Wafer & Die Testing
ipTEST now offers a range of multi-prober test systems with increased productivity and increased capability for power discrete wafer testing. Perform power discrete wafer testing and Known Good Die (KGD) tests.
ipTEST now offers a range of multi-prober test systems with increased productivity and increased capability for power discrete wafer testing. Perform power discrete wafer testing and Known Good Die (KGD) tests.
