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Development Boards
Advantech Development boards provide a schematic software & reference to reduce design effort at the development stage. Development Boards have been designed in order to allow customers to verify the functions of COM, text carrier board problems and support COM series. Advantech has designed a Development Board which can be used to test carrier board problems and support COM series, and Qseven, ETX / XTX form factors.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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ET+UT System
Xiamen IDEA Electronic Technology Co., Ltd.
1.ET and UT detection system and testing equipments for pipe hydraulic pressure vessel 2.test: NDT Ultrasonic & eddy current3.Scan mode: A,B,C type scan4.Brand: IDEA
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Coax, Contact, Receiver, 20/26 GHz, SF142B, 90 Series modules only
610102109
Primary mating contact 610102110. (May mate with other ITA contacts, as well.)Mechanical SpecificationsDurability 20,000 cyclesContact Material Shield – BrassCenter Conductor – BeCuContact Plating 30µ" Au over 100µ" NiContact Termination Shield – Crimp/ClampInsulator PTFEMating Force 3.0 lbs max [1.36 kg]Electrical SpecificationsCharacteristic Impedance 50 OhmsFrequency Range DC to 26 GHzVSWR 1.15 + .01 (f) GHz w/ SF142 (20 GHz)Insertion Loss .06 x√f(GHz) dBDWV 800 V RMS Shield to cen...show more -
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Digital Multimeter
M3500A
USBTMC stands for USB Test & Measurement Class. Any USB device conforms to USBTMC without the limitations of operation systems and environment can work under VISA assistance, and communicate with a computer.In other words, the control procedures via VISA to USBTMC device and via VISA to GPIB device are the same.
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Cable Test Van
ETL-40
ETL-40 is a fully-equipped van-mounted cable test and fault location system.Centralised digital control provides easy operation of the system while multi-level safety and protection ensures complete operator safety.
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USB Controlled High Precision Audio Test Interface
AudioConnect 4×4
AudioConnect 4×4 is a high accuracy 4-in, 4-out audio interface specifically audio test and measurement. It offers digital and analog audio in and out at any user-specified sampling rate up to 200kHz, and a high signal to noise ratio and wide frequency response, making it suitable for the most demanding measurement applications. Controls are simple – a single USB connection and a power indicator – all other typical soundcard controls that are not used for audio test applications have been eliminated to make operation and calibration simple with no room for error. AudioConnect 4×4 is supplied fully calibrated.
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Walk / Drivable test facilities
TW / CW series
Walk or drive-in temperature and climatic test chambers can be designed from CTS by a standardized grid system affordable in all sizes. The refrigeration performance data are adjusted here by our experienced sales and project engineers on your testing out. The walk / drive-chambers are ideal for larger components and finished products. CTS as a medium sized company attaches great importance to the detail quality of the equipment components, with only the best supplier products such as compressor and solenoid valves are used. Your resulting advantages are trouble-free long-term operation and thus no loss of valuable test time.
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MIPI Test Fixtures & Software
The UNH-IOL has been a contributing member of the MIPI Alliance since 2007 and tests all mobile devices looking for MIPI conformance and physical layer testing including C-PHY, D-PHY, DSI, and CSI-2. All UNH-IOL MIPI Test Fixtures and Tools are available to member and non-member companies. Below are just some of the MIPI Solutions we offer. For a full list please visit our MIPI Test Fixtures page.
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Epi Thickness & Composition
FTIR (Fourier Transform Infrared) is the most important technology for measuring epitaxial film (Epi) thickness, measuring impurities in Silicon and monitoring dielectrcis, like Borophosphosilicate glass (BPSG), FSG, PSG, etc in semiconductor industry. FTIR is evolving from a primarily quality control (wafer supply chain) technology to a tool/process/chamber (test wafers) monitoring technology and more importantly, a device (product wafers) monitoring tool.
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Tx/Rx BenchBlade
This ATCA compatible test card offers the flexibility to verify the performance of Advanced TCA fabric and base channels. The set of four Transmit pairs and four Receive pairs allows access to a full channel's eight pairs for logic card characterization. The card includes a HM-ZD male right angle connector segment for access to the Zone 2 connectors of a switch fabric or node card. Edge-launch SMA connectors are utilized for ease of test cable attachment. SMT pads are included on the receive pairs.
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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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ST/MT Family
MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR, SiC, GaN, etc) packaged and unpackaged (discrete, module and substrate). ST System is a test equipment suitable to verify stability or drift of all static parameters of discrete power semiconductors.
