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Product
LED Flash Drivers
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Analog Devices LED flash drivers support general LED lighting, building technology, scanning equipment, and a range of other technologies. A range of features, such as automatic phototransistor controls and overtemperature protection, as well as compact size and diverse programmability options, allow these devices to be used in a number of applications including:
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Product
Dual Channel Analog Oscilloscope
MOS-620
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MOS-6XXC Series dual trace oscilloscope, the maximum sensitivity is 5mV/div, the maximum scanning speed is 0.2us/div, and can be expanded 10 times to make the scanning speed reach 20ns/div. The oscilloscope adopts a rectangular CRT with a scale of 6 inches, which is easy to operate, stable and reliable.
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Product
Flexible AFM
SA-AFM
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The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.
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Product
Over-Line Vision Inspection System
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Over-Line vision inspection systems utilize a compact sensor head mounted directly over an existing production line to scan every object that passes underneath, in any orientation and at any belt speed, in order to generate a continuous stream of critical QA data, such as size, shape and color attributes, and production metrics such as throughput, uptime and capacity.
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Product
RF Device Tester
RF ITS
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Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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Product
NanoLattice Pitch Standard for Mask Handling Tools (NLSM)
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The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Product
Production PCB Combinational Tester
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The PT100Pro combines ARM Functional Test, Analog Test and Boundary Scan in one platform for testing up to 32 PCBs at a time. The PT100 Pro solves the test challenges and cost requirements of testing small, high-volume PCBs used in the home, mobile, entertainment, automotive and embedded markets. PCBs in these markets are cost sensitive yet require high volume, high fault coverage on leading edge technologies such as WiFi, DDR Memory, USB, Bluetooth, Nand Flash, MPEG decoders, Power Management Units, and MMC/Smart Cards interfaces.
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Product
Smart Analog to Digital
618/619
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Supports thermocouples, RTD's, strain gauges, voltage in, 4-20mA, thermistors, and resistorsUp to 16 differential input channels plus sensor excitationEach channel is software programmable for sensor type, gain, low-pass filtering, scan rateAuto-calibration eliminates trimpotsLow power consumption
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Product
testing facilities
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Mechanical scanning of the component is required for the automatic imaging ultrasonic testing technology. Depending on the test requirements, the size and shape of the component and the required cycle times, we offer different solutions.
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Product
Real-Time Open Check Hi-Pot Tester
DU3328
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Delta United Instrument Co., Ltd.
Programmable test voltage in AC: 0.1K~5KV, DC: 0.1K~6KV Programmable cutting current in AC:0.001mA~15mA, DC: 0.001mA~7.5mA 3 in 1 functions, with AC, DC Hi-Pot test, Insulation test. Built in 100 sets memory Arcing detect function 8 ports scanning function Independent 8 channels real-time open check Real-time check function, to ensure your products tested, no more loss test.
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Product
Handheld Scanner
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Solutions are specifically designed for automatic data capture applications and process automation throughout the customers’ entire value chain in the retail, manufacturing, transportation & logistics and healthcare industries. Handheld scanners offer outstanding performance and reliability through the different scanning options: linear or area-imaging technologies. The standard, rugged, or antimicrobial enclosure allow their use in any environment, and their ergonomic design make these scanners easy to use also for long period.
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Product
kSA MOS Ultra/ThermalScan
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The kSA MOS UltraScan and kSA MOS ThermalScan systems are ex situ, flexible, high-resolution scanning curvature, bow, and tilt-measurement systems.
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Product
Color Sensor
Nix Mini 2
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*Clearance pricing while quantities last*Instantly match any color with a simple scan*Connects with the free Nix Toolkit app*90%+ hit rate on top brand name paints*Compatible with Pantone, RAL and NCS*Instant real-world RGB, HEX, CMYK and more
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Product
NanoLattice Pitch Standard (NLSM)
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The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Product
Scanning XPS Microprobe
PHI VersaProbe III
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The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Fix, Speed Up and Maintain Your PC
Fix-It Utilities 15 Professional
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System DashboardGet an instant overview of important system information, disk and memory space, battery life and processes running on your PC in one easy place.Look at system information on: operating system, default web browser, IP address, power settings and battery life.Know how much disk and memory space you are using, how much is free and your disk fragmentation level.See what processes and programs are running at startup and during active use.Data RecoveryEasily recover deleted files and data from your hard drives, USB drives, flash drives and memory cards.Disk Space SaverRan out of space on your drive? Are your files scattered everywhere? No Problem! Disk Space Saver scans and identifies where your large, duplicate, junk and Internet files are located.Get a visual display of your disk space usage that lists your biggest and duplicate files.Clear browser and download history, surfing activity cache and Internet cookies.Identify and remove unnecessary system clutter and junk files.Windows 8 CompatibilitySystem Suite is now fully compatibility with Microsoft Windows 8. Run System Suite with the peace of mind that you are fully protected and optimized.
