In-Circuit Test
Testing of short circuits, open circuits, component values and operation of ICs.
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-circuit Testers, In-circuit Test Systems, Combinational Testers, ICT
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Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Test Port Cable, 1 Mm
11500L
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 24-cm cable featuring a return loss of 16 dB minimum.
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
Test Fixture (SMD Components)
16034E
Test Fixture
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
Test Port Cable, 1 Mm
11500J
Test Port Cable
The Keysight 11500J test port connector has a length of 16 cm and a frequency range of DC to 110 GHz. The 11500J integrates with the Keysight N5250A network analyzer and Keysight 8510XF network analyzer systems.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
Functional Test
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Test Fixture Kits
Test Fixture
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Functional Test Fixtures
Test Fixture
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Automatic Test System
Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
Test System
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
OTP-Based Test System
Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Product
Universal In-Line Test Platform
Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
