Test Sockets
provide electro mechano connection between DUT and ATE in hand testing applications.
See Also: BGA Test Sockets, Burn-In Sockets
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BGA Sockets
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Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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Semiconductor
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With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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LAN Testers
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A cable detector can locate open power cables, either live or without current, up to 300 V. A cable detector can locate cables, circuits, short circuits and ground wires. To perform these functions, it is not always necessary to disconnect electrically sensitive devices or to disconnect the power to the cable being tested.Many cable detector devices can also locate ferrous and non-ferrous metals, wood and plastic with high degrees of accuracy. A cable detector provides a safe way to test wall sockets for which no electrical plans or wiring information is available about the cables or their output. A cable detector is very versatile, as it ensures speed and safety when making holes in walls, ceilings and floors.
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System Level Test Socket
IC Test Socket
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Proven capability in providing large volume custom-designed System Level Test Sockets for various device types & applications to meet the increasing demand for System Level Testing.
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Package Probe
Test Socket
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Jigs for testing the electrical characteristics of devices in the final testing stage after LSI package assembly.To match the increasingly high functionality of LSIs for communications and networks, such as mobile phones and mobile devices, we provide two types of test sockets: The "J-Contacts" series suited for high-frequency, high-performance devices, and the "BeeContacts" series, spring probes with a unique structure that delivers excellent contact stability.
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Burn-In Test
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C.C.P. Contact Probes Co., LTD.
Customized Burn-In Test Sockets for temperatures of up to 180°C.
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Test Sockets
QFN/QFP
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For today’s chipscale packages, finding the right socket solution can be challenging. With SC™ sockets from Ardent, you can count on the right design, the best performance, and quick turns for even the most challenging custom designs
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High Speed Thermal Printer
6041
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• RS232C serial interface via a 6-pole RJ12 socket• Tested to comply with FCC Standards• Designed for use with Associated Model 6044 and similar devices• Four AA Batteries included• Imported
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6 Position Plug Socket Switch Life Tester
CZKS-6
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It is designed according to terms and conditions of IEC60884-1, IEC60669-1, GB2099.1-2008 and GB16915.1-2003, for life test of plug and socket and switch products of household and similar use appliances. The device can connect with matched load cabinet, in order to conduct a test of electrical life, normal operation and breaking capacity. The equipment provide some clamp, it can test plug and socket production, wall switch, rocker switch, dial plate switch and button switch.
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Test Block & Plug Systems
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Test Block system is an evolution of the 14 test circuit versions widely employed in the power utility sector. The primary difference is the incorporation of ‘finger safe’ test sockets which allow the use of shrouded 4mm banana plugs.
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TEST SOCKET
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IC Package It is a device to install INTERFACE between TESTER and DEVICE during TEST to check electrical defects such as O / S (Open, Short) test, mounting test, BURN-IN TEST and RLC TEST, The device
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Passive Component ATS
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Test and packing speeds from 80ppm to1,800ppmStandard functions - Inductance/quality factor test - Winding resistance test - Polarity testOptional functions - Layer short test - Insulation resistance test - Bias current testCircular vibrating plate design feeds inductors steadily and rapidlyIndex disc design eliminates dropped inductorsFour-wire measurement test socket designAutomatic discharge mechanism when feeding errors occurEach test station has an independent NG (No Good) product collection boxTest without packaging function provided, good products gathered in bulk collection boxExclusive data collection software designed for monitoring product quality in real timeReserved stations for number spraying and automatic optical inspectionSwitchable Chinese/English/Japanese operating interfaceEquipment is fast, stable and safe
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Universal PLCC ZIF (Zero-Insertion-Force) Test Socket
Series 537
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Universal PLCC ZIF Test Socket Live Bug Type. This Universal PLCC ZIF (zero insertion force) Test Socket will take seven sizes of PLCC footprints with Aries insert plate, Part No. XX-537-20. Data Sheet No. 10012, available seperately.
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Turret Kelvin Test Contactor
cHybrid
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cHybrid™ Kelvin contactor contains a new and unique contact spring architecture which allows the test socket to adapt to challenging IC pad geometry requirements of todays and future small package types. Great lifetime up to 3 million touchdowns, with best-in-class contact resistance repeatability reduces cost of test significantly. A multi-beam contact structure optimizes signal integrity and current capability according to challenging electrical test requirements.cHybrid Kelvin contactor with multi-beam contact spring architecture delivers improved yield and long life minimizing cleaning cycles. This innovative solution will help customers reduce cost and maximize productivity.
