Integrators
Unite all or part of a test system. Integration
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Product
Test system software
CITE
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CITE (Computer Integrated Test Environment) is the software platform for all Digitaltest test systems. It is a real-time system offering a vast number of tools to ensure high test quality and shortening testing time. The software also provides you with several different programming languages that you can choose from.
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Product
Systems Integration & Test
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Watring Technologies, Inc. is an experienced, diversified high technology company proficient in total system integration services including test & evaluation, custom tooling design, and automated hardware validation and verification. We give customers access to a sole- source, multi-disciplinary staff of specialists offering turn-key solutions.
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Product
Modulation Distortion Up To 26.5 GHz
S930702B
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S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Software Development Kit for ARINC 664 Applications
ARINC 664 SDK
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Avionics Interface Technologies
Software Drivers for Windows, Linux, VxWorks, and other Operating Systems (on request) - Compatible with all AIT ARINC 664 Interface Modules - Includes documented APIs with source code examples for C/C++ - Integrates with AIT’s Flight Simulyzer software (share XML bus configurations between API’s and Flight Simulyzer) - Support provided by AITs industry leading applications engineering team
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Product
Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
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The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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Product
CMP Mechanical Kits
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The CMP Mechanical kits are an excellent option for manual tests of both low and high volumes. Now in a more rigid design with removable probe plate for easier maintenance. Integrated fixture down switch as an option. The kit is available in 4 standard sizes but can be adjusted to your demands.
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Product
Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
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32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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Product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
Test Platform
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Product
Standard Digitizer
725S Family
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The 725S family is a digitizer capable of recording waveforms along with performing advanced algorithms for online digital pulse processing (DPP). Utilizing DPP Firmware, users can acquire quantitative physical parameters (Integrated Charge, Pulse Shape Discrimination with very fine time resolution, Pulse Height Analysis) as well as read out waveforms with automatic pulse identification and baseline suppression on channel basis (Zero-Length Encoding and Dynamic Acquisition Window). The wide range of DPP algorithms supported by the 725S make it a “must-have” for any type of nuclear physics application.
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Product
Wire Sorter
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Shanghai Beha Electronics Co., Ltd.
*Standard signal transmitter identifies up to 12 lines*Clear indication of short circuits, open circuits, or interruptions*Integrated continuity tester
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Product
Compact Juno USB Interface
Juno 7Z01250
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*Virtual laser power meter - From sensor to interface to PC - no power source needed*Plug and play with all standard Ophir smart sensors*Use with StarViewer free Android app to turn your smartphone / tablet into a power meter*Record every energy pulse at up to 10 KHz*Log power and energy, average, statistics, histograms and more with included StarLab application*New: Pulsed Power measurements with Thermopile sensors*New: Low Frequency Power on Photodiode sensors - power measurement based on pulse cycle (for VCSEL)*System Integrator Tools included: LabVIEW VIs, COM Object Interface*Very compact - is just an extension of the smart plug
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Product
BG Series Bass Amplifiers
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250 Watt Bass Combos with Built-In TonePrints and Integrated Tuner.
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Product
SoC Integration At RTL
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Before logic synthesis, STAR enables full implementation capabilities towards IP and connectivity insertion with a real-time monitoring of the integration progress. This enables SoC creation in minutes and maximize design reuse from existing projects.
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Product
Integrated TFT-LCD DC-DC Regulators For Automotive
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Renesas' portfolio includes automotive-grade multiple output regulators for use in TFT-LCD automotive applications.
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Product
0.3M Integrating Sphere For Leds Luminous Flux Test
CX-0.3S
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Shenzhen Chuangxin Instruments Co., Ltd.
Thesystem are composed of integrating sphere, spectroradiometer and computer to determine the spectroradiometric and colorimetric parameters, e.g. spectral power distribution, chromaticity coordinates, correlated color temperature, color rendering index, color tolerance, color difference, luminous flux, current, voltage, wattage, etc.
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Product
PacStar Integrated Solutions
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Curtiss-Wright Defense Solutions
PacStar Integrated Solutions are turnkey tactical and expeditionary, based on the PacStar 400-Series, combined with IQ-Core Software, and a vast array of partner technologies — pre-integrated and ready to meet mission requirements.
