Discrete Semiconductor Testers
check connected individual semiconductor components.
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Semiconductor Test Platform
PAx
PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.
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Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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Semiconductor
Package FunctionSMV(2.9mm*2.8mm) AND GateUSV(2.0mm*2.1mm) NAND GateFM8(5.0mm*4.5mm) NOR GateSM8(2.9mm*4.0mm) OR GateUS8(2.0mm*3.1mm) INVERTER
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Semiconductor
Aerotech has a long history of engineering and manufacturing motion systems and components for high precision wafer processing, scanning electron microscopy (SEM), wafer bumping, 450 mm wafer manufacturing, lithography equipment and advanced laser micromachining. We also specialize in systems and components for vacuum applications, such as EUV lithography. So whether you need off-the-shelf wafer bumping components or a custom-engineered SEM system manufactured and tested to exacting specifications, Aerotech can provide the optimal solution for your application.
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Accelerate Semiconductor Development With IP-Centric Design
MethodicsIPLM
Methodics IPLM provides a scalable IP lifecycle management platform that tracks IP and its metadata across projects, providing end-to-end traceability and enabling effortless IP reuse. Learn more by connecting with an IP expert today.
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32-CH Discrete Input Modules
HSL-DI32-M-N/HSL-DI32-M-P
- Slave ID consumption: 2 consecutive from odd- "N" type for NPN sinking type sensor or dry contact; "P" type for PNP sourcing type sensor or wet contact- Photo couple isolation voltage: 2500 Vrms- Input impedance: 4.7 KΩ- Input current: ± 10 mA (Max), ± 12.5 mA (Peak)- Input voltage: ± 40 V (Max)- LED indicator: Power, Link and Input status- Power supply: +10 V to +30 VDC
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Semiconductor Inspection (SEMI)
A process for detecting any particles or defects in a wafer.
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Discrete & Power Modules
A product portfolio that offers full spectrum of high, medium and low voltage power discrete devices along with advanced power module solutions, including IGBT, MOSFET, SiC, Si/SiC Hybrid, Diode, SiC Diode, and Intelligent Power Modules (IPMs).
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Discrete Devices Test
FTI 1000
The FTI 1000 tester consists of independent test channels that allow all DC and AC MOSFET parameters to be tested either separately, or in one handler insertion or prober touch-down.
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Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Software to Simulate Large Area Semiconductor Devices
Laoss
Laoss is a powerful software to simulate large area semiconductor devices (OLED, thin-film PV), taking into account the voltage drop in the electrodes due to important resistive effects when the size of the device increases.Simulation of large area semiconductor devices (OLED, thin-film PV)Coupling law input: analytical or tabulated (experimental or simulated) IV curveDevice optimization (electrode material, device geometry etc...)High speed computation
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32-CH Discrete Input Daughter Board Module
HSL-DI32-DB-N
*Slave ID consumption: 2 - N: for 32-CH NPN sinking type sensor inputs or dry contact*Photo couple isolation voltage: 2500Vrms*Input impedance: 4.7KΩ*Input current: ??10mA (Max), ??12.5mA (Peak)*Input voltage: ??40V (Max)
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300 Mm Semiconductor Processes
With the Center Nanoelectronic Technologies (CNT), the Fraunhofer IPMS conducts applied research on 300 mm wafers for microchip producers, suppliers, equipment manufacturers and R&D partners. In the field of FEoL and BEoL we offer the following technology developments and services at Ultra Large Scale Integration level (ULSI):
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Semiconductor Manufacturing Optics
No lithography without optics. No semiconductors without lithography. Without semiconductors there would be no microchips, without microchips no computers – no high-tech products. As an OEM (Original Equipment Manufacturer) supplier, ZEISS enables the semiconductor industry worldwide with optics and other optical modules.
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Volt Tester
VT750LCD
The VT750LCD is a compact reliable robust automatic voltage tester up to 750V. The testers can measure and indicate the exact voltage (AC/DC), phase indication, phase rotation and continuity, RCD, and resistance via an LCD.
