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Semiconductor Automatic Test
Qmax Test Technologies Pvt. Ltd.
Semiconductor Automatic Test by QMax
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Walk in chamber for Complex Salt Spray Test (Temperature controllable)
Guangdong Bell Experiment Equipment Co.,Ltd
Walk in chamber for Complex Salt Spray Test Relevant standards requirement1. Test Object: battery pack andsystem.2. Refer GB/T4 part 5.5.2 test method, test according to GT/T2423.17 test conditions.3. The salt solution was made up with sodium chloride (chemically pure and analytically pure) and distilled or deionized water，Its concentration is (5 + 1)% (mass fraction).4. (35 ± 2) ℃, the measured pH value is between 6.5-7.2.5. Placed the test objects in the salt spray chamber for cycling test. Each cycling duration for 24h. Spray salt solution to the test object for 8 hours under the temperature of (35± 2) ℃ , remain for 16 hours. Between the forth and the fifth hour in one cycles should be according to test requirement in GB/T 28046.1-2011, test mode with 3.2.6. Total 6 cycles testing.7. Salt spray test is not necessary for the test objects being installed in passenger, luggage or cargo compartments.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Test & Measurement Products
We offer a broad range of test and measurement devices for your scientific, educational, industrial, and process applications. We carry the test and measurements tools you need to analyze, validate, and verify measurements in your electronic and mechanical systems, ensuring compliance to quality assurance and quality control programs. Our selection features portable and bench oscilloscopes, multimeters (DMMs), clamp meters, megohmmeters, stroboscopes and tachometers, power transformers, along with precision meters for humidity, moisture, light, airflow, weather, and vibration.
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6TL19 Off-Line Base Test Platform
H71001900
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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18 Pc. Micro 64 Test Connector Kit
147
Test connector kit featuring a variety of terminal adapter sets which enable connection to Micro64 terminals - primarily found on GM vehicles and some EU/Asian/Domestic vehicles. Adapters connect via the included 48 inch stacking banana plug test leads. Connection to most DMM’s and scopes is no problem. Kit is designed to provide a quality & secure test connection while quickening the test process.
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Test Equipment
ST6300
Shenzhen Star Instrument Co., Ltd.
The ST6300 portable three-phase meter test equipment is suitable to conduct commissioning and testing for energy meter manufacturers and meter test departments. It adopts modular design and incorporates DSP and PWM switching amplifier technologies. Users are able to control the equipment via keypad or PC-based software. It simultaneously measures the errors of three energy meters. It connects to a meter rack via its COM port.
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Combined Temperature and Altitude Environmental Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Altitude & Temperature Test Chamber combine Altitude and temperature to test various components and products, especially the aircraft avionics. Automatic controlled vacuum system provide a precise altitude simulated condition up to 30000 meters. Available to connect cable for the electronic performance test.
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Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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CRPA Test System
The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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Durable, Ultra Small & Flexible Test Assembly
StormFlex® 034
Storm Flex® line of flexible cables, the 034 diameter cable offers the same superior mechanical benefits in a new miniature size.Its ruggedness and durability combined with its ultra-small size, very low weight, and extreme flexibility make Storm Flex® 034 cable assemblies the perfect fit for applications such as:- Test & Measurement ~ where flexibility and robustness minimize mating errors.- Systems ~ with complex installation or deployment that can compromise mechanical & RF stability.- Gimbal ~ with requirements for cables operating to 50 GHz.- Digital Test ~ needing minimized stress at the connector to connector interface.- High Density ~ utilizing multi-cable interconnects with centerline spacing as low as 0.07 inches.Storm Flex® 034 cable is also recommended as a semi-rigid replacement in applications where a sem-rigid cable is impractical to deploy and routing may result in assembly breakage or electrical failure.
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Low Noise Test Leads For N1413 With B2980 Series, 1.5m
N1425A
The N1425A is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425A is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425A enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425A to the B2985B/87B.
