Test Adapters
See Also: Interface Test Adapters
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to 2x68 Female VHDCI Connectors
510150126
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Female VHDCI Connectors
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PCB Adapter, ITA, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Male SCSI Connectors
510150165
PCB Adapter, ITA, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Male SCSI Connectors.
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Pull-Thru Adapter, Wired, QuadraPaddle, f/ Pickering 40-614A-002
510140253
Pull-Thru Adapter, Wired, QuadraPaddle, f/ Pickering 40-614A-002.
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Attenuator Interconnect Kit, 2.92 mm
11716D
The 11716D attenuator interconnection kit provides the necessary parts to connect 84904L and 84906L programmable step attenuators in series.
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PCB Adapter, Receiver, TriPaddle, 96 Position, To PCB-Mounted 1x96 Male DIN 41612 Connector
510104139
The 96 Pin Signal receiver module is made from Ryton R-7, withstanding temperatures up to 220°C. Nomenclature is molded on the module.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 2 x 68-Pin FML VHDCI
510150126-1
Single PCB adapter p/n 510150126 ships with 2 x 68-pin VHDCI male double-ended 2m cables, packaged separately. Available PXI card solutions for NI PXI-2535 and PXIe-7868.
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Off-Line Testing Platform
6TL22
The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain, and cost-effective. The rack is prepared for the direct integration of the three platform-based receivers from Virginia Panel, the S6, G12 and G12X.The core of the system can be either an Industrial PC or a NI-PXI. A UPS will protect the valuable instrumentation as well as control all the steps for an automatic power-up and down of the test system.
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Interconnect Adapter, C-Size, Double Slot, 4 Module Positions
510109118
Interconnect Adapters funnel wiring from modules to a VXI card. The adapter has removable side, top and bottom plates. Connector cover plates and cable clamps are ordered separately.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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PCB Adapter, ITA, VTAC, to (6) USB 5 Gbps (USB 3.0, USB 3.1 Gen 1, USB 3.2 Gen 1)
510171103
This fully loaded loaded SIM ITA module connects 34 slots of VTAC inserts to (6) USB 5 Gbps (USB 3.0, USB 3.1 Gen 1, USB 3.2 Gen 1) connectors. Ships fully assembled.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Adapter Plate, 9050 Enclosure to 9025 ITA
410112976
Adapter Plate, 9050 Enclosure to 9025 ITA (ITA Positioned on Lower Part of Enclosure)
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PCB Adapter, Receiver, VTAC, to (2) USB 5 Gbps (USB 3.0, USB 3.1 Gen 1, USB 3.2 Gen 1) and (4) RJ45 Connectors
510170114
Mates with p/n 510171114.Please note: The RJ45 connectors extend beyond the width of the module. Care should be taken when installing in positions adjacent to other PCBs. Please contact VPC, if further assistance is needed.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Power Cord, AC, U.S., 120 VAC, 2.3 Meters
763000-01
Power Cord, AC, U.S., 120 VAC, 2.3 meters
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Pull-Thru Adapter, Wired, TriPaddle/Mini Coax, 90 Series, for PXIe-5172
510140248
Pull-Thru Adapter, Wired, TriPaddle/Mini Coax, 90 Series, for PXIe-5172.
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PCB Adapter, ITA, SIM, VTAC, 32 Pos, 6 Slot, to (1) DisplayPort
510171116
PCB Adapter, ITA, SIM, VTAC, 32 Pos, 6 Slot, to (1) DisplayPort.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
