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an acertained value.

See Also: Metrology, Instrumentation, Sensors, Meters, Stability


Showing results: 3721 - 3735 of 10519 items found.

  • Digital Storage Oscilloscopes

    Model D37000A Series - Aplab Limited

    - 200 / 100 / 70MHz Bandwidths- 1GSa/s Real Time Sample Rate- Trigger Mode : Edge, Pulse Width, Video, Slop, Overtime, Alternative Trigger etc.- Provides Software for PC Real-time Analysis- Five Math Functions, +, -, *, /, and FFT functions- 32 Automatic Measurements and Track Measurement via Cursor Automatically- Large (7″) Color Display, WVGA (800 x 480)- Support U Disk and Local Files Storage- Pass / Fail Function Enables to Output Testing Results

  • Bonding Tester

    PTR1102 - Rhesca Co., Ltd.

    In wire bonding in semiconductor manufacturing, electrodes are joined using gold wires of several tens of microns. In order to measure the pull (tensile) strength and ball shear (shear) strength of this gold wire, this machine has load detection accuracy and fine positioning accuracy. In addition, for the measurement of high load areas such as die shear strength and solder joint strength, this machine supports measurement in high load areas while maintaining accuracy in low load areas by replacing the sensor part.

  • Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)

    Rocky Mountain Laboratories, Inc.

    Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.

  • Stylus Profilometry

    Dektak® - Bruker Nano Surfaces

    Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.

  • Vibration Measuring System

    SmartVibro - IMV Corporation

    There are many functions to express characteristics of vibration. However it is necessary for the conventional vibrometers that the same point is measured plural times switching objective functions one by one. SmartVibro which has a simultaneous measurement function can measure Acceleration, Velocity and Displacement simultaneously by just pressing the measurement start key one time. It can reduce the operating time and prevent miss-measurements. By switching the screen, VM-4424S・VM4424H can confirm Acceleration Envelope for bearing condition which enables small scars to be found easily.

  • High Speed Rotation Type Torque Detector

    DD series - Ono Sokki

    The DD series torque detector is the high-end equipment of the SS series to use in high speed measurement and large capacity measurement. It can be recommended to use in the heavy-duty application from DD-505 to DD-108. Double bearings provides three to five times the strength of our conventional torque detector under radial and thrust load, which enables direct coupling to automobile engines and saves the space as it makes a conventional intermediate bearing unnecessary. The oil drip lubricant (option) is necessary for the DD series.

  • High-Dynamic-Range Polarimeters

    Thorlabs, Inc.

    *Three Wavelength Ranges Available**400 nm - 700 nm**600 nm - 1080 nm**900 nm - 1700 nm*Rotating-Wave-Plate-Based Measurement*High Dynamic Range of 70 dB*Excellent Azimuth and Ellipticity Accuracy of ±0.25°*Sampling Rate up to 400 Samples/s*Beam Terminates Inside the Module*Ø3.0 mm Free-Space Beam Input or FC/PC Fiber Input *Fully Featured Software Includes Alignment Tool and Extinction Ratio Measurement Tool

  • Absolute Multiline Technology

    Etalon AG

    The Absolute Multiline technology is a revolutionary solution for the absolute precision measurement of distances up to 30 m with a measurement uncertainty of 0.5 μm per meter, simultaneously up to 124 channels. Unlike conventional interferometers, the measuring beam can be interrupted at any time without loss of accuracy. Within fractions of a second, the absolute distance is determined again. Due to this globally unique system properties, the patented Absolute Multiline technology takes metrology automation in the production area to a new level.

  • Laser Analyzing Telescope

    Duma Optronics LTD

    The LAT (Laser Analyzing Telescope) is a powerful measuring instrument enabling direct measurement of laser beams or other light sources.The LAT will analyze and display the angular direction of incoming laser beams with resolutions down to 1 micro-radian and accuracy of 1 millidegree (~20 micro-radian).The built-in back Filter Slider allows control of the laser level impinging the detector area. Moreover, a special version will allow angle measurement of cross-like collimated targets to be examined.Results are clearly displayed by the provided software.

  • Entry Level Beam Profiling

    BeamMic® - mks Ophir

    BeamMic is simplified set of measurement tools for the entry level beam analysis user. The camera-based beam profiling system consists of a camera and analysis software. Often times, this system will need to be used with beam attenuation or beam sizing accessories, depending on your laser application. BeamMic includes a complete set of high-accuracy measurements, and features a rich graphical interface. For the laser technician, this entry-level software will easily help you quickly become familiar with the many benefits of beam profiling.

  • Atomic Force Microscope

    3DM Serirs - Park Systems Corp.

    Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.

  • 3D Camera

    GOM GmbH

    The ARAMIS 3D Camera is a measuring system for full-field and point-based measurements. With a high resolution of 6 megapixels and a maximum image recording rate of 25 Hz at full resolution, the sensor is suited for medium-fast applications in the field materials and components testing. In a different configuration with a resolution of 2.3 megapixels and a maximum image recording rate of 130 Hz at full resolution expands the range of applications. The ARAMIS 3D Camera is employed in general research and industrial applications for measurements of small specimens up to large objects.

  • Multimeter/Data Acquisition/Switch Systems

    Keithley 2700 - Tektronix, Inc.

    Each Series 2700 system combines precision measurement, switching, and control in a tightly integrated enclosure for either rack-mount or bench-top applications. Although the core functionality and programming of all three systems are identical, each mainframe has unique capabilities. For example, the Model 2701 provides a 10/100BaseTX Ethernet interface, and the Model 2750 offers extended low ohms measurement capability. All models are compatible with the same line of plug-in multiplexer, matrix, or control modules. See all digital multimeters »

  • Solder Joint Inspection – AOI

    S3088 ultra - Viscom AG

    *Extremely fast AOI camera system.*Scalable, modular camera technology with 3D measuring function.*Greatest inspection depth: reliable inspection of 03015 und fine-pitch components.*Maximum fault coverage - 9 views plus 3D measurement.*Best resolution at angled views.*Height measurement of components.*Extremely high throughput due to FastFlow Handling.*Revolutionary simplicity in AOI operation with vVision.*Fast program generation with vVision/EasyPro.*Reading DataMatrix code, bottom up.

  • Laser Distance Meter - Up To 330 ft/100 m

    Extech DT100M - Extech Instruments Corporation

    Extech’s DT100M measures distance up to 330ft (100m). It can calculate area and volume and the integrated Pythagorean Theorem allows the user to take indirect measurements. Other features include continuous measurement with Min/Max distance tracking, 20 point memory, addition/subtraction of sequential readings, front or rear edge reference, and a Stakeout function. Large quad backlit LCD display and double molded housing. It also has a handy built-in bubble level and comes with a wrist strap and batteries.

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