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RCD Testers
PeakTech Prüf- und Messtechnik GmbH
The PeakTech 2710 is a residual current tester, which is used to determine tripping currents and the tripping times of residual current circuit breakers, which are used in every new building according to current building regulations. Residual current circuit breakers are used for personal protection and switch off a circuit when a residual current is registered which flows off via the protective earth (PE). RCD testers let a fault current flow and thus determine at which fault current the RCD triggers. The tripping time is also measured. These two parameters, tripping current and tripping time, are the safety-relevant parameters of an RCD. The various selectable test currents and characteristics that can be set with this device make the PeakTech 2710 the ideal companion for every electrician.
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Single-functional testers
3110
The MI 3110 EurotestIM is a perfect tool for testing of permanent integrated or portable Low Voltage Electrical Installa-tions supplied by Generator or Transformer and protected by an IT earthing system. Designed for simple but efficient safety testing of Integrated IT Earthing System powered with LV Generator or Transformer! With a single, pre-programmed AUTO SEQUENCE® with sub-tests and adjustable limits it is possible to perform all the necessary verifications of safety limits of a specific LV IT installation.
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Torque Tester
WDI series
New standard torque tester. Manage electric screwdrivers, manual torque screwdrivers, and wrenches with this one unit! WDI-10HR WDI-100HR WDI-250. THE CULMINATION OF 50 Years of Manufacturing TORQUE MEASURING TOOLS.
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AIS Tester
AIS Tester is professional equipment for surveyors, classification societies and administrative authorities, which can use it to provide qualified testing of the Class A and Class B AIS mobile stations and AIS-SARTs.
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Igniter Tester
A specific type of ohmmeter used to conduct safe resistance tests on explosive devices, such as squibs.
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Relay Testers
Outputs 100VA single-phase voltage and 180VA single-phase currentEquipped with counter function, output selector, auto sweep function, memory function, DC output for testing, master/slave function, etc.Output frequencies of 50Hz, 60Hz, and 10Hz to 200Hz, using external synchronization or line synchronization (selectable)Equipped with GPIB/RS-232C interfacesWeight: 19.5kg
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Battery Tester
CS-3001
The CS-3001 test system records all block voltages, total voltage and current during a discharge test. The modular design makes it easy to connect most of all battery installations, starting from a single block and ending up with 960 block voltages. Up to four parallel strings can be tested. All measuring modules are electrically isolated (600VDC CAT III, 5000VAC test voltage).
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Cable Tester
WEETECH offers a number of individual testers for the low voltage open test and short test.
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Specialty Testers
Test Voltage from 120V to 600V AC/DCNon-Contact Voltage Sensor from 90V to 1000VTest Continuity & PolarityCase serves as prod holder for one-hand operationSelf-storing prodsSolenoid Sensing indicated by LEDs & VibrationErgonomic Soft PVC housing for comfort gripLED Spotlight Illuminates Work AreaBattery not Included (AAA x 1)
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Battery/Alternator Tester
BT55U
Schumacher Electric Corporation
BATTERY/ALTERNATOR TESTERFOR TESTING:• Battery state of charge• Charging system outputFEATURES:• Accurate, easy-to-read LCD screen.• Checks the battery, alternator systems• Two LED indicators• Overvoltage and Reverse Polarity Protection Contents: (1) Battery/Alternator Tester
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Semiconductor Authenticity Verification & Anti-Counterfeiting
JTAG Interrogator
Top manufacturers have used JTAG tests for years to ensure electronic systems are free from defects and assembled correctly. With growing uncertainty in supply chains and the proliferation of counterfeit components, that same technology can be used to verify the authenticity of system components.The Corelis JTAG Interrogator is an affordable solution for semiconductor verification. The software and hardware system provides the means to quickly identify components on an assembled electronic product by reading available information from the JTAG chain. Components can also be scanned to discover undocumented opcodes that may indicate hidden JTAG capabilities such as backdoors and harmful or malicious functions.Fast and nonintrusive JTAG component identification has never been so easy.
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Smoothness Tester
DRK105
Shandong Drick Instruments Co., Ltd.
DRK105 Smoothness Meter is designed according to Bekk method to measure paper and cardboard’s smoothness.
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Snap Tester (Button Pull Tester)
TF145
TESTEX Testing Equipment Systems Ltd.
Snap Tester (Button Pull Tester), to determine the holding or breaking strength of prong-ring attached snap fasteners onto garments or toys, also as a Push Pull Tester for compression and tensile testing of small samples(special attachments are available).
