High Voltage Test
-
product
H(3)TRB & HTGB Test Systems
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
-
product
NI-9215, ±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
779011-01
±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9215 performs differential analog input. The module contains NIST-traceable calibration, a channel‑to‑earth ground double isolation barrier for safety and noise immunity, and high common-mode voltage range. It is also offered in two connectivity variants: 10‑position screw terminal or BNC.
-
product
RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
-
product
Off-Line Testing Platform
6TL29
6TL29 Testing platforms are based on the modularity concept; its construction is completely modular and scalable, allowing the user to take advantage of a powerful and reliable platform with a minimum investment.The platform is compact and due to its reduced footprint can be integrated easily into any production line. It’s ideal for High-Mix Low-Mid Volume production environments.
-
product
Functional Test Trainer System
QT65
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
-
product
FD-11603, 8-Channel, ±10 V Voltage Input Device for FieldDAQ
785639-01
The FD-11603 can measure up to eight channels with a voltage input range of ±10 V. It features 24-bit resolution with simultaneous sample rates up to 100 kS/s. The FD-11603 offers channel-to-channel isolation, which eliminates noise from ground loops and protects instrumentation circuitry from high-transient voltages. The FD-11603 has an ingress protection rating up to IP67 (dust- and water-resistant), can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11603 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11603 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11603 is ideal for test cell and outdoor environments.
-
product
Standard 0.79 (23.40) - 1.75 (49.60) High Frequency Probe
CSP-40A-024
Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Recommended Travel (mil): 133Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,231Overall Length (mm): 31.28Full Travel Remark: Shield: 225 (5.72) including travel of probes
-
product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
-
product
6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
-
product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
-
product
Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
-
product
NI-9223, ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
781398-01
±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9223 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9223 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9223: either four, 2‑position screw terminal connectors or four BNC connectors.
-
product
NI-9202, ±10 V, 10 kS/s, 24-Bit, 16-Channel C Series Voltage Input Module
784400-01
±10 V, 10 kS/s, 24-Bit, 16-Channel C Series Voltage Input Module - The NI-9202 has excellent flexibility to meet the needs of your applications. The module has 16 simultaneous sampling, differential input channels to create large, distributed systems in a rugged form factor. It also has configurable filters to eliminate noise in your system while maintaining low-latency to be used in control systems.
-
product
3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
-
product
Scienlab Battery Test System – Module Level
SL1001A Series
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
-
product
NI-9209 , ±10 V, 500 S/s, 16-Channel C Series Voltage Input Module
785042-01
±10 V, 500 S/s, 16-Channel C Series Voltage Input Module - The NI‑9209 performs single-ended or differential analog input. This module provides 60 VDC CAT I isolation and built-in 50/60 Hz filtering, making it a valuable addition to industrial measurement systems.
-
product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
-
product
Test Systems
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
-
product
sbRIO-9220, Non-Enclosed, ±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 16-Channel C Series Voltage Input Module
787814-01
Non-Enclosed, ±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 16-Channel C Series Voltage Input Module - The sbRIO‑9220 helps you perform differential analog input. The sbRIO‑9220 contains NIST‑traceable calibration, a channel‑to‑earth ground double isolation barrier for safety and … noise immunity, and high common-mode voltage range. Non-enclosed modules are designed for OEM applications.
-
product
NI-9225, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module
780159-02
300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.
-
product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
-
product
NI-9215, ±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
783739-01
±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9215 performs differential analog input. The module contains NIST-traceable calibration, a channel‑to‑earth ground double isolation barrier for safety and noise immunity, and high common-mode voltage range. It is also offered in two connectivity variants: 10‑position screw terminal or BNC.
-
product
Automotive Electronics Functional Test System
TS-5020
The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
-
product
6TL08 Benchtop Test Platform
H710008
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
-
product
Electrification Testing Solutions
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
-
product
Standard 3.27 (93.00) - 8.13 (231.00) High Frequency Probe
K-50L-QG
Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 0.80Nominal Impedance (Ohms): 50Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 225Recommended Travel (mm): 5.72Overall Length (mil): 1,830Overall Length (mm): 46.48
-
product
Standard 3.27 (93.00) - 8.13 (231.00) High Frequency Probe
K-50L
Current Rating (Amps): 5Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 1.90Nominal Impedance (Ohms): 50Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 225Recommended Travel (mm): 5.72Overall Length (mil): 1,830Overall Length (mm): 46.48
-
product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
-
product
RF High Frequency Probes
*Low impedance*High bandwidth up to 20 GHz*Repeatable measurements*Coaxial design*Interchangeable center conductor