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Product
BIM Consulting Services
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Being Revit BIM outsourcing company, our consultants facilitate 3D Modeling (Architectural, Structural, and MEP), 4D BIM Construction Scheduling, 5D Cost Estimation, Clash Coordination, Scan/PDF/CAD to BIM Conversion, Shop drawing, Construction Documentation . Tejjy Integrated project delivery with Autodesk Revit software for Architecture, Structure, MEP workflow allows smooth execution through a quality assured BIM Management lifecycle.
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Product
IFE Integrated Power
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EmPower® IFE Integrated Seat Power Systems are based on the advanced technology created for the EmPower® AC In-Seat Power Systems with smaller volume and higher efficiency than can be found in non-integrated systems. The Seat Power Box (SPB) is designed to provide both 110V AC power for passenger PEDs and DC power for the IFE, USB charging ports, and other in-seat equipment. The SPB is capable of operating in several modes including AC/DC, AC only, or DC only, and provides dynamic power allocation between AC and DC outputs.
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Product
Multi-Channel SMU
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Up to 4 potential-free channels, U/I measurement unitsMax. 400 V or 100 A per channelTotal output max. 800 W (10 kW in pulse mode)Integrated switching matrix with self-testStandard: 19", 3/6 U
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Product
Flow Sensor For Compressed Air (FLUEREX With Integrated Display)
PF/PFU
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This is a flow sensor for compressed air for medium and large flow rates, which is useful for grasping the current state of energy consumption and confirming the effect.
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Product
SINE FBI Charts
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There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array is on reflective material measuring 16mm x 16mm with sinusoidal arrays ranging in frequency from 1.0 to 10.0 cycles per mm; with nominal modulation of the sinusoidal areas at 60%. The top and bottom rows are density scales, from 0.20 to 1.20 densities.The SINE M-13-60-FBI Kit consist of two individual components, the SINE M-13-60-1X-RM and the RR1-N-RM Ronchi Ruling grating.
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Product
Quad Channel Tester (QCT)
MS4500
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Quad Channel Tester for Integrated Flight Control Computer (QCT-IFCC - MS4500) is a portable test equipment to check the electrical functionalities of IFCC by simulating various signals and pressure in standalone conditions. System shall simulate, acquire, monitor, and validate the functionalities of different signals.
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Product
General Purpose Integrating Spheres
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General Purpose Integrating Sphere Systems are designed to spatially integrate radiant flux in order to measure optical radiation. The spheres can be coupled with a sensor to create radiometers, photometers, or spectroradiometers in order to measure the total geometric flux emanating from a light source or the flux density of an illuminated area. Additionally, these sphere systems can be used to measure the output of high power lasers and laser diodes or to measure the reflectance and transmittance of materials.
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Product
Powerful, Fully Integrated Workstation for Emission Microscopy
PEM-1000
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The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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Product
Gated Integrator, 2 ns Minimum Gate Width
SR250
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Stanford Research Systems, Inc.
The SR250 Gated Integrator is a versatile, high-speed, NIM module designed to recover fast analog signals from noisy backgrounds
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Product
Integrated Solutions
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On top of this test infrastructure, we have designed a suite of services to help Communication Companies optimizing their revenues:Customers End-to-End Billing VerificationOperators End-to-End Billing VerificationInterconnect Fraud Detection
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Product
INnLline Metrology Automated & Robotized Solutions
Automation projects
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Bring automation to an existing manual inspection process. Integrate 3D measurements on the shop floor for better traceability. Increase part inspection throughput and reduce cycle times and costs.
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Product
Continuous Testing Platform for Web & Mobile Apps
SeeTest
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Use the SeeTest platform to continuously test and release mobile and web applications. Integrate with industry open source tools such as Appium and Selenium and execute against a large inventory of mobile devices and web browsers for quick results.
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Product
Modulation Distortion Up To 90 GHz
S930709B
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S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
DAQStream - Integrated Rack Systems
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DAQStream rack systems deliver unmatched high-density, scalable, processing intensive solutions for the aerospace and defense industry. Supported applications include: scene generation, digital simulation, and hardware in the loop testing.





























