Showing results 1 - 15 of 486 products found.
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Chroma ATE Inc.
Integrated with 2D Geometry, Surface, Micro Crack, Saw mark inspection system and Resistively & Thickness, Lifetime tester by customer defined, Chroma 3710HS is a fully user configuration wafer sorter system with very low breakage rate and high through put. Chroma 3710HS solar wafer inspection system is ideal for PV incoming process. Plus wafer can be sorted by user defined algorithm fully automatically into coin stack or cassette. The unique auto coin stack/cassette exchange feature eliminates system down time when changing full coin stack/cassette to empty coin stack/cassette manually.
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CIX100 - Olympus Corp.
The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufactures who maintain the highest quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily.
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EV Group
EVG's metrology solutions for wafer inspection and measurement are optimized for lithography and all types of bonding applications. Customers can choose between integration of the metrology technology within fully-automated equipment, or stand-alone metrology systems serving multiple process steps. EVG's metrology solutions are optimized to maximize our customers' production yields, featuring:
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ERSASCOPE 2 - Kurtz ersa Corp.
The ERSASCOPE 2 now uses megapixel, digital USB 2.0 camera technology offering up to 400 % more resolution! Enhanced images allow for increased clarity when zooming to higher magnifications, especially when using the revolutionary Flip Chip optical lens! Superior picture quality, increased light sensitivity and plug & play ease of use with USB 2.0 technology are the value added advantages. Finally, a new Metal Halide Light Source offers a brighter white light and a mechanical iris adapter for the additional gooseneck lighting with 2 standard fiber optic light brushes.
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ERSASCOPE 1 - Kurtz ersa Corp.
USB 2.0 WVGA Digital Camera High Resolution, 90 BGA Optical Lens ( 300 m) Halogen Light Source; long life bulb Light Management with flexible arm and optional accessories: fiber optic light brush & fan; mechanical iris adapter Flexible & ESD safe stand and table allows for a total of 7 axes of movement of optics and PCB ImageDoc Basic Software with Large Database of Problems & Solutions "Plug & Play" set up
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X-eye 7000B - SEC Co., Ltd.
Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Vision Station - ViTrox Technologies
Design and manufacture vision inspection system for SOT, SOD, TO, DPAK, SOIC, TSOP, SSOP, QFN/MLP, ODFN and LED inspection.
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TD-4M - Malcom Co.,Ltd.
Inspection system for measuring paste area and volume easily.
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RTX-113HV - Glenbrook Technologies
A high performance real-time X-ray inspection system designed for inspection of multi-layer, assembled printed circuit boards, with dense metal BGAs, and recommended for lead free inspection requirements. Our RTX-113HV system meets all your needs for inspecting BGA packages.
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QuadTech, Inc.
The QuadTech Inspection System with SpectralCam is the only system that provides 100% defect inspection and true spectral color measurement, providing defect-free printing and accurate, high-quality color packaging.
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NEO-690Z / NEO-890Z - Pony Industry Co.,Ltd
Off-line Microfocus X-ray Inspection System equipped with PONY ORIGINAL Direct Conversion X-ray Camera; SID-A50. Suitable for inspection of BGA, CSP, and LGA on PCB.
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Yamashita Denso Corp.
It comes with a complete set of wafer handing system with edge grip and place a wafer on the inspection stage automatically. Optional automated defect inspection software enables wafer sorting by automated inspection results of defects. Inspection categories are, dimple, mound, saw mark, non-uniform polishing marks, orange peel, SORI and others.
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Aera4™ - Applied Materials, Inc.
The Applied Aera4 Mask Inspection system is a fourth-generation 193nm-based inspection tool unique in combining true aerial imaging with cutting-edge high-resolution imaging. Equipped with a new lithography-grade lens, the Aera4 system demonstrates improved signal-to-noise for both standard high-resolution applications and aerial inspection, making it the tool of choice for 1x nm technology nodes and for early-production EUV mask inspection.
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VERSAMag - FS Inspection
Advanced technology and a sleek design come together in the VERSAMag High-Magnification Inspection System. The HD high-resolution camera generates sharp images, resulting in exceptional inspection of objects at all magnification levels. This portable visual inspection system has magnification up to 155x with real-time video inspection and intuitive controls. The VERSAMag has a multi-axis positioning camera and adjustable Z-height arm for versatility to inspect objects of various shapes and sizes. When paired with FSInspection software, the VERSAMag has measurement, image capture, and annotation capabilities.
