Standards
A controlled reference or acknowledged technical criterion.
See Also: IEC, IEEE, Mil, Interoperability Test, Compliance
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Viscosity Standards
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Brookfield Viscosity Silicone and Oil Standards provide a convenient, reliable way to verify the calibration of your Brookfield laboratory viscometer/rheometer.
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Multi-Element Standards
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These multi-element standards consist of multi-layer thin film coatings, one on top of the other, upto a maximum of 6 elemental coatings. It is generally recommended to have coating thicknesses < 20 µg/cm2, so as to cause negligible notable matrix effects, in particular absorption of X-rays emitted in lower deposits by those covering them.
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Calibrated Diffuse Reflectance Standards
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Diffuse reflection calibration standards in synthetic ODM and ODMP material
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Nanoscale Microscopy Standards
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The nanoscale AFM-CD standard (CD, critical dimension) contains structures to calibrate line widths and periods of AFM (atomic force microscopy) devices.
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Standards Source Instrumentation
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PXI Arbitrary Waveform and Programmable Function Generators as well as DC source cards and a precision standards module.
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Reflectance Standards
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Diffuse reflectance calibration standards in white or different grey levels. Traceable calibration for the wavelength range from 250 nm to 2450 nm.
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Open Network Standards
ControlNet
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ControlNet is one of three open network standards (DeviceNet, ControlNet and EtherNet/IP), all of which use a common application layer, the "Common Industrial Protocol" (CIP). The Family of CIP Networks is specified and published by ODVA (Open DeviceNet Vendor Association - http://www.odva.org) and CI (ControlNet International - http://www.controlnet.org).
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Sematech Analysis and SEMI Standards Analysis
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Rocky Mountain Laboratories, Inc.
Rocky Mountain Laboratories, Inc. provides SEMI Standards analyses that conform to the following SEMATECH and SEMI Standards for testing of passivated 316L stainless steel components being considered for installation into a high-purity gas distribution system:SEMASPEC #90120401B-STD (SEM Analysis)SEMASPEC #90120402B-STD (EDS Analysis)SEMASPEC #90120403B-STD (XPS Analysis)SEMASPEC #91060573B-STD (Auger (AES) Analysis)SEMI F60-0306 (based on F60-0301) (XPS Analysis)SEMI F72-1102 (Auger (AES) Analysis)
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Spectral Radiance / Luminance Calibration Standards
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Standard lamps calibrated in luminance and spectral radiance. Traceable calibrations in the wavelength range from 250 nm to 2500 nm.
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NanoCD Standards (NCD)
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The NanoCD™ (NCD) is the first commercially available standard to provide line width accuracy calibration at the 45 nm, 65 nm, 90 nm and 130 nm nodes. Use these standards for tool matching, calibrating the width of a CD-AFM tip, or CD-SEM diagnostics.
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Suitable for Thermocouple Sensors Approved to ATEX and IECEx standards
TTC200X
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Approved to ATEX and IECEx standards allowing for use in hazardous area applications.
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Standards
7X
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WENS series Frequency / Voltage / Wave / Carrier Standards is an ideal and smart solution for distributing signals from Quartz or GPS receivers. Designed to multiple output for multiple applications.
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Software Development Standards Compliance Solution
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The most comprehensive development compliance solution; FDA, DO-178B/C, MISRA, JSF, PCI-DSS, ISO, IEC, and more. ntegrate compliance policies into the SDLC and team workflow. Accurately and consistently automate verification and validation tasks
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Individual UPC Bar Code Standards
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The UPC Verification Calibration standards are a unique set of symbols that assures an exact and reliable primary bar code standard exists for UPC codes based on ANSI X3.182/ISO 15416 methodology. These standards assures that manufactures of verification equipment, scanners, QC labs and end users now have an accurate basis for checking the measurement capabilities of their equipment. These standards are intended as a fundamental calibration tool for an QC program, providing a continuous scale from best to worse case characteristics of each parameter. With complete NIST traceable data supplied, it is ideally suited to those requiring traceability, such as ISO certification. Each symbol is individually calibrated to ANSI X3.182/ISO 15416 standards using a custom built microdensitometer. These cards are supplied calibrated for use with a 6 mil scan aperture and 660nm wavelength. (calibration wit other aperture sizes or wavelengths is available)
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Resistance Standards
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Ohm-Labs manufactures reference grade resistance standards from 10 micro-ohms to 10 teraohms. Each range of standards utilizes the latest advances in materials and processing for high stability and immunity from changes in ambient environment. All products are supplied with ISO17025 accredited calibration.
