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Product
Test Interface Solutions
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As the leading independent provider of pick-and-place handler change kits, we provide the best quality and affordable kit using only the most robust materials.
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Product
Logic Test Handler
M620
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- Maximized Productivity- Handles various device size- Short conversion time- Easy mantenance- Minimized footprint
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Product
High Speed Pick and Place Handler
Commander 2000
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At throughput rates in excess of 2000 Units per Hour the HT Commander 2000 system provides unparalleled performance for the production handling and programming of flash memory devices or modules.
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Product
Automated Lead Frame Testing
Sigma MAG
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The Sigma MAG comes with an independent lead frame (un)loader for hands-free bond testing. The magazine handler is compatible with OHT and AGV and allows top and front-loading of multiple types
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Product
Test Handler
M4872
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Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Power Discrete Tester
Mostrak-2
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M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).
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Product
Clinical Microplate Instrumentation
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Clinical microplate instrumentation provides high efficiency and performance for your clinical diagnostic workflows. From ELISA microplate readers and washers, to multifunctional liquid handling, multimode detection and automated microscopy, Agilent BioTek microplate instruments and software are designed for ease of use in setup and operation, while providing powerful analysis for quick, high-quality results. For even greater automation and higher throughput, microplate stackers, handlers and automated incubators transform a benchtop instrument into a walk away automated system.
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Product
100Hz-50kHz LCR Meter –
11021/11021-L
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Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters available, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. The standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities enable the Chroma 11021/11021-L for use in both component evaluation on the production line and fundamental impedance testing for bench-top applications.
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Product
Final Test Manipulators
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for test heads up to 250 kg / 550 lbsfinal test dedicatedhandler docking prolowest possible floor loadeasy motion in z-direction to facilitate docking processforce feedback control feature ensuring operator safety and protecting equipment during set-upactive cable managementdurable and robust designoptimized footprint for various test heads580 mm linear in/out motion for handler service access160 mm linear side-to-side feature270 column pivoting featurenumerous additional, unique features for individual set-up requirements
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Product
Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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Product
ROV Thickness Gauges & Probe Handlers
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ROV Thickness Gauges & Probe HandlersCompleting the Cygnus ROV Mountable thickness gauges, a range of ROV Probe Handlers have been developed to offer an engineered probe handling solution. Each probe handler will work with a thickness gauge of the Cygnus ROV Mountable range listed below.
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Product
DC-Resistance Meter
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High-stability internal resistance of the battery Meter.The main battery internal resistance and battery voltage. This product can simultaneously measure the resistance and voltage and to compare battery internal resistance and open-circuit voltage.The CHT3560 standard RS232C and HANDLER interface automated measurement fast and accurate judgment the battery deterioration of the situation, sorting products suitable for battery assembly line and factory inspection. Low resistance characteristics can be used to characterize the mechanical and electrical components down low current test conditions.
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Product
Tri-Temp Test Handler
JANUS 2800T Tri-Temp Handler
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SESSCO Janus 2800T Tri-temp Handler is designed to accommodate small to medium size standard and custom IC packages. Supports high parallelism of up to octal sites and is equipped with dual high-speed input tube loaders and dual auto output tube unloaders for higher throughput up to 28K UPH. With over 500+ I/O and 16 temperature zones available, it has plenty enough resources for the most demanding applications. It can be customized for MEMS applications and high-voltage testing. Powered by a cutting-edge 10 ns/step all-integrated controller and modular programming design.
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Product
Change Kit
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This custom-designed, swappable tool (change kit), which is part of the handler, is for the customer whose devices come in an array of shapes and sizes. It allows a handler to be used flexibly with a variety of devices, instead of having to be dedicated to one specific device type.
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Product
IC Pick & Place Handlers
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Chroma's IC test and handler solutions assure that IC packaging meets the original design specifications and verify the performance of the IC before it is assembled into the electronic product.
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Product
Tri-Temp Pick-and-Place Handler
MT9510 XP / x16
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MT9510 XP™/ MT9510 x16™ test handler provides full temperature control during test in extreme environmental conditions from -55˚C to +175˚C. A variety of options, upgrades and retrofits are available to configure the product to customer applications such as; automotive battery management systems (BMS) for electric (EV) and hybrid electric vehicles (HEV) and precision power regulators.
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Product
Cantilever Spring Pin ULTRA
CONTACT Series
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ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Product
Tri-Temp Octal Sites Handler
3160-C
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Chroma 3160-C is a productive pick & place system for high volume multi-site IC testing.
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Product
Automatic System Function Tester
3240
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Chroma 3240 is an innovative handler for high-volume multi-site IC testing at the system level.
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Product
LCRZ Tester
DU-6218
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Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Product
Turret Test And Scan Handlers
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Turret platforms for semiconductor test, inspection and packaging.
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Product
Automatic System Function Tester
3260
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Chroma 3620 is an innovative system handler for high-volume multi-site IC testing at the system level.
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Product
High-Speed Laser Mark Handler
MCT MH-3300
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MH-3300™ high-speed laser mark handler is used for marking of 2DID codes on the lead frame in support of strip testing, marking of reject devices, and for final package marking in strip test or assembly operations. The MH-3300 offers unparalleled throughput performance and the best cost-of-ownership in the industry.
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Product
Programmable LCRZ Meter
DU-6212/6215/6216
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Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Product
MEMS Inertial Test
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Cohu´s inertial solutions enable high precise Gyroscope and Accelerometer test with best-in-class cost of test due to high parallelism and package flexibility. All Cohu stimulus modules guarantee high precision and velocity stability as well as high temperature accuracy. With use of our high efficient handler portfolio we can offer the ideal solution with optimized cost of test.
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Product
Turret Contactors
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Design available for all Turret handler models. Leaded and Leadless packages, device pitch down to 0.20mm for Kelvin and Non Kelvin testing on both thermal and ambient environment.
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Product
Line Automation Equipment
5000 Series In-line Handler
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The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.
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Product
Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Product
2D Color Temperature Tester
LCC-900
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Screens the pass/fail results or module type LED image information that is automatically reset via data transfer with handler unit. Data results are stored in server for unified management.
