Inline AOI System

The 7505-02 Automated Optical Inspection System is integrated with high speed camera to shoot Roll to Roll manufacturing processes of ITO (Indium Tin Oxide) film, RFID and FPC that is Line-scan Image Inspection System with PC-based structure.

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Automated Optical Inspection Solutions

Chroma ATE Inc.

Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system

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In-Process Wafer Inspection System

7945 - Chroma ATE Inc.

Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.

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3D Wafer Metrology System

7980 - Chroma ATE Inc.

Chroma 7980 Wafer Metrology System applies White Light Interference Measurement Technique to perform nondestructive and rapid surface profile measurement and analysis.

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3D Optical Profiler

7503 - Chroma ATE Inc.

Chroma 7503 uses the technology of white light interfaces to measure and analyze the surface profile of micro-nano structures with sophisticated scanning system and innovative algorithms.

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Multi-Functional Optical Measuring System

7505-05 - Chroma ATE Inc.

Recent advancement in optical inspection technology continues to find its path into a variety of market applications. Innovative automated optical testing has become essential and indispensable in areas such as effective dimensional measurement to ensure product manufacturability and process control.

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Cylindrical Battery Cell Automated Optical Inspection System

7505-K006 - Chroma ATE Inc.

The Chroma 7505-K006 Cylindrical Battery Cell Automated Optical Inspection System equipped with high-resolution camera can perform 2D defect detection that is suitable for inspecting various sizes of cylindrical batteries on the mainstream market.

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Thin Film Thickness Automated Optical Metrology System

7505-K007 - Chroma ATE Inc.

The Chroma 7505-K007 Thin Film Thickness Automated Optical Metrology System equipped with 3D sensor is suitable for Roll to Roll processing and thin film thickness measurement. The stage embedded with vacuum adsorption function, making soft UUT a flat surface.

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Inline Printing Quality Automated Optical Inspection System

7505-K009 - Chroma ATE Inc.

The Chroma 7505-K009 Inline Printing Quality Automated Optical Inspection System equipped with high-resolution camera can perform 2D defect detection that is suitable for Roll to Roll processing and on-line control. Both front and rear sides can be inspected at the same time.

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Multi-Functional Optical Profiling system

7505-01 - Chroma ATE Inc.

Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.

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Mini LED Backlight Module Automatic Optical Test System

7661-K003 - Chroma ATE Inc.

Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness

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Automatic Optical Cell/Wafer Inspection System

7200 - Chroma ATE Inc.

Among several factors for PV to achieve grid-parity, Reliability of the PV Modules plays an important role. Since its known that some of the cell defects such as edge chips/ flakes, bumps of cell surface were proved to be source of infant mortality of the c-Si PV modules, therefore, to detect those defects is very important for c-Si cell manufacturers.

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Solar Cell Quality Classifier

7210 - Chroma ATE Inc.

The Croma 7210 has built two functions which are color sorting and printing inspection in one structure. With the compact "2 in 1" design, it not only optimizes the floor space but also maximizes the performance.

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Printer Automatic Optical Inspector

7210-P - Chroma ATE Inc.

Chroma 7210-P is an inspector to examine solar cells during metallization process. Its small dimension design can be easily installed on the metallizing rotary table. The defects on the c-Si PV cells that caused by front-side (sunny-side) printing process may affect the performance, reliability and appearance.

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Solar Wafer Geometry and Surface Inspector

7201 - Chroma ATE Inc.

The Chroma 7201 was designed to measure wafer lengths, widths, diagonal, orthogonal and chamfer size and angle, it is also capable to detect surface stains. User friendly software and GUI enable versatile parameter setting and result, it also provides a defect display and storage function for further analysis or potential MES/CIM integration.

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Solar Wafer Quality Inspector

7202 - Chroma ATE Inc.

In the design of 7202, Chroma has come out with a unique optical design that ensures the result of grain-size calculation is highly repetitive.

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Solar Cell Frontside Printing and Surface Defect Inspector

7212-HS - Chroma ATE Inc.

Chroma 7212-HS is a linescan AOI inspector used to provide superior PV cells defect inspection. As the fine grid printing process goes even faster than before, a reliable printing quality inspector is inevitable to reduce the cost during the PV cells metallization.

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Solar Safer Sawmark Inspector

7231 - Chroma ATE Inc.

Sawmarks happened during the wafering process because of the impurities or vibration of the wires. It happens sometimes in near the edge and sometimes in the center. By following the British standard of EN 50513 2009, Chroma is able to provide the solution that also sense the sawmarks in the center.

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Solar Cell Backside Printing Surface Inspector

7213-AD - Chroma ATE Inc.

Defects causes by back-side printing process of C-Si PV cells will also cause performance, reliability impact. Among all the back-side printing defects, bumps caused by improper printing may cause high cell breakage rate during lamination of c-Si module process.

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Anti-Reflection Coating Inspector

7214-D - Chroma ATE Inc.

Chroma 7214-D is the inspector for Anti-reflection coating process. With 4M mono CCD and Chroma's experience RGB illumination design, we could assure that each defined defectives could be identified through our specified combination.

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