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Product
SWB-2834, 8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-34
Relay Matrix Module
8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2834 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
Explosive Test Site Range Instrumentation
test
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Product
High Current capacity testing from Intelligent Charging
CT75A
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A UK-based helicopter manufacturer wanted high capacity testing capability for their helicopter batteries and came to Intelligent Charging for a Special Unit. As a result of the above requirement, Intelligent Charging designed and built this new capacity testing unit to add to our extensive range of intelligent battery charging and capacity testing products. With up to 100.0A capacity testing capability this model will satisfy the most demanding aviation battery.
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Product
Test Extension Boards
XJIO
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The XJIO boards are expansion units that enable you to improve the test coverage for a Unit Under Test (UUT) by verifying the signals right through to the external connections. They will integrate with your XJTAG test system to provide access to otherwise inaccessible areas of your circuit. With a range of digital and analogue I/O pins on the board, you can improve fault isolation, verify power rail levels, and dispense with costly custom test jigs - even for non-JTAG boards.
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Testing Service
CloudTesting™ Service
test
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
PXIe-4144, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit
782432-01
Source Measure Unit
PXIe, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit - The PXIe-4144 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4144 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
High-Speed Precision SMU (100 FA, 60 V, 1 MSa/s)
PZ2120A
Source Measure Unit
The Keysight PZ2120A is a cost-effective, high-speed precision source / measure unit (SMU) featuring best-in-class narrow pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices and integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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Product
PXIe Optical Test Modules
Test Module
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Product
PXI/PXIe Fault Insertion Switch, 64-Chan 2A, N/C Through Relays, Fault Buses on M & U
42-190C-112
Fault Insertion Unit
The 40-190C-112 (PXI) and 42-190C-112 (PXIe) are fault insertion switches with 64 channels. They are part of a range of modules available with 74, 64 or 32 channels and are primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Modular Functional Testing Platform
OTP2
Test Platform
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Product
PXIe-4147, 4-Channel, ±8 V, 3 A Precision PXIe Source Measure Unit
786888-01
Source Measure Unit
PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
PXIe-4143, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit
782431-01
Source Measure Unit
PXIe, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit - The PXIe-4143 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4143 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4143 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
3U OpenVPX Sensor Interface Unit
SIU34
Sensor Interface Unit
The SIU34 is a highly configurable rugged system or subsystem ideally suited to support a multitude of Mil-Aero applications that require high-density I/O, communications, Ethernet switching and processing. The SIU34 leverages NAI’s 3U OpenVPX™ boards to deliver off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
PCIe 4.0 Test Platform
PXP-400A
Test Platform
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