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Grypper G80 / G80 LIF
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*Package-size PCB footprint: Since the PCB footprint of G80 is identical to the package, only one PCB design is required, enabling a seamless transition from test and validation through production and reducing overall cost of test*Low insertion force: Unique contact design reduces the insertion force required to insert and retain higher-ball-count packages safely and securely within the test socket*No lid required: The package snaps directly without a lid, enabling easy probing, scoping and troubleshooting the topside of the device*Excellent signal performance: A short signal path achieves low inductance and low insertion loss, providing a nearly invisible electrical connection
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Test Sockets
MEMS Device
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Patented MEMS Sockets from Ardent Concepts use a unique scrubbing action contact set which is ideal for today’s sensitive MEMS devices, including accelerometers, gyroscopes, MEMS microphones and other specialized devices used in mobile electronics applications
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Universal SOIC-to-0.600 [15.24] DIP Adaptor
Series 647
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Universal SOIC to .600 [15.24] DIP Adapter. 44 pin adapter for mounting Aries Series 547 Universal SOIC ZIF (zero insertion force) Test Socket to .600 [15.24] DIP PCB layout. Consult Data Sheet No. 10015 for test socket information.
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DDR4 Pro Memory Test Adapter
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This memory test adapter for the RAMCHECK LX includes an extraordinarily rugged test socket for many thousands of insertion/removal cycles.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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LAN Network Testers
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A cable detector can locate open power cables, either live or without current, up to 300 V. A cable detector can locate cables, circuits, short circuits and ground wires. To perform these functions, it is not always necessary to disconnect electrically sensitive devices or to disconnect the power to the cable being tested.Many cable detector devices can also locate ferrous and non-ferrous metals, wood and plastic with high degrees of accuracy. A cable detector provides a safe way to test wall sockets for which no electrical plans or wiring information is available about the cables or their output. A cable detector is very versatile, as it ensures speed and safety when making holes in walls, ceilings and floors.
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EV Charging Station Tester
EV : ChargeCheck
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The EV Industry’s Charging Station Tester of Choice. • Simulates an electric vehicle • Tests J1772 (type 1) tethered leads • Tests IEC62196 (type 2) sockets • Tests IEC61851-1 mode 3 communication compliance • Tests for correct polarity • Tests for earthing presence • Tests contactor actions.
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Test Probes
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Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Near Zero Footprint SMT Spring Pin Sockets
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Ironwood Electronics socket is a device size or near device size footprint test socket incorporating industry standard high performance spring pins. Ironwood can design a socket to work with any type IC packages- BGA, LGA, QFN, DFN and even leaded devices where you need to fit a socket in place of your device to allow fast, easy testing and development.
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Test Sockets
BGA/LGA
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There are a lot of options when it comes to bench test sockets. Save yourself and your lab time, money and frustration by working with Ardent for truly customized test socket solutions to meet your needs and do the job with high performance, reliability and quick turnaround that you need and deserve.
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Manual Test Press Fixture
750/752 Series
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RTI's manual test presses are compact, portable, all-inclusive, and easy to use. Single lever operation and 100% vertical compression makes the manual test press an ideal solution for PCB, hybrid module, and high pin count device-level testing when complex test requirements cannot be met with a test socket and breakout board alone.
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Transformer Rated Pre-Wired Meter Enclosures
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TESCO Transformer-Rated Pre-Wired Meter Enclosures are built with the TESCO tradition of quality and durability. TESCO enclosures are designed for use in commercial and industrial metering installations where voltage ratings of 480 and above are required. The enclosures are available with ringless, single piece or two piece covers and can be pre-wired between the test switch and socket to meet your exact specifications.
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Test Socket Lids
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For handler setup or hand test, a manual lid is often required as part of the test hardware set. We have refined our standard offerings so that with each socket you can receive a lid designed specifically for your application from one of five standard lid form factors
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USB, AC 110 VOLT AND 12 VOLT SOCKET TESTER PACK
MDPPTST
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*USB, 12V and AC 110V socket testers provide the user with a simple way to test electrical sockets on a vehicle*Socket testers illuminate when when the respected voltage is detected, indicating the health of the socket*USB socket tester illuminates when 4.4V - 5.25V is detected
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Custom Test Connectors and Sockets
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Custom test sockets are traditionally expensive to build and maintain. To reduce these costs, consider: Using rapid prototyping techniques to build a housing. Using replaceable Z-Axis Connectors. Depending on board layouts and compressed height, these sockets or test fixtures can achieve high numbers of mate/de-mate cycles and operate at GHz frequencies.
