grid solar power systems.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Mini In-Circuit Test System
U9403A
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The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Emergency Battery Power Supply Test Fixture
TA-61
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This test fixture provides an interface to test and chargethe Radiant type RPS1-B Emergency Lighting power supply. The panel includes the switching required asdescribed in the CMM along with an analog currentmeter for monitoring the charging current. This panelprovides simple testing for the corporate flight departmentor DOM.
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NI Real-Time Test Cell Reference System
778820-35
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DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Standard & Custom Test Fixtures
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Both standard and custom Test Fixtures from OAI enable the user to integrate the solar cell with the I -V tester. Fixture configurations range from from simple hold down devices to temperature-controlled fixtures with front and back side contact. We invite you to contact an OAI Application Engineer for help with your fixture design. With our expert guidance, you can expect maximum performance from your I -V Tester and Solar Simulator.
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Test Instruments
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Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Fixture Design
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TestEdge offers quick, cost effective test fixture design services for low-speed, full-speed, and high-speed devices. Based on our experience in developing high performance test fixtures for a wide variety of devices, test sockets, and tester platforms, we provide a premium quality test and engineering validation environment for everything from high power (40W) to high pin count to high speed ECL to high speed SerDes (3.25Gb) devices.
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Test Fixturing Solutions
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Amfax and MAC Panel have teamed up to provide a unique WIRE-FREE Test fixture technology. We have created an alternative solution to traditional wired ITAs called PECture(TM). The name is a combination of PEC (Printed Electronic Circuit) and fixture.
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Stand-Alone Test Fixture
MA 2013/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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MANUAL TEST FIXTURE KITS
SERIES 5590
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Built with unique design features: Ease of assembly and disassembly All side panels are removable Side panel material is delrin for easy machining for connectors, switches etc.Light weight and durable construction2" Between Probe plate and lid plate allowing more room for tall board components
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Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Die Test Handler
3112
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Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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In-Circuit Test Fixtures
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In-circuit testing provides electronic manufacturers a reliable, high fault coverage verification method for the assembly process. Circuit Check ICT fixtures are robust, reliable and designed for easy customization to cover a large range of PCB sizes without impacting turnaround time. We stock a large variety of fixture sizes and actuation methods to meet your test demands. If a stocked sized ICT fixture is not adequate our engineering staff will design a custom solution.
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Mach Airspeed Test Fixture
TA-6055A
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The TA-6055A is a Mach Airspeed Test Fixture built to support the testing and repair of the 2082 and 2083 series of Servoed Mach Airspeed Indicators (SMASI) used in some Boeing aircraft. These mach airspeeds are synchro driven and require a coarse and fine input for altitude and a third input for airspeed. This test fixture was designed around the test procedure and is interfaced with our TA-1001 panel which provides for two of the synchro sources and two Angle Position Indicators (API).
