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an acertained value.

See Also: Metrology, Instrumentation, Sensors, Meters, Stability


Showing results: 9076 - 9090 of 10519 items found.

  • DH Series High-Temperature Solder-In Tip, 16 GHz BW, 3.5 Vpp Range

    DH-HITEMP - Teledyne LeCroy

    Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.

  • DH Series High-Sensitivity Solder-In Tip, 30 GHz BW, 2.0 Vpp Range

    DH-SI-HS - Teledyne LeCroy

    Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.

  • DH Series Solder-In Tip, 30 GHz BW, 3.5 Vpp Range

    DH-SI - Teledyne LeCroy

    Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.

  • 25 GHz Differential Probe with 2.92mm Interface

    DH25-2.92MM - Teledyne LeCroy

    Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.

  • 30 GHz Differential Probe with 2.92mm Interface

    DH30-2.92MM - Teledyne LeCroy

    Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.

  • 13 GHz Differential Probe with ProLink Interface

    DH13-PL - Teledyne LeCroy

    Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.

  • 20 GHz Differential Probe with ProLink Interface

    DH20-PL - Teledyne LeCroy

    Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.

  • 16 GHz Differential Probe with ProLink Interface

    DH16-PL - Teledyne LeCroy

    Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.

  • DH Series PT Browser Tip, 16 GHz BW, 3.5 Vpp Range

    DH-PT - Teledyne LeCroy

    Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.

  • *Power/Position/Size Thermal Sensors

    BeamTrack - mks Ophir

    Thermal sensors that measure laser power and single shot energy like standard thermal sensors but in addition measure laser beam position and laser size. This position sensing detector measures laser beam position to 0.1mm accuracy and laser size measurement of a Gaussian beam to +/-5% accuracy. Measuring laser position is important for laser alignment where the laser position sensor can provide feedback to the laser position control.

  • 60 GHz RF SOI Switches

    PE42525 & PE426525 - pSemi Corp.

    These two switches set a new standard for RF SOI at microwave frequencies and significantly extend Peregrine’s high frequency portfolio into frequencies previously dominated by gallium-arsenide (GaAs) technology. Both 60 GHz switches deliver exceptional performance in all key RF parameters and have a fast switching speed of only 8 nanoseconds. The PE42525 is ideal for test-and-measurement equipment, microwave-backhaul solutions and higher frequency switching in 5G systems.

  • Antenna Test System

    ATS1000 - Rohde & Schwarz GmbH & Co. KG

    Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.

  • Air Data Calibrator

    ADC-2575 - TestVonics, Inc.

    TestVonics ADC-2575 Air Data Calibrator is a high accuracy pitot static calibrator. The calibrator is capable of controlling and measuring Altitude and Airspeed pressures with the highest degree of accuracy. The control and measurement range of the test system can meets or exceed requirements for both commercial and military applications. The ADC-2575 is a derivative of the ADC-2550 Series. It features a touchscreen interface, a mid range 23PSIA sensor. It is ideally suited for Automated Test Equipment (ATE) applications.

  • Digital Gauge Pressure

    ZET 7012-I VER.3 - ZETLAB Company

    Digital gauge pressure ZET 7012-I VER.3 (open membrane) is used for fast and simple overpressure measurements and measured values data transfer in digital format via RS-485 or 4-20 mA interface. ZET 7012-I VER3 digital gauge pressure meter is intended for integration into various technological processes automated control systems. Open membrane type enables sensors operation in viscous, pasty and rapidly polymerizing environments.

  • Probe Series

    AVIOR Series - MPI Photonics Automation

    The MPI AVIOR series offers a broad lineup of high performance prober systems targeting the Optical Communications market. Our prober systems are available in Top emitting (TP), Flip chip (FP) emitting and Die/Package (DP) configurations to meet your specific test requirements. Whether it be R&D or mass production, MPI has a solution that will meet your needs for accurate and reliable measurements in conjunction with a reduced cost-of-test.

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