Product

Test System for Detecting Exact PCB Short Circuit Locations

QT25

Test System

Qmax Test Technologies Pvt. Ltd.

QT25 - Qmax Test Technologies Pvt. Ltd.

QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.

Product

Noise Figure Analysis Using NI PXI RF Test Instruments

NI-RFmx Noise Figure

Test Instrument

NI

NI-RFmx Noise Figure - NI

Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series

Product

PCI Express 3.0 Test Platform with SMBus Support

Test Platform

Teledyne LeCroy

Teledyne LeCroy

The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.

Product

EV-DO Analysis Using NI PXI RF Test Instruments

NI-RFmx EV-DO

Test Instrument

NI

NI-RFmx EV-DO - NI

Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism

Product

Digital Test Instruments

Test Instrument

Astronics Corporation

Astronics Corporation

Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.

Product

LTE RRM Test System

T4010S

Test System

Keysight Technologies

T4010S - Keysight Technologies

The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.

Product

Radar Test System

UTP 5065

Test System

NOFFZ Computer Technik GmbH

UTP 5065 - NOFFZ Computer Technik GmbH

Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.

Product

NI Vehicle Radar Test System

Test System

NI

NI

VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.

Product

Electrification Testing Solutions

Test System

Ball Systems, Inc.

Ball Systems, Inc.

When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.

Product

SoC Test Systems

Test System

Chroma ATE Inc.

Chroma ATE Inc.

Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.

Product

Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm

85131E

test

Keysight Technologies

85131E - Keysight Technologies

Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port

Product

In-Line RF Test Station

AP770

RF Test System

6TL Engineering

AP770 - 6TL Engineering

ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units

Product

Other Test Systems

Test System

Ball Systems, Inc.

Ball Systems, Inc.

Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.

Product

Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications

ETS-88RF

Test System

Teradyne, Inc.

ETS-88RF - Teradyne, Inc.

Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.

Product

128 DIOs JTAG Boundary Scan Resources Unit

YAV9JTAG

Test Fixture

6TL Engineering

YAV9JTAG - 6TL Engineering

Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.

Product

BMS Manufacturing Test System

Test System

Bloomy Controls, Inc.

Bloomy Controls, Inc.

The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.

Product

Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points

LEON Fixture

Test System

Konrad Technologies GmbH

LEON Fixture - Konrad Technologies GmbH

The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.