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Reflectance Standards
STAN Series
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Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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Standards Reference for Test Systems PXI Card
GX1034
PXI Card
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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O.E.M. Optical Standards
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O.E.M. Optical Standards by Applied Image - Boston Scientific Checkerboard Array, Cognex Glass Calibration Plate Set
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Standards Waveform Generator
3110A
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The 3110A software is built around the simple concept of a waveform segment. Each waveform segment can have a unique waveform, (sine, square, triangle, and/or DC offset). Frequency, amplitude and DC offset can be clipped, fixed, variable or swept. Segments can be calibrated (as required in CS101) and set to continue on to the next segment or to hold for an external trigger.
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GPS Frequency Standards
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Precision Test Systems manufacturers' a full range of GPS and GNSS frequency standards that are disciplined to most of the worlds satellite systems.
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Time & Frequency Standards
Meridian II Precision TimeBase
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The Meridian II Precision TimeBase is a modular, network-centric, time & frequency standard that provides the most precise and stable, GPS-synchronized, time & frequency outputs in the world. Unlike our competitors, we fully specify the performance of Meridian II and back it up with published data measured at NIST.
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ITO Sheet Resistance Standards (ITOSRS)
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Indium Tin Oxide Sheet Resistance Standards (ITOSRS) from VLSI Standards are NIST-traceable products, intended for calibration of both contact and non-contact sheet resistance measurement tools used in the LCD, flat panel and touch-screen markets.
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2210A & 2211A Quartz Frequency Standards
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Precise Time and Frequency, Inc.
The ptf 2210A Quartz Frequency Standard has been designed to provide a highly stable and spectrally pure frequency reference for applications requiring the ultimate in short term frequency performance.The instrument contains a double oven controlled stress compensated (SC cut) quartz crystal oscillator (OCXO) to give the ultimate in performance.Ideal for laboratory or system use, the unit provides good stability performance at lower cost and with improved phase noise.
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GPS Time and Frequency Standards
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Our range of GPS disciplined Rubidium Oscillator, OCXO and TCXO, low cost and stable, time and frequency references in a variety of rack mount and desktop sizes to suit all applications. For a technical discussion of GPS go here or select a link below for product information.
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Uniformity Calibration Standards
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Integrating sphere light sources with halogen lamps or LEDs for generating luminous fields with uniform luminance distribution. Traceable calibrations of luminance or spectral radiance in the wavelength range from 250 nm to 2500 nm.
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Absolute Contamination Standards (ACS)
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The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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UL Standards Testing and Certification
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If you are selling your product in the United States, your product must comply with the applicable nationally accepted UL standards. F2 Labs can evaluate and test your product, help you through the UL certification process and enable you to certify your product to the UL requirements through a Nationally Recognized Test Lab (NRTL).
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FlexVNX+ 8-Slot Test And Development Platform Aligned To SOSA And VITA 90 Standards
39S08VPXZZY2VAND
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Elma’s all-new FlexVNX+ Test and Development chassis is the next generation portable test platform designed to accelerate development and test of VNX+ plug-in cards (PICs) aligned to The Open Group® SOSA™ Technical Standard and VITA 90.
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SiTek Standard PSD
1L20_CP3
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The SiTek Standard PSD (Position Sensing Detector) has high resolution, fast response and outstanding linearity. It is used in a wide variety of applications, most of them utilizing light sources in the visible or near-infrared part of the spectrum. The spectral range covers the region 400 - 1100 nm. Thanks to SiTek's proprietary AR-coating, optimized around 860 nm, a reflection loss of only 2% is achieved around the responsivity peak. Most of the detectors have a cover window to avoid handling damages.
