Data Test Sets
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Product
Laboratory Air Data Test Sets
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DMA is a leading manufacturer of Air Data Test Set models for laboratory use achieving the highest accuracy and resolution. The MPS46 is digitally controlled through a keyboard, it uses very high accuracy pressure sensors, with a special characterisation for maximum accuracy (for static channel < 2 feet at sea level). Pressure resolution of 0.2 Pa. is also achievable. The intuitive user interface with touchscreen display ensures that all the functions are controlled with a minimum of key presses . The ADTS can be used in avionics ATE systems (rack height only 2U) for automated pitot-static testing through RS232, USB, Ethernet or GPIB/IEEE488. An internal pump or external rack mounted pump unit can be supplied as an option.
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Product
Air Data Test Sets
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For calibrating altimeters, airspeed indicators, rate-of-climbindicators and other avionic instruments.
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Product
Air Data
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Testing altitude and airspeed components in commercial and military air data applications are critical for the safety and performance of an aircraft. Mensor air data test set and indicators provide the high accuracy necessary for these applications. Air Data Test Sets control altitude /altitude rate and airspeed /airspeed rate, for testing altimeters and airspeed indicators or air data computers in a dynamic way that simulates actual flying conditions. Air data Indicators measure Altitude /Altitude Rate and Airspeed /Airspeed Rate for applications where conditions are externally controlled.
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Product
915MHz Data Link Test Set
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Kratos Defense & Security Solutions, Inc.
The 915MHz Data Link Test Set (DTS) is a portable, industry leading test instrument used for verification of Data Link Subsystem Replacement (DLS-r), Army Ground Station Unit (GSU), and other 915MHz Gulf Range Drone Control Systems (GRDCS) communications equipment in compliance with the GRDCS Data Link Format Specification.
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Product
Air Data Test Set System
B511
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The BRAT Option B511 is an option to the BRAT Test System utilizing Commercial-Off-The-Shelf (COTS) equipment. The system is used to augment the existing BRAT capabilities to test rate of change of altitude or pressure.
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Product
Air Data Calibration
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Fluke calibration offers digital pressure monitors, air data calibrators and laboratory standards for air data pressure range calibrations. Each of these systems feature pressure ranges, measurement units and features specific to calibrate air data test sets and RVSM compliant air data instruments. Models include 2468 Ruska and ADCS-601 DHI primary level standards; 7750i Ruska air data controller/calibrator and RPM4-AD DHI reference pressure monitor.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
6x 3U OpenVPX MOSA Data Concentrator Unit
SIU36-DCUVARM-01
Data Concentrator Unit
SIU36-DCUVARM-01 is a Modular Open Systems Approach (MOSA) DO-178C & DO-254 Certifiable Data Concentrator Unit (DCU) with low power high performance OpenVPX Xilinx UltraScale+ SBC with Quad Core ARM Cortex -A53, 8 GB DDR4 SDRAM, 32 GB SATA Flash, 2 x 10/100/1000Base-T Ethernet, USB 3.0, FIPS-140-3 Level 3 Cyber Security, and Single Event Upset support.
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Product
28-CH PPI Module
ND-6058
Data Acquisition Module
- 8255 PPI mode 0 emulation- Channels: 24 DIO and 4 DI
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Product
8-CH Thermocouple Input Module
ND-6018
Data Acquisition Module
- Channels: 6 Differential & 2 Single-ended- Input Type: Thermocouple, mV, V and mA- Thermocouple Type: J, K, T, E, R, S, B, N,C- Voltage Range: ± 15 mV, ± 50 mV, ± 100 mV, ± 500 mV, ± 1 V, ± 2.5 V- Current Range: ± 20 mA- Isolation Voltage: 2500 VRMS
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Product
15-CH Isolated Digital Input Module
ND-6054
Data Acquisition Module
- Channels: 15- Isolation Voltage: 5000 VRMS- Switching Level: with 24 V common power. Low (0): 22 V min.; High (1): 0-22 V- Programmable input polarity
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Product
64-CH 16-Bit 250kS/s Multi-Function DAQ Card
cPCI-9116
Data Acquisition Module
- PICMG 2.0 Rev 2.1- 16-bit A/D and sampling rate up to 250kS/s- 64-CH single-ended or 32-CH differential input- On-board 1k-sample A/D FIFO
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
High Performance Data Acquisition
CPCI-AD8
Data Acquisition Module
The CPCI-AD8/16 module provides a 3U high performance data acquisition subsystem. There are (8) eight or (16) sixteen 100/200 KSPS ADC’s for maximum performance. The Local DSP can be used to simply move data samples to the CPCI bus or can provide processing functions such as limit checking, FFT’s, digital filtering, etc. Software can be downloaded to the DSP via the CPCI interface.Instrumentation amplifiers provide over-voltage protection and gain on a per channel basis. The CPCI-AD8/16 can also accept external scan and trigger signals from a front panel connector.
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Product
e Data Acquisition 32 ch. Module
CPCI-AD320-6U
Data Acquisition Module
The CPCI-AD320 module provides a 6U high performance data acquisition subsystem. There are 32 thirty-two 100/200 KSPS ADC’s for maximum performance. Or an opt low cost 16 channel version. The Local DSP can be usedto simply move data samples to the CPCI bus or can provide processing functions such as limit checking, FFT’s, digital filtering, etc. Software can be downloaded to the DSP via the CPCI interface.
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Product
End of Line Test System for Automotive Seats
AS519
Test Platform
AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Product
Relay Output & Digital Input Module
ND-6060
Data Acquisition Module
- 4-CH relay outputs- Output Type: 2 form C and 2 form A- Contact Rating: AC: 0.5 A / 125 V; DC: 1 A / 30 V, 0.3 A / 110 V- Common External Voltage: 24 V- Input Type: switch or transistor
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Product
64-Channel 500kSa/s USB Modular Multifunction Data Acquisition
U2356A
Data Acquisition Module
The U2356A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2356A to simulate simultaneous analog input acquisition.
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Product
Functional Test
UTS
Functional Test
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
PXIe SSD Storage Unit
DM-4M.2-3U
Data Storage
The Big River™ DM-4M.2-3U PXI Express storage unit provides up to 3.8TB* of M.2 SSD storage capacity. With a PCIe x8 Gen3 host interface, the DM-4M.2 delivers high-speed data rates for sequential writes of 3.25GB/s** and sequential reads of 3.41GB/s** to PXI Express based systems. The single slot design of the DM-4M.2 increases the availability of valuable chassis space, allows for maximum storage flexibility. The DM-4M.2 complies with PCIe Gen3 protocol standards. The product is commonly used in the industrial control, test and measurement fields. The DM-4M.2 operates under Windows, Linux, Unix, Solaris and VxWorks.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
