Test Adapters
See Also: Interface Test Adapters
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Coax, Contact, Receiver, 20/26 GHz, 3.5MM, w/ SMA Adapter, 90 Series Modules only
610102135
Primary mating contact 610102134. (May mate with other ITA contacts, as well.)Mechanical SpecificationsDurability 20,000 cyclesContact Material Shield – brassCenter conductor – BeCuContact Plating 30µ" Au over 100µ" NiContact Termination 3.5mm compatibleInsulator PTFEMating Force 3.0 lbs max [1.36 kg]Electrical SpecificationsCharacteristic Impedance 50 ΩFrequency Range DC to 26 GHzVSWR 1.15 + .01 (f) GHzInsertion Loss .06 x√f(GHz) dBDWV 800 V RMS Shield to center contact1000 V RMSContact Resistance 5 mΩ max. center conductor3 mΩ max. shieldCable Specifications 3.5mm compatible Environmental SpecificationsOperating Temperature -65°C to +125°CVibration MIL-STD 202, Method 204, Test Condition DShock MIL-STD 202, Method 213, Test Condition IInsulation Resistance 2000 MΩ min.
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NI-5783, 40 MHz Bandwidth Transceiver Adapter Module for FlexRIO
784364-02
The NI‑5783 has DC‑coupled inputs with two variants: an elliptic filter variant optimized for frequency-domain applications and a Butterworth filter variant optimized for time-domain applications. The NI‑5783 is particularly well suited for applications in software defined radio, electronic warfare, high-performance machine control, and medical imaging. The NI‑5783 is compatible only with the PXI FPGA Module for FlexRIO modules that have a Kintex‑7 FPGA and the stand-alone Controller for FlexRIO.
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NI-5791, 200 MHz to 4.4 GHz RF Adapter Module For FlexRIO
782510-01
The NI‑5791 provides continuous frequency coverage from 200 MHz to 4.4 GHz. It features a single-stage, direct conversion architecture that provides high bandwidth in the small form factor of a FlexRIO adapter module. The onboard synthesizer, which is the local oscillator (LO), sets the center frequency for acquisition and generation, and you can export it to other modules for multiple input, multiple output (MIMO) synchronization. You can also import the LO from an external connector, enabling synchronization of up to eight NI‑5791 modules. For higher frequencies or a greater number of devices, you can use an external LO distribution amplifier.
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Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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NI-6585, 200 MHz, 32 LVDS-Channel Digital I/O Adapter Module for FlexRIO
781071-01
200 MHz, 32 LVDS-Channel Digital I/O Adapter Module for FlexRIO—The NI-6585 is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO, creates a digital instrument for interfacing with 32 low-voltage differential signaling (LVDS) digital pins. A digital I/O adapter module for FlexRIO can be used to do real-time interfacing of standard protocols and implement customized protocols. The NI-6585 can operate at up to 200 MHz clock rates and includes support for common LVDS voltages.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
510140125-2
PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
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Test Fixture, Axial And Radial
16047A
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Environmental Control System Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
510140125-1
PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Scienlab Battery Test System – Module Level
SL1001A Series
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Off-Line Base Test Platform
6TL19
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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16 Mbit/s, 16-Channel Digital I/O Adapter Module for FlexRIO
NI-6584 / 781290-02
16 Mbit/s, 16-Channel Digital I/O Adapter Module for FlexRIO—The NI-6584 is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO, creates a digital instrument for interfacing with 16 RX and TX pairs of RS485 or RS422. This digital I/O adapter module for FlexRIO can be used to do real-time interfacing and analysis of RS485 and RS422 as well as other electrically compatible interfaces. The NI-6584 can sample digital waveforms at up to 100 MHz clock rates, has terminated and unterminated options, and full and half duplex configurations.
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Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Liquid Test Fixture
16452A
The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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PCIe 4.0 Test Platform
PXP-400A
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Image Sensor Testing
IP750Ex-HD Family
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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In-Circuit Test
TestStation LH
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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PCB Adapter, Receiver, SIM, VTAC, 96 Pos, 14 Slot, to (1) 12x InfiniBand
510170108
A small, modular PCB board that connects high speed digital inserts (VTAC) to a single 12x InfiniBand connector. Great for COTS cable configurations. Compatible with all VTAC/SIM receiver modules.
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NI-6585B , 200 MHz, 32 LVDS-Channel Digital I/O Adapter Module for FlexRIO
784060-01
200 MHz, 32 LVDS-Channel Digital I/O Adapter Module for FlexRIO—The NI-6585B is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO, creates a digital instrument for interfacing with 32 low-voltage differential signaling (LVDS) digital pins. A digital I/O adapter module for FlexRIO can be used to do real-time interfacing of standard protocols and implement customized protocols. The NI-6585 can operate at up to 200 MHz clock rates and includes support for common LVDS voltages.
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Test Fixture
16047E
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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PCB Adapter, Receiver, SIM, VTAC, 40 Pos, 6 Slot, to (1) HDMI
510170113
A small, modular PCB board that connects high speed digital inserts (VTAC) to a single HDMI connector. Great for COTS cable configurations. Compatible with all VTAC/SIM receiver modules.
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19inch 43U Heavy Duty Test Platform
6TL28
The 6TL28 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 43U (640mm depth).
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
