Electronics Test
Devices whose quality of operation is based on the effects of electrons.
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Product
Device Testing
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The BTL Working Group (BTL-WG) has developed a test package which contains a set of testing procedures. These can be acquired and used by manufacturers to pre-test their products for BACnet compliance before they send their products to an RBTO (Recognized BACnet Testing Organization) for BTL Testing. The BTL Test Package is available on the test documentation page.
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Product
Custom Reed Relays from Pickering Electronics
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Pickering Electronics manufactures hundreds of model relays. Many of these custom reed relays are minor variations of a standard part, for example, a different test specification or pin configuration. Others are custom designed to meet our customer's particular requirements.
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Testing Consumables
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Solar Light offers a plethora of consumables for SPF and other testing requirements, including high quality Molded and Sandblasted PMMA Plates, Pre-Analyzed and Certified SPF and UVA Sunscreen Standards, Disposable Medical-Grade Pads, and long-life spare Xe Lamps for use with our state of the art Solar Simulators.
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Functional Test
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A type of software testing that verifies a program's functions against its requirements, checking that the software works as expected by comparing the actual output to the expected output.
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Engineering Testing
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At ARC, we know engineering testing, and with our in-house mixed signal test capabilities, we can get you the right test services for what you need. Working with our leveraged partnerships (National Instruments, Keysight and others), we can augment our standard capability with whatever test requirements you have for power, precision analog, high-speed digital, and RF testing up through to 50Ghz.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
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The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Test Solution
Eye-BERT MicroX
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The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Product
DC Electronic Load, Single-Input: 150V, 40A, 250W
EL33133A
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The Keysight EL33133A bench DC electronic load provides a single input and a built-in data logger. Provide static or dynamic load test up to 40 A and 150 V. Display results in a meter view or over time using the built-in data logger.
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Product
Detector Testing
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CI Systems' Optical Test benches are especially built to test many types of detector arrays used as the sensors of a camera, from visible to far infrared ranges. With CI Systems' expert know-how, these test benches can be tailored to a customer's design requirements. MTF, spectral response, crosstalk, NETD and sensitivity are some of the basic parameters that can be tested with CI's Optical Test benches during the design, manufacturing and integration of detector arrays.
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VLSI Test Systems
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50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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PXI Electronic Load Module
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PXI Electronic Load Module provides the electronic load capabilities of sinking DC power with high-accuracy measurements in a compact form factor optimized for design validation, characterization, and production test.
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Product
Test Sets
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A set of examples used only to assess the performance of a specified classifier on unseen data.
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Product
Performance Testing
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If you want to check the strength of your application or the server’s strength you will need to find out how much load, in terms of the number of users the application can handle. We use the Performance Testing techniques, to check the load an application can handle.
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Avionics Test
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VIAVI Solutions offers a wide range of avionics test solutions supporting engineering, factory, flightline, and return to service test requirements. Working closely with avionic OEM’s and users, we strive to develop a comprehensive and user friendly solution utilizing modern technology to meet the long term needs of the aviation industry.
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Load Tests
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For the production and quality assurance of electric motors and electric drive systems, the use of flexible and customer-specific testing technology is required. Vogelsang & Benning supplies the same to the needs and the application of the customer.
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Wafer Test
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Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Test & Development
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Taking a new board level product or system from concept to deliverable requires feature-rich development and testing tools. Elma's wide range of Type 15 (desktop), Type 32 & D-Frame (portable/desktop) and Type 39E (development frame) chassis for VITA and PICMG bus architectures provide the platforms necessary to meet your needs.
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Product
High Power DC Electronic Load
34000C Series（6KW~24KW）
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34000C Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.
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Product
Test Adapter
FECVF1600
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Frothingham Electronics Corporation
The VF1600 Test Station is a high current forward pulser designed to be used in conjunction with our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of much higher forward current. The VF1600 station can produce a maximum current of 1600A at up to 5V using an 8.3 mS half sine waveform at the built in test station, and THETA and DVF tests at up to 500A at 10mS pulse width. It is derated for wider pulses. For rectangular VF pulses at 300us or 1ms, it can produce up to 2000A. The station can also test all of the usual FEC200 tests in the same test program.
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Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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In-circuit Test
i3070
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The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
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Localization Testing
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Localization testing is a method that ensures that an application can be used in a specific area or region. It involves testing the application to verify the accuracy, behavior, and suitability in a specific geographical area.
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Climatic Testing
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The climatics department of E-Labs offers a wide range of chamber sizes from 2 to 3,500 cubic feet. All chambers are equipped with digital controllers that allow for safe and accurate operation at any temperature or humidity level.
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Sensitivity Testing
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Response Dynamics Vibration Engineering, Inc.
Sensitivity testing involves making predictions of system response to environmental disturbance. The significance and importance of the system sensitivity estimates is very often overlooked. This gets companies in trouble and is one of the top reasons why we are called upon to provide timely solutions. Most teams are focused on getting their product to work and get it out the door. An engineering team will often not know how to quantify what to expect in the customer environment and how to test for those expected disturbances. We design hundreds of sensitivity tests and can explain the important concepts to consider in designing the tests and making the right measurements that allow for sound estimates of system response. This is an important expertise we use in our vibration, acoustic and magnetic field consulting services.
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Nondestructive Testing
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BMP Testing and Calibration Services Inc.
Achievement is a construct, or rather a phenomenon, which everyone wishes to be a part of. Everyone seeks success to be the best, well-known, and well settled in life. This is why we want to excel in our lives by choosing a promising career for our future.
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Test a Service
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Enabling the automation of regression testing, verification, and validation within a functional safety environment
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Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Electronic Instruments
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The ORTEC range of modular electronics includes instruments in NIM formats as well as other modular instruments, such as photomultiplier bases, preamplifiers and other accessories. ORTEC also offers modular instruments for pulse height spectroscopy, fast timing, counting, high voltage power supplies and other special functions.
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Product
Modular DC Electronic Load LED Simulator
6310/A
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Chroma Systems Solutions, Inc.
Chroma 6310A Programmable Electronic Load integrates microprocessor capabilities into each load module and mainframe to provide simple and accurate parallel operation to optimize the speed and control among multiple load modules. All load modules may be configured to work synchronously, to test multiple outputs simultaneously, thus simulating real life applications.
