Test System Integrators
-
product
Test Systems
Computer Gesteuerte Systeme GmbH
The system is pin and software compatible to the larger test systems LB302 / 303. Due to the fewer needed I/Os, the tester features the compact G6 receiver (Virginia Panel Cooperation) compared to the larger G12 of the other tester versions. The LB301 is equipped with a 2kW power supply and can control one load box.
-
product
Signal Integrity Test Products
RoBAT RCI
*TDR & TDT, Measurement Capabilities*Impedance, Skew, Backdrill measurements*Automated Optical Inspection*DC Electrical Test*Now available with 4 heads*24 port (1 port per channel) TDR/TDT unit*Future capabilities – Fully automated VNA test (4 port S-Parameter Measurement)
-
product
Mini In-Circuit Test System
U9403A
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
-
product
D-Mic Testing System
BK3012V2
Easy to use and faster than human testers can load, the new BK3012V2 is the upgrade of our popular BK3012 D-Mic tester. Setup is even easier than for the BK3012 and you can enter specifications and be ready for testing in a few minutes. As well as testing, the BK3012V2 can be connected to a computer, so you can keep your results and analyze them for current quality and trends over time.
-
product
Smart Aircraft System
The Astronics Smart Aircraft System makes that possible. Our patented system enables the immediate, cabin-wide gathering of thousands of data points using sensors & IoT (Internet of Things) technology. The result? You get the insightyou need—when you need it. Insight that helps you on every flight. Insight that allows you to improve your operational efficiency, your cabin safety, and your overall passenger experience.
-
product
Mezzanine System
3564
The 3564 is a four channel comparator board with a common mode range of -150V to 150V on the two differential inputs and a DAC per channel to set trigger levels. The high common mode range and DC coupling provides a robust solution to level detection and triggering.
-
product
Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
-
product
Flexible Test Environments and Integration Services for your Integrated System Tests
TESTERLYZER® Frame 4.0
The TESTERLYZER® Frame 4.0 provides a flexible test environment for vehicle control units in an integrated system and is easily accessible from all sides. Customized adaption is provided for panel designs, control unit holders and cable adapters. A TESTERLYZER® I-Box 4.0 is a standard component of the TESTERLYZER® Frame 4.0 and provides the basis for a wide range of structures for the testing of control units, software and services relating to vehicles in research and development. The backbone of the I-Box provides all signals required with distribution to standardized adapter sockets and interfaces. The modular assembly structure ensures swift and safe setting up of the required test environment.
-
product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
-
product
HV Enclosures with Integrated Safety Test
The HV test hood according to Performance Level e (ISO 13849-1), developed by us according to the EN50191 standard (erection and operation of fixed and temporary electrical test installations), offers the highest safety for the operator. The large test chamber is enclosed with a hood made of sturdy, highly insulating and transparent plastic. During the test, there is a clear view of the test specimen. A signal light visually indicates safe opening when the light is “green”. “Red light” symbolises danger, the hood cannot be opened due to the safety interlock. The safety switch also ensures that the hood cannot be opened during the test. This means that the test hood fulfils all the required specifications for compulsory contact protection.
-
product
Electroluminescence Test Systems
The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
-
product
Ferroelectric Test System
RT66B
Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
-
product
Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
-
product
ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
-
product
Turret Integrated Rotating Systems (OMFV)
Slip Rings can be fitted on tank turrets and military vehicles for frontline operations, allowing power, Ethernet, video and CAN bus signals to be transmitted on the battlefield using fiber optic channels.
-
product
Portable Test System
MT781
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
-
product
Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
-
product
OpenVPX Integrations
Sundance Multiprocessor Technology Ltd.
Listed below are our OpenVPX based COTS integrations.We have products with ADC, DAC, DAQ video etc.
-
product
Vibration Test Systems
L.A.B.’s Vibration Test Systems help you design high quality, cost-effective products and shipping containers by accurately measuring sensitivity to vibration.
-
product
In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
-
product
Test Automation System for Durability Testing
STARS MATS
STARS MATS is a Mileage Accumulation Test System application available with the STARS Automation platform for chassis dynamometer. The application provides test execution, equipment control, refueling, and vehicle state monitoring to perform long endurance test without the necessity of continuous staff presence. Its flexible design offers a wide range a customization, and it addresses the different testing requirements from manual to fully-automated operation.
-
product
Inertial And Integrated GPS/Inertial (IGI) Sensor Testing
SimINERTIAL
Overcoming PNT/GNSS positioning challenges with precision inertial sensor emulation, for powerful IGI testing. Integrating inertial sensors is an effective way to overcome the weaknesses of GNSS positioning systems. However, it also adds a set of challenges to the development process. Once inertial sensors have been verified, it is necessary to test the complementary positioning systems alongside each other.
-
product
Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
-
product
Integrators
Integrators are used to meassure electric charges in real time. In contrary to digital charge integration, the analog integrator accuracy does not depend on the frequncy of data sampling and can resolve small changes disregarding the data sampling rate. In case of pulsed signals, the analogue integration produces reliable results without requiring high data transfer rates.
-
product
Mezzanine System
5676
The Abaco SystemsP/N 5676 ECM module provides eight channels of 16 bit voltage measurement in the 0 to 2.5V volt range. For each channel the common mode voltage range is -100 volts to +100 volts.
-
product
Automated Test Systems
Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
-
-
product
0.3M Integrating Sphere For Leds Luminous Flux Test
CX-0.3S
Shenzhen Chuangxin Instruments Co., Ltd.
Thesystem are composed of integrating sphere, spectroradiometer and computer to determine the spectroradiometric and colorimetric parameters, e.g. spectral power distribution, chromaticity coordinates, correlated color temperature, color rendering index, color tolerance, color difference, luminous flux, current, voltage, wattage, etc.
-
product
Mezzanine System
5174
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
-
product
Relay Testing System
UNO
With high power outputs package in an extremely compact and rugged system, the UNO has a tremendous power-to-weight ratio. The design incorporates the latest in modern digital microprocessor technology to achieve unbeatable output characteristics in terms of power, accuracy, low distortion, and dynamic capability. This hi-tech solution enables the testing of many different functions required in relay testing without the need of additional accessories.
