Showing results 1 - 15 of 474 products found
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Company: McBain Systems
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Company: Chroma ATE
Integrated with 2D Geometry, Surface, Micro Crack, Saw mark inspection system and Resistively & Thickness, Lifetime tester by customer defined, Chroma 3710HS is a fully user configuration wafer sorter system with very low breakage rate and high through put. Chroma 3710HS solar wafer inspection system is ideal for PV incoming process. Plus wafer can be sorted by user defined algorithm fully automatically into coin stack or cassette. The unique auto coin stack/cassette exchange feature eliminates system down time when changing full coin stack/cassette to empty coin stack/cassette manually.
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Company: Olympus
The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufactures who maintain the highest quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily.
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Company: EV Group
EVG's metrology solutions for wafer inspection and measurement are optimized for lithography and all types of bonding applications. Customers can choose between integration of the metrology technology within fully-automated equipment, or stand-alone metrology systems serving multiple process steps. EVG's metrology solutions are optimized to maximize our customers' production yields, featuring:
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Company: SEC Co. Ltd
Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Company: Kurtz Ersa
USB 2.0 WVGA Digital Camera High Resolution, 90 BGA Optical Lens ( 300 m) Halogen Light Source; long life bulb Light Management with flexible arm and optional accessories: fiber optic light brush & fan; mechanical iris adapter Flexible & ESD safe stand and table allows for a total of 7 axes of movement of optics and PCB ImageDoc Basic Software with Large Database of Problems & Solutions "Plug & Play" set up
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Company: Kurtz Ersa
The ERSASCOPE 2 now uses megapixel, digital USB 2.0 camera technology offering up to 400 % more resolution! Enhanced images allow for increased clarity when zooming to higher magnifications, especially when using the revolutionary Flip Chip optical lens! Superior picture quality, increased light sensitivity and plug & play ease of use with USB 2.0 technology are the value added advantages. Finally, a new Metal Halide Light Source offers a brighter white light and a mechanical iris adapter for the additional gooseneck lighting with 2 standard fiber optic light brushes.
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Company: WIT Co. Ltd
Automatic appearance inspection systems are evolving in response to ever-evolving mounted PCBs. However, there is little major change in visual inspection process. Rather, it eseems that burden on visual inspection work is ever-increasing due to the miniaturizaiton of mounted components.
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Company: Malcom Co. Ltd
Inspection system for measuring paste area and volume easily.
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Company: SHOWA Electronics
112A: The automatic meter inspection system 112A, which is the most appropriate for the inspection of remote watt-hour meters, 12B: The automatic meter inspection system 112B collects watt-hour meter signals and sends the data to personal computers through a two-wire circuit.
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Company: Jonas & Redmann
Our Wafer Inspection System – WIS - carries out a fully automated inspection of mono- and polycrystalline silicon wafers. The modular design of the system means that individual configuration with the latest inspection technologies as well as smooth integration into your product lines is possible.
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Company: Glenbrook Technologies
A high performance real-time X-ray inspection system designed for inspection of multi-layer, assembled printed circuit boards, with dense metal BGAs, and recommended for lead free inspection requirements. Our RTX-113HV system meets all your needs for inspecting BGA packages.
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Company: QuadTech
The QuadTech Inspection System with SpectralCam is the only system that provides 100% defect inspection and true spectral color measurement, providing defect-free printing and accurate, high-quality color packaging.
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Company: Nanometer Technologies
The Eagle Inspection System archives information that shows details and images of individual inspection as well as giving the user the ability to provide customized quality control reports.
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Company: Pony Industry Co
Off-line Microfocus X-ray Inspection System equipped with PONY ORIGINAL Direct Conversion X-ray Camera; SID-A50. Suitable for inspection of BGA, CSP, and LGA on PCB.
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Company: Yamashita Denso
It comes with a complete set of wafer handing system with edge grip and place a wafer on the inspection stage automatically. Optional automated defect inspection software enables wafer sorting by automated inspection results of defects. Inspection categories are, dimple, mound, saw mark, non-uniform polishing marks, orange peel, SORI and others.
