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Product
Octal Test Site Handler
3180
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The Chroma 3180 is a productive pick & place system for high-volume multi-site IC testing.
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Product
High Parallel Tri-Temp Pick-and-Place Handler
Delta MATRiX
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Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
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Product
Milliohm Meter
16502
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Chroma Systems Solutions, Inc.
Basic accuracy : 0.05%Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurementDC test current output mode is used to fasten measurement speed for inductive DUTDry-circuit test current output mode (limited Max. 20mV) is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 50mVTemperature correction (TC function) regardless of material or temperatureUseful temperature conversion function for motor/ coil evaluation4 channels R scan with balance check function for fan motor (combined with A165017 option)0.001mΩ~1.9999MΩ wide measurement range with 4½ digits resolutionStandard RS-232 interfaceOptional GPIB & Handler interfaceBin-sorting functionComparator and pass/fail alarming beeper functionLarge LCD display (240 x 64 dot-matrix)Friendly user interface
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Product
Test Handler
M4171
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Advantest’s M4171 single-site handler combines these capabilities in a portable design that is ideally suited for use in engineering environments.
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Product
High Parallel Test Handlers
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High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.
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Product
Kelvin Test Contactor
cCruiser
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cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.
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Product
Software Tool Especially Designed for Production Process Supervision
LEON OP
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The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
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Product
50Hz-100kHz LCR Meter
11022/11025
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Chroma Systems Solutions, Inc.
0.1% basic accuracyTransformer test parameters (11025), Turns Ratio, DCR, Mutual Inductance0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies21ms measurement time (≥100Hz)Agilent 4263B LCR Meter commands compatible4 different output resistance modes selectable for non-linear inductor and capacitor measuringHigh resolution in low impedance(0.01mΩ) and high accuracy 0.3% till 100mΩ rangeAdjustable DC bias current up to 200mA (constant 25Ω) (11025)1320 Bias Current Source directly control capability0.01mΩ ~ 99.99MΩ wide measurement range (4 1/2 digits)Dual frequency function (11022 option) for automatic productionBIAS comparator functionComparator function and 8/99 bin-sorting functionPass/fail judge result for automatic productionHandler interface trigger edge (rising/falling) programmableTest signal level monitor functionStandard RS-232, GPIB, and Handler I/FOpen/short zeroing, load correctionLabView® Driver
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Product
Tabletop Single Site Test Handler
3111
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The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
Gravity Feed - Benchtop
3000B
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Exatron's Model 3000B Series of automatic component handlers integrates customer-specific ambient temperature programming and/or test sites and up to eight automatic device inputs and outputs.
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Product
Slip Line Detection System
YIS 200
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The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
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Product
Automated ICT System
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With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
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Product
Semiconductor Memory Tester
T5851
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Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Product
Pick And Place Test Handlers
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Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.
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Product
Test Socket Lids
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For handler setup or hand test, a manual lid is often required as part of the test hardware set. We have refined our standard offerings so that with each socket you can receive a lid designed specifically for your application from one of five standard lid form factors
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Product
Wafer Level Test Handler
Kronos
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Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Product
Film Frame Test Handler
4170-IH
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High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
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Product
300KHz Precision LCR Meter
Model 4300R
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Aplab Precision LCR Meter Model 4300R is a new generation of impedance test equipment with high accuracy, wide measurement range and six digits resolution. Being featured with test frequency up to 300kHz, test voltage of 5mV ~ 2V, built-in -5V ~ 5V DC bias and -10V~10V DC voltage source output, it can meet all requirements for measuring components and materials and provide guarantees for production line quality assurance, incoming inspection and laboratory precision measurements. The Handler, RS232C and GPIB interfaces as well as improved command system provided by the instrument make it easier to build the test system.
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Product
Test Handler
M6242
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Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
ICT: In-Circuit Testing
XILS In-Line Handling Solutions
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Designed to cover a large number of test points, with long panels for future expansion, the XILS series of Handlers, PCB test systems in the line of EIIT - Innovative Engineering Solutions, is ready for the most demanding applications.
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Product
Capacitor Leakage Current/IR Meter
Chroma 11200
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Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
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Product
Test Handlers
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Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.
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Product
High Speed Gravity Handler
MT9928 xm
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This well-established test handler provides field-proven reliability and performance. Its modular and scalable design and variety of options allow configuration of the MT9928 exactly according to the test needs. Easy-access design and easy-to-change conversion kit parts support fast and easy package style changes. The MT9928 has a large soak capacity and features the entire tri-temp range at outstanding temperature accuracy and stability.
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Product
In-Line / Board Handler
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Circuit Check’s in-line board handler fixturing exceed the high performance requirements associated with high-volume production. Circuit Check supports in-line fixturing for all the leading ICT handlers including Keysight 5i, Teradyne TSh Multi-Site, IPTE and Pematech. Circuit Check is the go-to partner for in-line functional test fixtures to speed production throughput.
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Product
Striptest Contactors
ULTRA® CONTACT Series
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ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Product
TestStation Automated Inline Handler | In-Circuit Test Solution
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Teradyne’s High-Speed Inline Automated Board Handler with TestStation Multi-Site Test Insert is designed for productivity, fast change-over, and low operating cost. Our in-circuit test solution fits seamlessly into automated production lines to provide “hands-off-lights-out” operation.
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
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The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
Test Handler
ETH
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The ENGMATEC test handler as the "heart" of our inline test solutions impresses with its wide range of applications for in-circuit, functional or final tests. All components of the modular system are coordinated with one another and can be combined with one another and with various production systems. Vision systems, scanners, marking devices and many other functions can be integrated.
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Product
HVAC Drives
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Our variable frequency drives are designed for HVAC applications, which include air handlers, cooling towers, and pumps, by combining reduced size and cost with advances in performance and quality.
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Product
In-Line Functional Test Fixtures
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Add an advantage to in-line production with fast change over interchangeable fixturing. Circuit Check’s in-line board handlers and in-line board handler fixturing exceed the high performance requirements associated with high-volume production. Circuit Check supports in-line fixturing for all the leading handlers.
