Secondary Injection Test
Low voltage signal injected to test circuit breaker operation.
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Product
Secondary Injection Test Set
PTE-100-C Pro
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The values which are presented in the LCD display are highly accurate, easy to read, and independent of the injection made by the PTE-100-C base unit.The display shows continuously the phase difference between the voltage and the current injected, and can be adjusted during the test with an accuracy of 0.1º. This facilitates the test for directional relays or reclosers and synchronizing relays, etc.
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Product
Secondary Injection Test Set
PTE-100-C Plus
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In the Pro version this voltage source incorporates a dedicated LCD display and its own BUS-PTE connection that make the operation easier and enable it to be used also with other sets in the PTE range.
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Product
Single Phase Secondary Injection Test Set
T200A
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T200A Single Phase Relay Testing Kit is the best universal secondary injection test set for engineers who need to do all single phase relay test and other basic primary testing which may require single phase long-term high current injection.
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Product
Three-Phase Relay Protection Tester
GDJB-PC
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Chongqing Gold Mechanical & Electrical Equipment Co.,Ltd
1.GDJB-PC Universal Secondary Injection Relay Test Set is applied to test the relay unit in relay protection system. 2.At the same time GDJB-PC Universal Secondary Injection Relay Test Set could be considered as a universal three phase AC/DC voltage source or current source. 3.It can work alone or connected to computer, inside the relay controller there are new speed digital signal mini PC and real DAC (Digital-to-Analog Converter) template with new high fidelity and high power, the machine has large panel screen and rotating mouse. It is small in volume, high precision.
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Product
Secondary Injection Relay Test Set
TD 1000 PLUS
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TD1000+ is a protective relay test set especially designed to give the commissioning engineers a multitasking and highly reliable testing equipment. In comparison with T 1000 PLUS model, TD 1000 PLUS has two current outputs to test the differential relay characteristic curve, besides the pick-up current.
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Product
Secondary Current Injection Test Trolley
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SCR ELEKTRONIKS have developed SECONDARY CURRENT INJECTION TEST TROLLEY for Switchgear items, CT manufacturer and where three phase current application is called for. It is low Voltage, 3 phase Current source with control circuitry, digital read out for test current and trip time measurement. We can select different CT ranges for each phase independently and adjust the current as per the required test Current.
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Product
Secondary Current Injection Test Sets
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Our range of units covers applications up to 200A and includes single phase and three phase units with applications for testing and timing of IDMT relays, thermal overloads, MCB’s and auto-reclosers.
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Product
Three Phase Secondary Current Injection Test Set
TEST-330B
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Beijing GFUVE Electronics Co.,Ltd.
Three phase secondary current injection test set is testing relay set, protective device, instruments, output ac dc current and voltage source, embedded Window XP system.
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Product
Secondary Injection Test Set
PTE-100-C
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The PTE-100-C is a portable Universal test equipment for testing electromechanical, electronic, and digital relays. The equipment can output a variable current up to 250A, a variable AC Voltage up to 250V, a variable DC Voltage up to 350V. Also the unit incorporates a variable stabilized auxiliary DC Voltage supply up to 250V and a fixed AC Voltage output up to 110V, which can be variable with the PTE-FCF option.
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Product
Secondary Injection Relay Test Set
T 1000 PLUS
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T1000 PLUS is a protective relay test set especially designed to give the commissioning engineers a multitasking and highly reliable testing equipment.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Single Site Test Handler
3210
Test Handler
Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
ESS Performance Test System
Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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Product
EMI Test System
TS9975
Test System
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Product
Die Test Handler
3112
Test Handler
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Fixture Kit In-Line 6TL35 455x600mm
AH500
Test Fixture
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 3000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
SSD Test Systems
Test System
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
