The EST806 Electrostatic Firing/Igniter/ Spark Sensitivity Test Systems are designed for military electrostatic discharge test standards. It contains several test setups and configurations to determine personnel borne ESD, helicopter borne ESD
The ES613 model ESD simulator is an all new ESD simulator designed with exchangeable RC network modules, zap-counter, remote control, optional battery, secondary ESD discharge detector and fast rise time tip. It meets the requirements of standard IEC61000
ESD Current Targets are calibrated according to standards IEC/EN 61000-4-2 or ISO10605. This model A4002 ESD Current Target Adapter Line allows the user to measure the frequency response of ESD targets within the requirements of standards up to 4GHz.
Used for testing of DAWN RWR PCB's in JAMMER. 19" Rack Mountable with built in wide range of IO signals. Used in 4th line servicing of PCB's. Used in LRU and system level testing Detects 100% fault coverage including track faults.
The MiniZap is a battery operated , hand-held 15kV ESD test simulator for performing contact mode and air discharge mode testing. It is the defacto industry standard for ESD testing of products at the system level.
Our I-SITETM based test instrumentation allows us to make many types of measurements on both visible (CMOS, CCD, etc.) and infrared (thermal) imagers as well as system level tests (i.e., lens and imager).
Test software can be broadly divided into two categories — instrument drivers, and system level. For the commercial off-the-shelve instruments that commonly go into a test system, drivers usually come from the manufacturer and are like the front-panel knobs and buttons of a conventional instrument — they work the same no matter what you’re testing. It’s the system level software that focuses on your specific application. And that’s where we come in. ATE Software.
SLEC System-HLS finds design errors that other tools miss by formally comparing the functionality of a system level model written for HLS with its corresponding synthesized RTL design across all possible input sequences. Unlike combinational equivalence checkers, SLEC System-HLS does not require one to one mapping of registers.
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
LGA50 test sockets ensure successful LGA packaged device testing. LGA50 specifically addresses the demanding high-performance signal integrity requirements for high-frequency component and system-level testing. These high-performance, standardized compression-mount test sockets accommodate a wide range of standard and custom package sizes and I/O counts.
Cascade Microtech has developed BGA test sockets to specifically address the demanding high-performance signal integrity requirements for high-frequency component and system-level testing. These high-performance, compression-mount test sockets accommodate a wide range of standard and custom package sizes and I/O counts.
The G40 Grypper BGA test socket delivers substantial time and cost savings for the testing of 0.4mm – 0.65mm pitch BGA packaged devices. Versatile and cost-effective, the G40 is ideal for development, system level test and device failure analysis.