Data Test Sets
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Product
Test Data Management
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When testing your products, the measurement and test data produced is invaluable in helping your improve your product quality. Most companies do nothing with their test data apart from storing on a hard drive somewhere. Accessing it and using this data is the most valuable way of gaining insights into your manufacturing performance and enabling you to make immediate improvements to help increase product quality whilst reducing the likelihood of unwelcome field failures and expensive product recall events.
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Product
Transformer Testing
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Measuring bridges or electronic burdens can be individually integrated into existing CT/VT test systems. Customized solutions are our core competence.
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Product
Test Services
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A2LA-accredited measurement facilities, combined with our expert staff of engineers, can tackle any unique test and calibration requirements with precision and accuracy. Our equipment is calibrated with NIST traceability providing you with the assurance that we can accurately and consistently characterize your antennas, radomes and other devices.
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Product
Switchgear Test Systems / Circuit Breaker Testing
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ACTAS test systems provide precise information as to the condition of the chamber and drive unit without requiring them to be opened. The sheer number of parameters to be determined, the wide variety of different types of switchgear equipment in use and the harsh environmental conditions encountered during on-site tests place extreme demands on test equipment.
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Product
Multi-Channel Programmable and Universal Input Data Loggers
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These dataloggers have multiple channel inputs which can be universally configured to record temperature, process voltage/current, pulse, strain, etc.
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Product
Testing Services Test
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Aero Nav Laboratories is uniquely positioned to provide testing services that promote safe and reliable products, which are in compliance with the government and industry standards.
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Product
IQ Data Bandwidth Up To 4 GHz
S93051B
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with a single connection to a PNA family network analyzer utilizing the industry-standard PathWave 89600 VSA (VSA) software for 5G transmitter test. The VSA IQ data link feature in S93050B allows you to send IQ data from the PNA to the VSA software and analyze symbol EVM, AM-AM, and AM-PM.
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Product
Test plug
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ENGMATEC produces industrial, highly wear-resistant contact plugs for in-circuit and functional tests. They have been specially developed for a very large number of test processes, as they often occur in a wide variety of industries in the production process.
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Product
Microwave Testing
67A
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A coplanar probe with patented flexible tips, the MODEL 67A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 67A achieves an insertion loss of less than 1.1 db and a return loss of greater than 14 db through 67 GHz.
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Product
Intelligent Charging Cable: Test Strategy and Test Execution
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The ICCB takes over the safety and control functions that are otherwise integrated in the stationary charging station. This places increased demands on the function test in production.
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Product
High-Speed Data &Telecommunication Modules
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SHF Communication Technologies AG
SHF provides a wide range of high speed modules suitable e.g. for SONET OC-768 / SDHSTM-256, 100 GbE, 400 GbE, 1TbE or Fibre Channel telecommunication systems . The needs of our customers are different; therefore SHF is happy to offer customization to specific applications. A small selection of such assemblies based on our standard product offerings can be found in the customized assemblies subsection.
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Product
Jitter Free I/O Access Fast Data Acquisition
TiCoBasic
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Shortest available reaction time for fast data acquisition, open- and closed-loop control! This focus of Jger Messtechnik is greatly intensified by the new TiCo processor, which enables real-time processing in the scale of nanoseconds. The TiCo (Timing Controller) being implemented into a Xilinx FPGA enhances the approved ADwin systems by a close-to-I/O, extremely fast pre-processing.
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Product
Vision Data Acquisition and Management Software
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Vision is the only software package available for ferroelectric testers that provides exceptional freedom to design, conduct, and review all procedures associated with any material experiment.The Vision test environment will collect all of the data acquired in a test sequence and organize it in archived data structures along with the test sequence definitions and data analysis tools, so that the experiment can always be recalled or reproduced.
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Data Converters
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Omega carries an extensive line of data converters, including RS-232 to USB interface converters, fully isolated RS-232 to RS-485 converters, industrial ethernet to serial device servers, and more.
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Product
Test Antennas
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Lumistar provides small, lightweight portable fixed antennas for Test applications. They are available in lower L thru S bands for transmit and receive applications.
