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Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Rapid Test Development
TestEZ® Development Suite
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Count on the Test EZ® Development Suite for complete, efficient, cost-effective test development and execution for electronic test systems.
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Flying Probe Programming & Test Development
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Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.
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Test & Test Development for Circuit Card Assembly
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Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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Compliance Test, Development and Test Service
DinoStor
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With its focus on solving critical backup problems associated with Network-Attached Storage (NAS), DinoStor delivers a broad range of products and services to benefit users and vendors of NAS solutions.
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Software Update For Test Development, GTE 10.00p
K8224A
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Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
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Boundary Scan / JTAG Test Development System
onTAP Development
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The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Test Equipment Development
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PSE AG has been developing test equipment for many years for a wide variety of clients and uses. If you don’t see exactly the specialized test stand that you need for your innovative research, we will design and develop it for you.
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Application Lifecycle Management
ALM
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Manage and track the various stages of an application's life, including requirements gathering, design, development, testing, deployment, maintenance, and retirement.
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EMULATION TESTING
STORAGE
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SANBlaze Technology, Inc. is a pioneer in storage emulation testing technologies and a leading provider of storage, networking and multifunction solutions for embedded systems. SANBlaze emulation systems are deployed in the test and development labs of most major storage hardware and software vendors worldwide.
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Specialized Machines And Custom Test Stands
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PSE AG has been developing test stands for many years for a wide variety of clients and uses. If you don’t see exactly the specialized test stand you need for your innovative research, we will design and develop it for you. The following are some examples of test stand solutions that we have developed in cooperation with research institutes and industry clients:
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USB Controlled Multi-Function DAQ For ATE Education And ATEasy Training
GT98901 Series
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The GT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all of which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol. Power for the board is provided via the USB interface, providing a totally self-contained assembly which can provide users with a simple yet complete vehicle that replicates many of the stimulus and measurement functions associated with ATE systems. When combined with Marvin Test Solutions' ATEasy® Test Executive and Test Development environment, the GT98901 is the ideal product for creating and supporting ATE training and education applications.
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LTE Emulation for End-to-End QOS Validation
IxLoad-Wireless XAir2
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Keysight Network Applications and Security
Ixia’s XAir2 load module provides LTE user equipment (UE) emulation that enables a powerful IxLoad eNodeB Layer 1 to 7 test solution. With complex UE modeling, it offers realistic and easily-configured traffic models and call patterns. Using IxLoad’s real-world subscriber modeling, testers do not need to be protocol experts to develop test realism. From a single tool, users can perform capacity tests, detail a cell throughput, measure voice and video quality, model a wide variety of mobility scenarios.
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3U up to 10 Slots (VPX) / 12 Slots
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Designed to be beautiful, this chassis provides flexibility and ease of use to meet all the requirements by test and development engineers. With its exceedingly high-performing 1800W ATX power supply the chassis is designed for up to 120 amperes at 12 volts.
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IC Tester
ICE1
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The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Exhaust Gas Analysers
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Designed specifically for the busy workshop environment, it incorporates the fastest MoT test procedures, developed in-house here at Boston and using our newly released SW900 product control software.
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Programmable USB Hub with 4 Charge Ports
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The USBHub2x4 is a programmable USB 2.0 compatible hub featuring 4 device downstream ports with standard USB type-A receptacles and each port is capable of delivering up to 2.5A simultaneously. With two host (upstream) connections using usb mini-B connectors, the USBHub2x4 is perfect for environments where multiple devices need to be shared or switched between two host computers. E.g.: software regression testing, iPhone software development and validation, Android software development and validation, USB device regression testing, manufacturing testing, device burn-in testing and USB device charge-curve testing.
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ApTest Services
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Applied Testing and Technology, Inc.
We undertake projects ranging from short term engagements to long term partnering, for customers from startups to the Global 1000. Many ApTest projects encompass a complete outsourced test design and development program, while others involve assisting a client with defining or implementing in-house testing programs.
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System Integration
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Eastern OptX now offers System Integration for all of our equipment along with other instruments including: RF, microwave, and Optical test equipment, power conditioning, distribution, and back-up, system controllers, and data recording devices. We also offer test solution development including mechanical design, rack layout, and custom control software. Eastern-OptX will help you to design and develop your test solution and deliver a completely assembled and tested system.
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Eclipse Test Development Environment
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The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Boundary-Scan DIMM Socket Tester
ScanDIMM
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Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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Functional / Non-functional Software Testing Services
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Expert team with holistic experience and knowledge of software testing, development, and core business processes. We boast a comprehensive suite of software testing services that cover Functional and Non-functional testing,
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Multi Protocol Analyzer
LE-8200
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The LE-8200 is the top-level model of battery-powered communications protocol analyzer. The LE-8200 has an enlarged display in response to an increasing demand without degrading the excellent portability of the LE Series. It is ideal for development tests of communications systems and industrial equipment, as well as for after-sale services and communication trouble analysis.
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Automated Data Testing Solution
QuerySurge
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Real-Time Technology Solutions, Inc.
QuerySurge is RTTS’ smart Data Testing solution for Big Data that finds bad data & provides a holistic view of your data’s health. QuerySurge helps your team coordinate your data testing initiatives while speeding up your development & testing cycles and finding your bad data.
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Intermediate Test Cells
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Atec’s modular intermediate test cells are the most versatile on the market today. Over the last 40 years the A/M37T-20 jet engine test system developed by Atec and Celtech has become the leading test bed solution for over 15 engines and their variants, including:F100, F101, F110, F119, F124, F125, F404, F414, J85, TF33, TF34, TFE731
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Functional Test Systems
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With extensive experience in functional test equipment, a world-wide service and support organization, and a broad range of software/hardware options, we will supply cost-effective production-ready test solutions to meet your test challenges. Proposals developed by our functional test engineering team include a detailed description of system requirements, test instrumentation, estimated test cycle times (as applicable), footprint, and other key specifications.
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In-Circuit Test Programming Services
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Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Testing Tool Development
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We can create a custom software testing tool for your needs.As developers who love testing, we invest in R&D, combining our product testing and software development expertise to deliver customized testing solutions for you, utilizing open source stacks combined with Artificial Intelligence for added power.
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PCB Test And Design-For-Test Services Group
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ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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Open Top BGA Sockets
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Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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PCIe Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