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Product
Optical Channel Monitor
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Optoplex Optical channel monitor (OCM) uses proprietary thin-film interference filter technology combined with a micro-actuator and high-speed electronics. Optical channel monitor is used to measure critical information data on optical transmission signals in DWDM networks for monitoring signal dynamics, determining system functionality, identifying performance change, and providing feedback for controling network elements so as to optimize operational performance. In particular, Optoplex Optical channel monitor can automatically scan the C-, L- or C+L-band wavelength range and precisely measure channel wavelength, power, and optical signal-to-noise ratio (OSNR). See the following schematic diagram for OCM working principle.
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Product
JTAG Boundary-Scan Toolkit Software & Hardware Bundle
JTAG Starter Kit
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The Corelis JTAG Starter Kit includes the ScanExpress Debugger software application with a USB 2.0 JTAG controller. Engineers and technicians alike can use the system for a variety of tasks. The JTAG Starter Kit has an arsenal of features to control and observe system signals of a boundary scan compatible UUT.
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Product
Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Product
Test systems
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MG Products can supply a variety of test systems. These include the Extended Boundary Scan Test from JTAG Technologies, the functional test equipment integrated into a table or high configuration from Unites systems or the Cabinet Modular Test solution (CMT). We offer the right solution for every test setup.
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Product
Signal Converters For High-accuracy Angular Measurement
EIB 1500 series
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*Interpolation and digitizing electronics for the real-time digital processing of positions from two scanning heads*Input: incremental rotatory HEIDENHAIN encoder with two scanning heads and distance-coded reference marks (relative orientation of scanning heads: 180° ± 5°)*Output: EnDat 2.2, Fanuc Serial Interface, Mitsubishi high speed serial interface*Integrated subdivision: 16 384-fold
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Product
Impedance Spectroscopy
NuVant EZware-EIS Software Package
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The NuVant EZware-EIS software package activates Electrochemical Impedance Spectroscopy on the EZstat-Pro, Powerstat-05 and -20 potentiostat/galvanostats. EZware-EIS exports the impedance data to a file format to accommodate free third party EIS analysis software. EZware-EIS is a user-friendly interface that allows selection of the proper scanning parameters, collect the impedance spectra, display data in Nyquist and/or Bode plots and export data in the proper data format for use in EIS analysis software.
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Product
Stroke-to-Raster Scan Conversion
VSC/900
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The Model VSC/900 provides scan conversion and mixing for any video input signals. The unit's capabilities include conversion of any input to any output format up to 2K x 2K. In addition to operating with VESA, HD and SD signals, the unit provides conversion and mixing of stroke (vector) video signals.
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Product
Industrial Machine Vision and Fixed Scanners
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Zebra Technologies Corporation
Today’s shoppers can purchase at any time from any place, creating tremendous fulfillment pressures that ripple throughout the supply chain. Zebra’s Fixed Industrial Scanning and Machine Vision solutions address it all with flawless automation that empowers you to easily set up, deploy and run the processes that drive your business. Maximize your performance, exceed your potential and delight your customers - with Zebra.
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Product
Spectro UV-Vis Auto Scanning Spectrophotometer
UV-2602
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The new 2 way communication system allows the user, to give instructions right from your computer and gives you the ability to print and record results in an easy to use interface.A 2nm bandwidth gives you the accuracy needed in today's laboratories and its auto adjustment feature makes it easy to work with, providing more answers to scientific problems in less time.
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Product
In-Circuit Test Fixture Design Services
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XJTAG offers consultancy services to design and build production test fixtures that integrate JTAG boundary scan with bed-of-nails testing.
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Product
Low-noise High-voltage Amplifier For Tube-scanners -
HV200/5
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The HV200/5 is a high-precision HV-amplifier designed for the control of tube scanners. It takes three input voltages In X, In Y and In Z (-10 V to + 10 V), amplifies them separately (input gain switches: x1, x2, x5, x10, x20) and adds an offset voltage between -10 V and +10 V. In a 2nd stage, the signal is amplified by a factor of 20. This enables its use as HV amplifier in scanning image acquisition applications, such as STM or AFM, with the capability to shift the scan range in high resolution imaging.
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Product
Spectrometers, Vacuum
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A compact and versatile vacuum ultraviolet monochromator. A selection of aberration-corrected diffraction gratings is available so you can tailor the instrument to your wavelength of interest and application. Connect this instrument directly to your vacuum plasma physics experiment or build an intense UV tunable source. It is available as a scanning monochromator, as a spectrometer, or as a spectrograph with microchannel plate or direct-detection CCD. The Model 234/302 is popular in systems due to its compact design, high throughput and resolution. It is also available with an additional entrance or exit port.
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Product
TX Ranger
4405200
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The TX Ranger is a hand-held Time Domain Reflectometer (cable fault locator) with a first range of 2.5 meters combined with a 1.3 Nano second pulse width gives a blind zone of only 5 cm, it makes this the ideal product for fault location on short cable assemblies and harnesses. Small and intermittent faults can be easily identified by using the selectable gain control allowing trace amplification of up to 7 times and when set to scan lock mode the advanced noise reduction software may be selected allowing the user to select between 8,16 and 32-point trace averaging further enhancing the clarity of the trace by reducing electrical and environmental interference.