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Massively Parallel Board Test System
I7090
The Keysight i7090 is a massively parallel board test system designed to help PCBA test engineers improve manufacturing efficiency while reducing costs. Unlike traditional in-circuit testers, the i7090 supports up to 20 In-Circuit Test cores in parallel, which means engineers can test multiple Units Under Test (UUTs) simultaneously without the need for multiple systems. This reduces scaling and infrastructure costs and frees up valuable testing space.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Visible / Infrared / Imaging Test System
System 1808
Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Walk in Chamber for Sand Dust-proof Test
Guangdong Bell Experiment Equipment Co.,Ltd
DGBELL Walk in dust-proof test chamber provide a simulated sand blowing and dusting environment. It can continuous operation for a long time without failure.
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Semiconductor Electrical Test
We conduct electric property test (final test) of the completed (packaged) LSI products. We will support testing of analog devices, logic devices, other electronic parts, modules, application products and so on. We will test according to customer's specification regardless of evaluation, trial production, mass production, by know-how cultivated with long-time mass production results. Test initial examination ~ From consistent correspondence up to selection and evaluation, individual correspondence such as design only is accepted.
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Test Clips
Angled Nose allows tight hold on 66 blockUse on 110 block with jumper and bed of nailsUse on larger cables with single piercing nail
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Parallel Test Systems
Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Standard Climatic Test Chamber(Environmental Chamber)
Guangdong Test EQ Equipment co., Ltd.
Primarily used for accelerated damp heat testing, alternating damp heat testing, constant humidity testing, as well as high/low temperature routine testing, cold resistance testing, low-temperature storage, and adaptability testing under rapid or gradual temperature changes in industries such as aviation, aerospace, electronics, instrumentation, electrical products, materials, components, equipment, and complete machines. It is particularly suitable for Environmental Stress Screening (ESS) testing of electrical and electronic products or for enhancing production efficiency. It enables analysis and evaluation of performance and behavior under simulated environmental conditions.
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Relay Test Set Type SP-I
Supreme Instrument Laboratories
Supreme make relay testing set is designed for site testing of protective relays which simulate in common fault conditions under which a protective relay will be called into positive function. Periodic field testing is the best way of ensuring the integrity of the protective relays. We offer our relay testing set with specific testing capacity to suit different group of protective relays. The testing set operates on single phase 230 V, A.C. 50Hz. Supply.
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Test Probes / Test Fixtures
INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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Flying Probe Test System
A8a
The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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Test & Measurement Services
We specialize in the development of advanced automatic test applications based on NI TestStand.- Development of NI Test Stand test programs, with code modules in LabVIEW, LabWindows/CVI, Measurement Studio/.NET, C/C++, and ActiveX/COM- Integration of test and measurement instrumentation, switching, and UUT bus interfaces- Customization of step types, process models, operator interfaces, reports, and databases- Integration in the enterprise software infrastructure (XML data formats, databases, web applications, etc.)- Integration of the NI TestStand ATML Toolkit
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Off-Line Testing Platform
6TL29
6TL29 Testing platforms are based on the modularity concept; its construction is completely modular and scalable, allowing the user to take advantage of a powerful and reliable platform with a minimum investment.The platform is compact and due to its reduced footprint can be integrated easily into any production line. It’s ideal for High-Mix Low-Mid Volume production environments.
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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MEMS Test System Development
olidus Technologies’ can design and build a test system customized for your exact needs, using our own or off the shelf components:Custom MEMS Test Systems. We can integrate and assemble test equipment and handling systems to fit your requirements. Custom MEMS Test Software. We can write custom software for device-specific calibration and testing, interfacing various instruments and handling systems, or create a customized GUI. We can also adapt our standard STI Test Software to work on your hardware system.
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Test Automation System
RT-Tester
Verified Systems International GMBH
Designed to perform automated hardware-in-the-loop tests and software component test on process or thread level for embedded real-time systems. The functional components of RT-Tester can be structured as shown in the figure to the left. Please click on the small image to enlarge the picture. The System Under Test (SUT) denotes the object to be tested.
