-
Product
Observational Systems: Data Handlers And Battery Packs
-
Data loggers allow users to connect a variety of sensors to a single controller that manages, stores, and sends the collected data as a single data stream.
-
Product
Pick And Place Test Handlers
-
Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.
-
Product
Turret Test And Scan Handlers
-
Turret platforms for semiconductor test, inspection and packaging.
-
Product
High Performance Strip Handler
Rasco Jaguar
-
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for Power and Sensor devices. Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.
-
Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
-
Product
Modular Gravity Handler For Small Devices
Rasco SO2000
-
Modular designed gravity handler with various input and output possibilities. SO2000 can handle the smallest possible packages for gravity and provides a broad range of Sensor and MEMS applications.
-
Product
High-Performance Strip Handler
MCT SH-5300
-
SH-5300™ high-performance strip handler for testing advanced semiconductor packages, LEDs, MEMS sensors, and traditional ICs. It can handle a vast array of strip and laminate lead-frame sizes. Capable of tri-temp testing -55˚C to +160˚C and ambient testing to +160˚C.
-
Product
50Hz-100kHz LCR Meter
11022/11025
-
Chroma Systems Solutions, Inc.
0.1% basic accuracyTransformer test parameters (11025), Turns Ratio, DCR, Mutual Inductance0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies21ms measurement time (≥100Hz)Agilent 4263B LCR Meter commands compatible4 different output resistance modes selectable for non-linear inductor and capacitor measuringHigh resolution in low impedance(0.01mΩ) and high accuracy 0.3% till 100mΩ rangeAdjustable DC bias current up to 200mA (constant 25Ω) (11025)1320 Bias Current Source directly control capability0.01mΩ ~ 99.99MΩ wide measurement range (4 1/2 digits)Dual frequency function (11022 option) for automatic productionBIAS comparator functionComparator function and 8/99 bin-sorting functionPass/fail judge result for automatic productionHandler interface trigger edge (rising/falling) programmableTest signal level monitor functionStandard RS-232, GPIB, and Handler I/FOpen/short zeroing, load correctionLabView® Driver
-
Product
MEMS Handler
4664-IH
-
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
-
Product
Full Range Active Thermal Control Handler
3110-FT
-
Chroma 3110-FT is an innovative pick & place system ideal for characteristics evaluation, development, and IC final test.
-
Product
Kitless Pick-and-Place Handler
900
-
Exatron now offers a new breed of Benchtop Pick & Place Handlers: the Model 900 series. The Model 900 is an extremely efficient yet inexpensive PC controlled Pick & Place System
-
Product
Die-To-Wafer Bonding Systems
-
Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
-
Product
Wafer Level Test Handler
Kronos
-
Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
-
Product
Line Automation Equipment
5000 Series In-line Handler
-
The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.
-
Product
Octal Test Site Handler
3180
-
The Chroma 3180 is a productive pick & place system for high-volume multi-site IC testing.
-
Product
300KHz Precision LCR Meter
Model 4300R
-
Aplab Precision LCR Meter Model 4300R is a new generation of impedance test equipment with high accuracy, wide measurement range and six digits resolution. Being featured with test frequency up to 300kHz, test voltage of 5mV ~ 2V, built-in -5V ~ 5V DC bias and -10V~10V DC voltage source output, it can meet all requirements for measuring components and materials and provide guarantees for production line quality assurance, incoming inspection and laboratory precision measurements. The Handler, RS232C and GPIB interfaces as well as improved command system provided by the instrument make it easier to build the test system.
-
Product
Programmable LCRZ Meter
DU-6212/6215/6216
-
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
-
Product
Gravity Handler
-
State of the art model, which features a high throughput capability, eight sites, and high and low temperature measurements, and meets all high-frequence contact requirements. Complete measures to prevent jamming and lead deformation enable high availability. This model is highly regarded by top users around the world because of its high throughput and high reliability.
-
Product
6TL36 Plus In-line Test Handler w/Bypass
EA923
Test Handler
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
-
Product
Pick And Place Contactors
-
Designs available for all Pick and Place handler brands, suitable for all range of packages with Multiple Pitch and various numbers of I/Os. Full tri-temp capability up to 180 Deg C.
-
Product
Die Test Handler
3112
Test Handler
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
-
Product
Film Frame Test Handler
4170-IH
-
High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
-
Product
Semiconductor Memory Tester
T5851
-
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
-
Product
Test Handler
M4171
Test Handler
Advantest’s M4171 single-site handler combines these capabilities in a portable design that is ideally suited for use in engineering environments.
-
Product
Capacitor Leakage Current/IR Meter
Chroma 11200
-
Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
-
Product
DC-Resistance Meter
-
High-stability internal resistance of the battery Meter.The main battery internal resistance and battery voltage. This product can simultaneously measure the resistance and voltage and to compare battery internal resistance and open-circuit voltage.The CHT3560 standard RS232C and HANDLER interface automated measurement fast and accurate judgment the battery deterioration of the situation, sorting products suitable for battery assembly line and factory inspection. Low resistance characteristics can be used to characterize the mechanical and electrical components down low current test conditions.
-
Product
MEMS And Sensor Test Solutions
-
Modular design based on standard handlers, high parallelism, ambient to automotive tri-temp handling.
-
Product
High Parallel Tri-Temp Pick-and-Place Handler
Delta MATRiX
-
Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
-
Product
SlipFinder
YIS and SF Series
-
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.
-
Product
Test Handler
M6242
Test Handler
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
