High Voltage Test
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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
High Voltage Test & Measurement
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High-voltage (HV) testing utilizes the phenomena in electrical insulations under the influence of the electric field for the definition of test procedures and acceptance criteria.
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Product
HPC High Current Probe
HCP-13
High Current Probe
Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
End of Line Test System for Automotive Seats
AS519
Test Platform
AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Test Handler
M6242
Test Handler
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
Portable, Integrated O-Level Test Platform
Guardian™
Test Platform
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
Radio Frequency, Communications, & Navigation Test Systems
Test System
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
Automatic Test System
Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
In-Circuit Test System
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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Product
Lens Module Test Platform
Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
In-Circuit Test System Rentals
Test System
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
NI-9205, ±10 V, 250 kS/s, 16-Bit, 32-Channel C Series Voltage Input Module
785184-01
Voltage Input Module
±10 V, 250 kS/s, 16-Bit, 32-Channel C Series Voltage Input Module - The NI‑9205 performs single-ended or differential analog inputs, with four programmable input ranges for each. It is an effective combination of channel count and speed at a low price for an economical multifunction system. You can choose from four programmable input ranges. To protect against signal transients, the NI‑9205 includes up to 60 V of overvoltage protection between input channels and common. In addition, the NI‑9205 also includes a channel-to-earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range. It is rated for 1,000 Vrms transient overvoltage protection.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
NI-9206, ±10 V, 250 kS/s, 16-Bit, 32-Channel, 60 VDC Isolation C Series Voltage Input Module
779526-01
Voltage Input Module
±10 V, 250 kS/s, 16-Bit, 32-Channel, 60 VDC Isolation C Series Voltage Input Module - The NI‑9206 performs differential analog input with four programmable input ranges. The module provides up to 600 VDC (400 VDC in Europe) channel‑to‑earth ground isolation, making the module ideal for accurately monitoring large fuel cell and battery stacks. By referencing the module common (COM) to the middle of the NI‑9206 bank, you can measure 16 consecutive cells and remain within 10 V of the module COM.
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Product
Brute High Current Probe
P4301-1Z
High Current Probe
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
NI-9221, ±60 V, 800 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module
783732-01
Voltage Input Module
±60 V, 800 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module - The NI‑9221 performs single-ended analog input. The wider voltage range makes this module well suited for industrial-level, automotive, or even smaller-cell battery measurements. There are two connector options for the NI‑9221: a 36‑position spring‑terminal connector and a 37-position D‑SUB connector.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Standard 0.80 (22.00) - 4.00 (114.00) High Frequency Probe
CSP-03B-006
High Frequency Probe
Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 3.70Return Loss @ -20dB (GHz): 1.80Dielectric VTE Rating (k VAC): 1Nominal Impedance (Ohms): 50Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,090Overall Length (mm): 27.76
