Communications Test
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Test Fixtures & Test Sets
Keysight test fixtures are used to hold electronic components or materials (physically and electrically) in order to perform various measurements. Keysight offers a variety of test fixtures from Parametric, Dialectrice, Liquid test fixtures and more.Some of our test fixtures allow you to connect directly to your measurement instrument, while others require various adapters.
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Data Communications
Renesas has receivers, line drivers and encoder-decoders for data communications applications, as well as products that cover ARINC and Manchester specifications.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Industrial Communications
Advantech's industrial communication solutions provide reliable data communication in the most demanding C1/D2 environments.
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CAN FD/CXPI Communications Expansion Kit
OP-SB87FD
OP-SB87FD is an expansion board for LE-8200A/LE-8200 used for monitor/simulation of CAN (ISO 11898-1), CAN FD (ISO11898-1:2015), and CXPI (JASO D015). With this kit and the line state sheet, LE-8200A/LE-8200 works as a stand-alone type analzyer for CAN, CAN FD, and CXPI. The board supports development of CAN (used for automotive industry and other industries), CAN FD (next-generation standard of CAN providing more high-speed and communication capacity), and CXPI (invented in Japan to replace direct wirings) devices.
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IEC Testing
International Electrotechnical Commission
F2 Labs can assist you in testing your electrical products to the applicable IEC standards. The IEC is the world’s leading organization for the preparation and publication of International Standards for all electrical, electronic and related technologies.
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Non-Destructive Tests
Non-destructive tests on reinforced concrete and masonry structures are the first method of investigation for verifying the real conditions of a building or structure, existing or under construction. As indicated by the anti-seismic legislation, these tests can be performed by all authorized operators.
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In-circuit Test
Medalist i1000 Systems
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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C012 Communication Board
MS 1728/29
- Suitable for standard desktops- Four channel in single board- Up to 10 Mbits/sec operating speed- Low Cost solution- Standard INMOS link protocol- Communicates with transputers- Converts between serial link and parallel bus- Tristate bidirectional bus interface- Memory mapped registers- Interrupt capability- TTL compatibility
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Vibration Testing
Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Test Handler
M4841
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Qualification Testing
Qualification testing is an important step in evaluating how well spacecraft and launch vehicles perform under severe loading conditions that occur during launch and operation. ATA has conducted acoustic and vibration qualification testing of numerous launch vehicles and spacecraft components.
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Communications Transceiver
AT-710 VHF
The AT-710 is a self-contained, portable, 760 channel VHF air-band communications transceiver.The rugged, portable case includes an aircraft quality radio transceiver, a universal power supply,internal batteries, intelligent battery charging circuitry, audioamplifier and built in speaker.
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ProLink to 2.92mm Adapter with Probe Power and Communication Pass Through
LPA-2.92
ProLink to 2.92mm Adapter with Probe Power and Communication Pass Through
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Battery Test
1260
*Basic Battery Load Test*Battery Analysis*Mac*Test*Bad Cell Indicators*Testing the Starter Motor*Low Temperatures Effects
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Continuous Testing
Continuous testing is the practice of embedding quality through every phase of the software delivery lifecycle - from planning to production. The goal is to ensure that testing continuously reduces risk and improves application quality.
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Wafer Test
Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Test And Measurement
Standardized instruments used to evaluate individuals, populations, or processes.
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LTE RF Communication Subsystem
The Delaire USA LTE RF Communication Subsystem is designed to provide a versatile solution for the testing needs of the next generation wireless systems. With the LTE test subsystem developers can build an end-to-end test environment for complete system operation. From end user equipment and eNodeB base stations to full system functionality, the LTE RF Communication subsystem allows developers to test and evaluate equipment and system performance in a controlled laboratory environment.
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Transformer Testing
Measuring bridges or electronic burdens can be individually integrated into existing CT/VT test systems. Customized solutions are our core competence.
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5G Testing
Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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Test Set
TS® 22
The TS22 Test Set’s unique built-in one-way amplified speaker provides three audio levels for hands-free listening and use with automated voice response systems. Multiple memories enable storage of nine 18 digit telephone numbers in repertory dialer (speed dialing) for easy access to test boards, the central office and other frequently called numbers. The last number redial feature eliminates the need to re-key your last entry. The TS22 Test Set offers an unbeatable combination of reliability, durability and expanded utility.
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Coupling Decoupling Network for Communication Lines
CDN61000-5C
• Application Range: ≤4kV, 1.2/50us pulse, 8 wire unshielded twisted pair (UTP) • Test Voltage: Max 4KV, 2 kV (1.2/50 µs pulse when RJ45 connector is connected. Maximum test voltage is 1.5kV when RJ45 female is unconnected or auxiliary terminal is not protected.) • Coupling mode: 90V gas- discharge tube+250ohm Resistor/Each Wire, 8 Wires Simultaneously-Ground (Common Mode) • Input and output interface: RJ45 connector • Terminal layout (RJ45 connector): First pair of lines: pins 1/2 Second pair of lines: pins3/6 Third pair of lines: pins 4/5 Fourth pair of lines: pins 7/8 • Max. operating speed: 1000MBit/s • Max operating voltage: Max 50V DC • Max operating current: Max 1A Related Instruments
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Test Chambers
The left-hand axis scales the level of the 100 measurements and the right-hand axis displays the uncertainty to a statistical confidence level of 95%; proving the repeatability is better than +/-0.25dB between the measured values. Guaranteeing repeatability, accuracy and correlation across Lab’s, across Production lines and across the World
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Pack Testing
PEC offers a 600V-600A and a 1000V-500A system with either 1 or 2 channels. The systems are programmable using the standard PEC LifeTest application, offering a user-friendly environment for configuring and analyzing drive cycles and other energy storage simulations.
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Telecoms Testing
KTL offers an extensive range of telecoms testing services, wired and wireless, for voluntary and regulatory markets worldwide. Conformance services are complemented by interoperability telecoms testing and by our commitment to provide market access through procurement specification testing.KTL provides telecoms testing to customer specific requirements and, as an independent third party test laboratory.
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PacStar Communications Solutions
Curtiss-Wright Defense Solutions
Combining tactical networking equipment and software, our PacStar tactical communications solutions enable enhanced battlefield situational awareness down to the individual warfighter.
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Massively Parallel Parametric Test System
P9001A
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.





























