MEMS Probe Card
STAr has designed and developed MEMS (Micro-Electro-Mechanical Systems) type probe card suitable for testing of highly parallel large-array multi-DUT devices to increase productivity with greatly reduce cost-of-test.
STAr has designed and developed MEMS (Micro-Electro-Mechanical Systems) type probe card suitable for testing of highly parallel large-array multi-DUT devices to increase productivity with greatly reduce cost-of-test.
