Mixed Signal Test

SCANFLEX is a revolutionary new hardware platform, created to enable for extended Boundary Scan test and ISP solutions, taking full advantage of the technical potential provided by today's and tomorrow's standards. SCANFLEX excels when it comes to speed, flexibility, and modularity of a Boundary Scan test system. But it does not stop there, ad ...more

Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Map ...more

This is a new model in the WL27 mixed logic/power LSI test system, for use with high pin count. It is ideal for the parallel testing of mixed A/D power devices, such as automotive application. TheWL27 is best solution mixed tester offering high-speed throughput and superior cost performance. ...more

Test Designer is today's only complete design simulation and verification system for analog, mixed-signal and mixed-systems design, which also features full fault and test synthesis capability. For the first time ever, engineers can efficiently design, simulate and test complex analog and mixed-signal circuitry in the design cycle ...more

High-Speed State Caching for improved throughput performance. Digital Simulation. Guided Probe Diagnostics. Boundary Scan.  ...more

ASE Test provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor in ...more

Based on a 125 MHz, 512 pin digital test system, the S310 supports ShibaSoku's traditional high-speed, high-accuracy, high pin count. A wide variety of analog and DC modules are installed. The S310 is an ideal mixed LSI test system for a wide variety of analog and digital devices. This test system achieves high-speed throughput and low cost due ...more

BS442 combines 4 independent analog channels and 8 time synchronized logic channels in one powerful test instrument. Consider modern embedded systems, component video, 3-phase motor control, process control, 3D robotics, and automotive systems.  ...more

Mixed-signal testing has until recently been a costly and complex issue, either reserved for the few organisations that could afford the expensive, highly versatile types of mixed-signal ATE systems or left to restricted, often difficult-to-use ad hoc test solutions. ...more

HiLevel's newest Low-cost Production Tester offers direct-docking with a new compact manipulator. This system provides up to 512 logic pins, mixed signal, and data rates of up to 150MHz. Our precision pogo tower is designed to be compatible with popular existing docking interfaces. ...more

The advanced instrument for Mixed Signal Testing. Its highly accurate analog modules, very low noise floor and advanced Digital IO capabilities take Mixed Signal testing to a next level of performance.  ...more

The ABTS-3010 is a mixed signal In-Vehicle Data Acquisition package.  It uses a combination of microphones and accelerometers to detect audible noise created by various brake components.  The package also records various environmental conditions that can be used to characterize the occurrences. ...more

The LA Series help minimize your project risk by providing the most reliable, accurate data capture and the most complete view of system behavior. These products are ideally suited for you on hardware/software debug, parametric and mixed signal testing and complex debugging. Moreover, their compact size and ability to connect to a PC makes them an ...more

The RI7100A ATE System is a configurable and extremely capable tester for a wide variety of IF, RF, and Microwave devices from 5 Khz up to 20 GHz. From simple Power Amplifiers and LNAs to complete Transceivers and Systems, testing is accomplished through a universal Test Head interface. ...more

A large number of today's electronic devices are driven by a seamless combination of analog and digital technology. At the heart of these devices are complex mixed-signal ASICs. The development cycle of these ASICs consist of iterations of designing, prototyping and testing; with a lot of importance placed on testing due to the absolute necess ...more

The Programmable Video Generator and Analyzer (PVGA) provides the user with a highly flexible video test instrument. The PVGA can simultaneously generate multiple video signals in a full complement of formats- composite (interlaced or progressive scan), stroke (XYZ), mixed video (composite and stroke interleaved), and modulated or rectilinear ...more

TestEdge engineers have an average of 17 years of engineering experience in test, packaging, and fixturing. This experience is across a wide spectrum of products, customers, and ATE platforms. We have experience in all of the following: Digital, analog, mixed-signal, RF Test programming services Remote test capability Semi-automatic test generati ...more

TestEdge delivers experienced IC test engineering and consulting services to a wide variety of customers, including consumer electronics firms, telecommunication companies, the automotive industry, and the US Government. We offer complete test solutions for digital, analog, mixed-signal, and RF devices. In addition to being test consultants, we of ...more

The GT50-DIO is a high-speed dynamic digital I/O card. The GT50-DIO provides all the features of high-speed dynamic digital testers normally seen only in large functional test systems. The GT50-DIO may be combined with other PC instruments to form a mixed-signal test system. ...more

The Verigy 93000 Compact Test Head offers the lowest entry-level price for the Verigy 93000 Series scalable platform, specifically targeting the digital and mixed-signal consumer final test and wafer sort markets. With this cost-effective solution from Verigy, manufacturers now have a single, high performance test solution for engineering, waf ...more

Merging the power of the TITAN with the popular formfit of our legendary ETS systems, HiLevel proudly offers the Griffin. This system provides up to 512 logic pins, 400MHz clocks, mixed signal, and data rates of up to 200MHz. The Griffin is not only low cost, but a powerful tool for Design Verification, Failure Analysis, and Production. ...more

The TSG490Y is the ultimate sync and test pattern generator designed to satisfy all needs of broadcast serial digital (Standard and HD) and mixed digital/analog, post-production, outdoor broadcast and other operational environments. It provides all the timing and test signals, including LTC and VITC, needed to satisfy any application in NTSC, PAL, ...more

The FETtest AMX400 is a modular, high performance system for aproduction analog/mixed-signal test applications. Offering a variety of instrumentation options. The AMX400 provides a wide array of testing capabilities in a small footprint at an affordable price ...more

The FTS-200 Mixed-Signal Functional Test System Platform is a complete integrated test solution designed to test common electronic device functions using state-of-the-art measurement hardware, test fixtures and test execution software. ...more

The newest member of the HiLevel family boasts up to 1,024 logic pins, up to 4,096 DC pins, 400MHz clocks, mixed signal, direct docking, and data rates of up to 200MHz, plus two compare strobes per cycle. ...more