Showing results 1 - 15 of 4495 products found.
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DX-2012SA - Dexing Magnet Tech. Co., Ltd
Under continuous frequency of 1 kHz to 500 kHz, automatic measurement of magnetic hysteresis loop of the soft magnetic materials such as silicon steel, precision alloy, non-crystal and ferrite, accurate measurement on the dynamic magnetic characteristic parameters such as amplitude permeability µa, loss angle d, loss iron Pc, remanence Br and coercivity Hc.
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IES Systems, Inc.
IES Systems is a turnkey test system solution provider with proven experience in Acceptance Test Procedure (ATP) testing, Highly Accelerated Stress Screening (HASS) and Environmental Stress Screening (ESS) testing. Tactical Tomahawk Program, Standard Missile Program, Patriot Missile Program, M39 Tactical Missile System Program, Advanced Gun System Program.
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Hitex GmbH
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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NFC Xplorer - CISC Semiconductor GmbH
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Alfamation S.p.A
Alfamation brings its engineering imagination and decades of creativity and scientific passion to solve functional test applications in the automotive, consumer electronics, telecom and medical industries. By leveraging industry standards and developing technology innovations, Alfamation challenges the traditional approach to functional test system development that results in reduced costs and increased test system flexibility.
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Circuit Check, Inc.
With over thirty years of experience in the test business and hundreds of satisfied customers, Circuit Check supplies all types of test automation, from automating small bench tests to supplying turn-key manufacturing end-of-line ATE systems to developing custom robotic and conveyorized ATE and parametric measurement systems.
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LB302 - Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The 'device under test' (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance. Every new test system has the same pinning as it was defined during the process of standardization. This allows it to perform a self-test using a special adapter. In addition, it is also now possible for the adapter manufacturer to build a DUT adapter without knowledge of the test system.
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ENGMATEC GmbH
We offer complete systems with ICT and functional test, handling system and transport system.An efficient module system allows flexible combination of series equipment and thereby the realization of customer-specific solutions.
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CT/VT - Eltel Industries
The CT/VT test system is designed to test CTs over the range of 5...3,200 amperes and VTs over the range of100..33,000 volts. The system is self contained and includes all the required power supplies to generate the test voltage& current, the appropriate reference CTs and VTs, a set of burdens to load the test CT/VT to the required operatingpoint and an Automatic CT/VT comparator to measure the errors of the test specimen transformer with respect to thereference transformer.
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LB303 - Computer Gesteuerte Systeme GmbH
The LB303 test system is the largest version of the LB-300 series. It is designed for development as well as for production. The test system features the durable G12 receiver from the Virginia Panel Cooperation for the adapter interface. The LB303 is equipped with a power supply of max. 6 kW and can control up to 2 load boxes (in an external rack).
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AL-METER - UNITES Systems a.s.
The AL-METER test system is designed for ferrite cores AL parameter measurements, at predefined pressure. The test system is composed of two parts: AL-BRIDGE and TWISTING DEVICE. AL-BRIDGE includes all the necessary instrumentation for the inductance measurement and it can be used separately. TWISTING DEVICE provides the mechanic socket for DUT and the wiping functions.
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ETS-88RF - Teradyne, Inc.
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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LB301 - Computer Gesteuerte Systeme GmbH
The LB301 test system is the smallest version of the LB-300 tester series. It is designed for development as well as for production. The system is pin and software compatible to the larger test systems LB302 / 303. Due to the fewer needed I/Os, the tester features the compact G6 receiver (Virginia Panel Cooperation) compared to the larger G12 of the other tester versions. The LB301 is equipped with a 2kW power supply and can control one load box.
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USB Explorer 280 - Ellisys Sàrl
The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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LQ400 Series - Computer Gesteuerte Systeme GmbH
The qualification test systems of the LQ400-series are used to test the life time of multiple DUTs at the same time. The main improvements are the implementation of the Xdbus technologie and a trouble-free and cost-saving change-over to other DUTs. The load box is simulating the environment of the car as realistic as possible. Real loads (e.g. motors for power windows) are directly switched from the DUT to qualify.
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microFLEX / FLEX - Teradyne, Inc.
The microFLEX and FLEX test systems deliver cost-efficient multisite production test for devices operating under 200 MHz digital speed. Choose microFLEX / FLEX for testing mid-range devices for power management, automotive, audio and video. With microFLEX / FLEX, you optimize capital investment while achieving superior performance and throughput.