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Electrodynamic Vibration Test Systems
J-series
J-series is a high-functionality system that offers usability and durability furnished with functions that accommodate high velocity and large displacement testing.
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Vehicle Test Systems
What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
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Programmable Wide Frequency AC Power
PWF series
The PWF series is a family of programmable AC power source with wide range of adjustable frequency, developed for aerospace or military’s 400Hz and 800Hz test applications, such as lab use, compliance test, and quality assurance. The PWF series consists of L series and M series, which have different output frequency range. L series provides 45~500Hz and 0~300V output, and M series provides 300~800Hz and 0-150V output. Users can select communication interfaces of RS-485, RS-232, and optional GPIB. The PWF series also have programming sequence functions of STEP and GRADUAL modes, three phase independent control, phase angle control, and disturbance function.
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600MHz To 4GHz Radiation Measurement System
RMS-0640
The MegiQ Radiation Measurement System (RMS) is a compact test system that performs 3-axis radiation pattern measurement in non-anechoic spaces.
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SMA-Male to N-Male Test Cable
C50SMNM
Our 2N-to-SMA test cable is made to ideally suit our larger line of vector network analyzers. The C50SMNM operates at a frequency of 18000 MHz and is compatible with select family lines of vector network analyzers including our Compacts, Full Size, and Cobalt analyzers.
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Environmental Walk-in Chambers
State of the Art, mechanically refrigerated, walk-in and drive-in environmental test equipment rooms created to exactly match your requirements. In partnership with the leading manufacturer of prefabricated walk-in rooms in the Western United States, we offer the most modern and technically sophisticated, cooled, heated and humidity controlled, insulated structures available.
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HMM+™ Tester
Model 4702
The Model 4702 HMM+™ is a completely new tester primarily intended for device level testing and produces a current waveform as specified in the IEC-61000-4-2, from a 50 ohm source impedance system.*This tester provides device level test data that allows users to evaluate the IEC current waveform protection level of their devices. We included failure identification by leakage current increases in the 4702 tester so precise pass/failure levels can be closely measured.*The 4702 HMM+™ provides a new and improved test connection method for making quantifiable and repeatable device level HMM measurements.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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PCI Resistor Card 2-Channel 2 Ohm To 65.5k Ohm
50-293-033
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Mechanical Testing
A range of processes including:Tensile and Compression Load TestingA test piece or component is subjected to tension (or compression) until either a proof load is achieved or failure occurs.Testing can be carried out on both metallic and some non-metallic materials.
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Instrument Test Unit
Instrument Test Unit For Advanced Inertial Sensors (INTU) is used for testing and evaluation of Ring Laser Gyro (used in GSLV/PSLV launch vehicles), that detects the angular displacement during rotation. The INTU receives displacement signals from the sensor (RLG) to evaluate the sensor characteristics and also generates signals required towards initiating the action of the sensor.
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Standard Probe Station Chucks & Accessories
In this test solutions section of our website we describe the expanding line of Abet PV IV probe stations for the growing variety of solar cell types and sizes being developed around the world. This page describes a line of vacuum chucks and accessories for top/bottom, top/top, and bottom/bottom solar cells from 3 x 3 mm to 300 x 300 mm. Probe stations for multiple device on a single substrate and multifunction probe stations are described further in the sections highlighted to the left of this page.
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Autoranging Digital Multimeter w/Bargraph
HH2209
High Accuracy (Basic Accuracy 1.0%)Jumbo LCD display 3260 count, 21mm figure heigh with BaragraphAuto Ranging or Manual Ranging at your choiceHigher Voltage test up to AC 750V and DC 1000VHigher Current test up to 20AResistance test up to 30MΩTemperature test range from -4oF or 1832oFWide Frequency test range up to 300kHzDiode test, audible continuity check and Transistor testLow Battery Indication
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High Impact Shock Test System
KRD16 series
High impact shock test system meets MIL-S-901D standard which covers shock testing requirements for ship board machinery, equipment, systems, and structures, excluding submarine pressure hull penetrations. The purpose of these requirements is to verify the ability of shipboard installations to withstand shock loadings which may be incurred during wartime service due to the effects of nuclear or conventional weapons.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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PXI 3A Power MUX BRIC, 24-Channel, 12-Pole
40-571-306
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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PCI High Density Potentiometer Card 9-Channel, 8-Bit, 0 To 255 Ohm
50-296A-121-9/8
The 50-296A series are Programmable Potentiometer versions of the 50-295A Programmable Resistor cards with up to 9-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
