The EST806 Electrostatic Firing/Igniter/ Spark Sensitivity Test Systems are designed for military electrostatic discharge test standards. It contains several test setups and configurations to determine personnel borne ESD, helicopter borne ESD
ESD Current Targets are calibrated according to standards IEC/EN 61000-4-2 or ISO10605. This model A4002 ESD Current Target Adapter Line allows the user to measure the frequency response of ESD targets within the requirements of standards up to 4GHz.
The Chroma 3111 Tabletop Single Site Test Handler is an automated Pick & Place system ideal for engineering and test development of IC System Level Testing (SLT). The 3111 system is capabile of handling a vast variety of device types and sizes ranging from 5x5mm to 45x45mm.
Used for testing of DAWN RWR PCB's in JAMMER. 19" Rack Mountable with built in wide range of IO signals. Used in 4th line servicing of PCB's. Used in LRU and system level testing Detects 100% fault coverage including track faults.
The MiniZap is a battery operated , hand-held 15kV ESD test simulator for performing contact mode and air discharge mode testing. It is the defacto industry standard for ESD testing of products at the system level.
Our I-SITETM based test instrumentation allows us to make many types of measurements on both visible (CMOS, CCD, etc.) and infrared (thermal) imagers as well as system level tests (i.e., lens and imager).
Test software can be broadly divided into two categories — instrument drivers, and system level. For the commercial off-the-shelve instruments that commonly go into a test system, drivers usually come from the manufacturer and are like the front-panel knobs and buttons of a conventional instrument — they work the same no matter what you’re testing. It’s the system level software that focuses on your specific application. And that’s where we come in. ATE Software.
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
LGA50 test sockets ensure successful LGA packaged device testing. LGA50 specifically addresses the demanding high-performance signal integrity requirements for high-frequency component and system-level testing. These high-performance, standardized compression-mount test sockets accommodate a wide range of standard and custom package sizes and I/O counts.
Chroma 3270 is an innovative handler for high volume/multisite miniature IC testing, especially for CIS Testing (CMOS Image Sensor), at system level. It is capable of handling devices of a large variety of package types including QFP, TQFP, BGA, PGA, etc. The handler uses pick and place technology to pick up devices from JEDEC trays, move them to the test site, then move them to the appropriate bin after test.
Cascade Microtech has developed BGA test sockets to specifically address the demanding high-performance signal integrity requirements for high-frequency component and system-level testing. These high-performance, compression-mount test sockets accommodate a wide range of standard and custom package sizes and I/O counts.