High Voltage Test
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Product
NI-9201, ±10 V, 500 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module
783730-01
Voltage Input Module
±10 V, 500 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module - The NI‑9201 is an effective combination of channel count and speed at a low price for an economical multifunction system. The module features up to 100 V of overvoltage protection for errant signal connection or unexpected signals to the individual channels.
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Product
CP400X, 400 MHz, ±60 V, 10X Attenuation, Single-Ended Passive Oscilloscope Probe
784254-01
High Current Probe
The CP400X is a coaxial passive probe with fixed 10X attenuation for oscilloscopes that provide 1 MΩ input impedance. It is 2 meters in length. The CP400X attaches to BNC connections on both the signal input and instrument sides.
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Product
CATR Benchtop Antenna Test System
ATS800B
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
NI-9252, ±10 V, 50 kS/s/ch, 24-Bit, 8-Channel C Series Voltage Input Module
786783-01
Voltage Input Module
±10 V, 50 kS/s/ch, 24-Bit, 8-Channel C Series Voltage Input Module - The NI-9252 is an 8-channel analog input module for CompactDAQ and CompactRIO systems. Each channel provides a ±10 V measurement range and 24 bits of resolution at a 50 kS/s sample rate. The NI-9252 features a number of programmable hardware filters. By choosing the specific Butterworth and comb filters for your application, you can significantly reduce the noise in your system.
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Product
Benchtop Communication Test System
ATS3000A
Test System
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Automotive Ethernet Test Fixture
AE6941A
Test Fixture
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
ARINC-429 Module
M4K429RTx
Test Module
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
Test Port Cable
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
NI-9209, ±10 V, 500 S/s, 16-Channel C Series Voltage Input Module
783729-01
Voltage Input Module
±10 V, 500 S/s, 16-Channel C Series Voltage Input Module - The NI‑9209 performs single-ended or differential analog input. This module provides 60 VDC CAT I isolation and built-in 50/60 Hz filtering, making it a valuable addition to industrial measurement systems.
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Product
NI-9244, 400 Vrms L-N, 800 Vrms L-L, 50 kS/s/ch, 24-Bit, 3-Phase C Series Voltage Input Module
783106-01
Voltage Input Module
400 Vrms L-N, 800 Vrms L-L, 50 kS/s/ch, 24-Bit, 3-Phase C Series Voltage Input Module - The NI‑9244 performs single-ended analog input. The wide measurement range makes it ideal for high-voltage measurement applications such as phasor measurements, power metering, power quality monitoring, industrial machinery, and motor test. You can also perform transient and harmonic analysis with high-speed simultaneous sampling. The NI‑9244 offers three channels, so you can connect single‑ or three‑phase measurement configurations such as WYE and delta. You can incorporate the NI‑9244 into systems to meet standards such as IEC 61010‑1, C37.90 and C37.60, IEC 60255‑22‑(1:7), IEC 60255‑1, C37.188 Class M and P, EMC section of IEC 60870, EMC sections of IEC 61850, IEC 61000‑4‑30 Class S, and IEC 61000‑4‑7.
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Product
Brute High Current Probe
P4301-1W
High Current Probe
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Standard - 1.44 (41.00 - 4.50 (128.00) High Current Probe
HCP-13H
High Current Probe
Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
Test System
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Automated Test Systems
Test System
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Single Site Test Handler
3210
Test Handler
Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
PCB Test System
Circuit Wizard - CW409
Test System
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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Product
Standard 3.06 (86.70) - 4.00 (113.40) RF Probe For SMA Connectors
CSP-30ES-013
High Frequency Probe
Nominal Impedance (Ohms): 50Current Capacity (Amps) @ 20° C: 1.00Bandwidth @ -1dB (GHz): 35.00Return Loss @ -20dB (GHz): 22.00Test Center (mil): 328Test Center (mm): 8.33Recommended Travel (mil): 100Recommended Travel (mm): 2.54Full Travel (mil): 200Full Travel (mm): 5.08Overall Length (mil): 1,033Overall Length (mm): 26.24Rec. Mounting Hole Size (mil): 297Rec. Mounting Hole Size (mm): 7.54
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
PXI Digital Test Instrument
PXIe-6943
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