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Product
Data Logger w/ MiLAB Software
NOVA 8
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Included with the NOVA 8 is the new, full version MiLAB data analysis application, which is based on Fourier’s award-winning MultiLab software. MiLAB features an intuitive and user-friendly interface that makes it easy for students to collect, interpret and understand data collected. Other features include: data collection from up to 8 sensors simultaneously, sampling rates of 100,000 samples per second, Wi-Fi & Bluetooth connectivity, as well as teacher-friendly projector connectivity.
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SSD Test Systems
Test System
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
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The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
Multifunction Data Collection and Analysis System
2002
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The Model 2002 DME System is a state of the art, multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Product
Railway Testing
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In the railway transportation testing filed, PONOVO has launched the DC testing equipment from low current output level upto 15,000 dc current to meet different testing requirement.
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Product
Electrical Testing
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Accolade Engineering Solutions
Accolade Engineering Solutions offers a variety of Electrical Testing Applications services. Contact us today to discuss your testing needs with someone who can provide you with the expert knowledge to determine the right testing solution for you.
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Product
Automatic Wire Test Set
AWTS
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The Automatic Wire Test Set (AWTS) is automated test equipment that aids wiring diagnostics of electrical and electronic devices. The Test Control Unit (TCU) uses resistance measurements, capacitance measurements, and AC/DC voltage measurements to perform continuity, insulation, and isolation tests. The AWTS Laptop CPU, hereafter referred to as CPU, controls the AWTS. The Eclypse Language Integrated Test Environment (ELITE) is application software that controls the TCU. The majority of the hardware for a test is contained in the TCU. The 128pin connector on the TCU front panel provides 128 energizable test points. Switch Modules (SM) can be connected in sequence or daisy chained to the TCU and provide an additional 1024 test points; 128 of those are energizable.
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Product
Test Set For Instrument Transformer
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This modern Test Set For Instrument Transformer is used for measuring relative errors of Instrument Voltage and Current Transformers. This is developed for reading out the unbalance of any bridge circuit. It also calculates the burden associated to the test sample. In addition to this, it further converts it to ratio and phase error values for presenting them on a LCD screen. With high-tech microprocessor controller, it ensures to provide quick and correct measurements.
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Product
Free Imperas RISC-V Instruction Set Simulator
riscvOVPsim
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*RiscvOVPsim - RISC-V Instruction Set Simulator (ISS) - fast, simple, easy to use, cross software development for embedded systems*The riscvOVPsim ISS is an ideal starting point for an embedded software development project. *RiscvOVPsim allows the development and debug of code for the target RISC-V processor on an x86 host PC with the minimum of setup and effort. It simply requires the cross compilation of your application and running riscvOVPsim with an argument to specify the name of the application object.
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Environmental Testing
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Large Walk-in Environmental Chamber, and Walk-in Salt Fog Chamber, various sizes of vibration and shock equipment, and environmental chambers.
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Test Enclosures
Enclosure
The HV test hood, developed by us in accordance with EN50191 standard (erection and operation of fixed and temporary electrical test installations), is designed for testing large quantities in ongoing production. The ergonomic design ensures fatigue-free operation even during repetitive work sequences. Equipped with all safety-relevant functions, such as safety switch and locking of the hood cover during the test sequence, the operator is optimally protected at all times.The interchangeable adapter plate within the test cell allows quick adaptation for different test conditions and test situations.
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Product
Load Testing vs. Stress Testing
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A load test is a planned test to perform a specified number of requests to a system in order to test the functionality of the system under specific levels of simultaneous requests. A load test ensures that a web system is capable of handling an expected volume of traffic, and therefore is sometimes referred to as volume testing. The goal of a load test is to prove that a system can handle the expected volume with minimal to acceptable performance degradation. The threshold of acceptable performance degradation must be defined by the testers as some value considered acceptable to the end user so that users will not bounce from the site.
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Product
Test Equipment
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Test Equipment, including handheld electrostatic fieldmeter, periodic verification system, charged plate monitor, contact voltmeter, and others.
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Product
eXpert FPGA DSP Features for Data Acquisition
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GaGe provides several eXpert FPGA processing firmware options for use with CompuScope Digitizers. All standard default CompuScope Digitizer model configurations can store raw acquired waveform data to onboard sample memory and then transfer them quickly to the user for analysis, display and/or storage. The addition of optional eXpert FPGA processing firmware features allow for some signal processing analysis, or other specific functionality, to be performed on the digitizer hardware itself within its onboard Field Programmable Gate Array (FPGA).
