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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery prot...show more -
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PCB Adapter, Receiver, VTAC, to (2) USB 5 Gbps (USB 3.0, USB 3.1 Gen 1, USB 3.2 Gen 1) and (4) RJ45 Connectors
510170114
Mates with p/n 510171114.Please note: The RJ45 connectors extend beyond the width of the module. Care should be taken when installing in positions adjacent to other PCBs. Please contact VPC, if further assistance is needed.
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PXI Pull-Thru Adapter, Wired, QuadraPaddle, to 78 Pin Female D-Sub
510140194
PXI Pull-Thru Adapter, Wired, QuadraPaddle, to 78 Pin Female D-Sub
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Atec Dyna
Macro-instruments an innovative concept : ultra-simple interface between the test bench and the equipment being tested, Software-controlled macro-instrument, Generic TUA (Test Unit Adapter) incorporated in the bench
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6TL23 Off-Line seat operation Base Test Platform w/o Table
H71002301
- 18U height 19inch rack space (580mm depth)- VPC G12 or G12X interface- Man Machine interface H73000301 (not included)- stand-up operation
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2529 with six 36" cables
510150154
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2529 with six 36" cables
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Universal Test Set for Recloser Controls
ARCO 400
ARCO 400 is a smart and rugged testing solution for all recloser controls. It provides the fastest way to perform simple manual trip and close checks. Using the OMICRON Smart Connect technology, ARCO 400 is capable of detecting recloser specific test adapters.
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Universal Function Test System for Industrial Electronics
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Pull-Thru Adapter, Wired, QuadraPaddle, 90 Series, 2 VHDCI Male
510140158
Pull-Thru Adapter, Wired, QuadraPaddle, 90 Series, 2 VHDCI Male.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2532 with 36" Cables
510150143
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2532 with 36" Cables
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Pull-Thru Adapter, PCB, QuadraPaddle, to 96 Pin FML DIN, f/ NI PXIe-4322
510140250
Pull-Thru Adapter, PCB, QuadraPaddle, to 96 Pin FML DIN, f/ NI PXIe-4322.
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16 Mbit/s, 16-Channel Digital I/O Adapter Module for FlexRIO
NI-6584 / 781290-02
16 Mbit/s, 16-Channel Digital I/O Adapter Module for FlexRIO—The NI-6584 is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO, creates a digital instrument for interfacing with 16 RX and TX pairs of RS485 or RS422. This digital I/O adapter module for FlexRIO can be used to do real-time interfacing and analysis of RS485 and RS422 as well as other electrically compatible interfaces. The NI-6584 can sample digital waveforms at up to 100 MHz clock rates, has terminated and unterminated options, and full and half duplex configurations.
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Communications Test System for Frontline Diagnostics
ATS3000P
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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NI-6581, 100 MHz, 54 Single-Ended-Channel Digital I/O Adapter Module
780565-01
100 MHz, 54 Single-Ended-Channel Digital I/O Adapter Module for FlexRIO—The NI-6581 is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO, creates a digital instrument for interfacing with 54 single-ended digital pins. You can use the NI-6581 to do real-time interfacing of standard protocols and implement customized protocols. The NI-6581 can operate sample digital waveforms at up to 100 MHz. It includes support for common transistor-to-transistor logic (TTL) voltage levels, or other voltage references can be sourced externally using a front panel connector.
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Pull-Thru Adapter, Wired, QuadraPaddle, PXI 160 Pin DIN
510140311
Pull-Thru Adapter, Wired, QuadraPaddle, PXI 160 Pin DIN
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Pull-Thru Adapter, Wired, QuadraPaddle, to 68 Pin SCSI Female
510140251
Pull-Thru Adapter, Wired, QuadraPaddle, to 68 Pin SCSI Female
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PCI to PCI Express Adapter
SKU-011-01
The PCI to PCI Express Adapter simply turns your computer’s existing PCI slot into a PCI Express slot. This provides a seamless interface for older PCI systems to accept new PCI Express devices – making it possible to utilize old test equipment (computers, PCI extenders, PCI bus analyzers etc.) during migration from PCI to the PCI Express interface.There is no need to purchase additional software or to install new device drivers; simply plug & play!
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VR/AR/MR Calibration Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.