ATE
ATE systems are used to test semiconductor devices, printed circuit boards, and electronic systems during manufacturing. AI prompted RL created', prevails upon the UUT to demonstrate It's fulfillment of test requirements.
See Also: Automatic Test Equipment, ATS, Functional ATE, Combinational ATE, Semiconductor Test, PXI Switching, PXI Chassis, PXI Matrix, Automated Test Equipment, Automated Test Systems
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Product
ATE System Power Supplies
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For more than 50 years, Keysight's automated test equipment (ATE) power supplies have changed the way engineers prove their designs, understand issues, and ensure product quality. Our programmable ATE system power supplies' compact design makes it easy to integrate them into any system. Keysight power supplies make it easy to update a test program with modern interfaces, LXI-core capability, and SCPI language. Accelerate test time with fast command processing and quick settling times.
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ATE Parts
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Comware Technical Services, Inc.
We have thousands of parts in stock including hard to find legacy system components. For the best pricing, service and quality look to Comware for replacing your GenRad, Teradyne , Agilent and TRI system parts and modules.
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ATE Support
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For the last 30 years, Terotest has offered a range of support services, from standard maintenance and calibration to ATE updates and legacy ATE replacement solutions.We provide, repair and exchange ATE modules, fixtures, adaptors and other hardware, as well as offering full maintenance contracts to our customers.
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ATE System Integration
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Cyth Systems is a Systems Integration Company specializing in Automated Test (ATE), Embedded Controls, and Machine Vision. Our skilled and experienced team uses their natural talent for problem-solving to create solutions in a wide range of industries. We build our solutions starting with the National Instruments (NI) platforms including LabVIEW and PXI, and by adding best-in class sensors and components.
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Product
ATE For ADC Module
MS 1527
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The Semi-ATE is used for testing the analog ADC. It shall carry out the functional test on ADC analog module. The ATE shall have all necessary IO signals on the connector end. The semi-ATE can carry out the functional tests on ADC analog module with host PC or laptop. It provides +15V, -15V, +5V & -5V to module and +2.5V high precision reference voltage. It can able to control keysight N6700B Power supply mainframe using RS422 interface.
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Product
ATE System Power Supplies
N8700 Series
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The Keysight N8700 Series ATE system power supply delivers high current with low noise in a compact two unit package. Airflow moves front to back, so no additional space is required above or below the power supply in your automated test equipment (ATE) rack. This series of programmable power supplies sources up to 3300 or 5200 W. Get output voltages from 8 to 600 V and 5.5 to 400 A.
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Product
Generic RF ATE Test
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The Generic RF ATE is developed to test the Radar and Radar Subsystems. The ATE is primarily built using an instrumentation control, precision RF routing systems and rack mounted test instruments. Generic RF ATE system enables measurement of parameters of Radar equipment such as Local Oscillators, Waveform Generators, Up and Down Converters, Analog Receivers, Array Group Receiver Units, TR Modules. The ATE is configured to test the Radars upto 18GHz frequency range.
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Aerospace & Defense ATE Systems and Services
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TE solution design, development, and integrationMeasurement / Test Process analysis and consultationEasy-to-use software interfaces for Engineers and UsersFactory automation for test processesAll major instrument brands available & supported
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Satellite ATE
MS 1123
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Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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Product
Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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ATE Socket
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Design ATE socket according to customer's requirementsUse on auto-test eqiupments and handler.Pitch range from 0.30 to 1.0mm.Pin amount: 2 and above.Key material: Peek,Torlon.etcContact with top pogo pin
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Product
Redundant Strap down INS ATE Test Station
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Redundant Strap down Inertial Navigation System (RESINS) checkout test station comprises of cPCI chassis with various functional I/O modules like ADC, DAC, DIO, VFC, Relay matrix, MIL 1553, GPIB, Serial communication interfaces and Custom Built System interface adaptor.
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ATE For Data Communications Equipment
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• Developed for DRS Codem Systems, Inc. to test the CTM-IP product line of the Multi-Interface Protocol Converter.• Manufacturing Test support for the CTM-IP chassis and Interface Modules. Functional test of signaling, protocol and software configurations for various communication interface configurations.• Regression Test support for Engineering Product Development. Configurable test sequencing allows engineer to select specific tests for execution, with the ability to exercise all combinations of data rates and interface configurations.
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Obsolete ATE, Replacement Systems
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No one likes saying goodbye to a faithful old friend but now that the economy is on the up, has the time finally come to replace your ageing Automatic Test Equipment (ATE) or Special to Type test system?
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Docking / ATE
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The iDock Series is a series of connectors ideal for use with automatic machine handlers in production testing. Floating bushings allow up to .04" of re-alignment. Use with a combination of various I/O modules and a max of 5,952 signal contacts simultaneously. The iDock series is rated up to 100,000 cycles.
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Product
VNAs for Automated Test Equipment (ATE)
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With our USB VNAs your automated test equipment works as one software system running on a single computer. We can customize the analyzer module to fit in your system, provide extra frequency range coverage as compared to our standard VNA models should you need it in your specific application or characterize the expected performance outside the frequency limits of our standard VNAs.
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ATE Design & Build
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PXI has become the de-facto standard for housing the high performance modular instrumentation required to meet the demands of testing today's high performance products. Based on the PCI bus, PXI (PCI Extensions for Instrumentation), this platform is used in most of our new ATE designs.
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ATE Connecting Solutions
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C.C.P. Contact Probes Co., LTD.
Customized pogo towers with high frequency capability.
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ATE Solutions
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Our custom, application-specific ATE Test Solutions offer a full test suite with Test Systems hardware, software, and support services.
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Product
Device Power Supply (DPS) & Parametric Measurement Units (PMU) ATE
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Analog Devices’ parametric measurement units (PMUs) and device power supply (DPS) products offer a flexible range of voltage and current source/measurement capability to meet the needs of a wide range of cost-sensitive test applications. With a proven track record, Analog Devices’ PMU and DPS products serve a wide variety of precision test application requirements, such as measurement and control for voltage and current. Analog Devices’ DPS and PMU products are equipped with unique precision measurement and control capability for today's demanding ATE solutions.
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Product
9U ATE Rack
MSMI 1014
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- Capable of handling up to 2688 IO signals- Capable of handling up to 1344 Power signals- Portable and Rack mountable- Suitable for more depth PCBs (up to 410mm)- Fourteen PCBs can be accommodated with Fascia plate of 30 mm width
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Product
Automated Discrete Semiconductor Tester (ATE)
5000E
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Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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ATE Computer
MS 1201
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This system used for multi-purpose applications such as data acquisition and Automatic Test Equipment. ATE Computer has ISA Bus based eleven slots with inbuilt power supply. Micro Processor board or USB Controller is used to drive the back plane.
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Solar ATE
MS 1534
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The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.
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Product
Automated Discrete Semiconductor Tester (ATE)
5300HX
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The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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ATE Self Test Fixtures
AL663
Test Fixture
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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RF ATE Tester
ADIVIC MP5800/MP5806
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MP5800 seamlessly upgrades your existing Chroma 3380, 3650 to RF ready ATE test solution, user friendly debug tools, IOT turnkey test solution.
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ATE Core Configurations
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ATE Core Configurations streamline the design, procurement, and deployment of automated test systems with highly integrated mechanical, power, and safety system infrastructure. These off-the-shelf systems reduce lead times and simplify standardization and global deployment. Lower your total cost of ownership for your test systems with ATE Core Configurations.
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RF/Microwave ATE Systems
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Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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