Burn-In Sockets
| Related Searches: | BGA Test Sockets, Burn-In Boards, CSP Test Sockets, High Power Burn-in, PLCC, QFN, QFP, SOIC |
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| Expand Your Results: | Burn-In, Test Sockets |
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CSP/MicroBGA ARIES ELECTRONICS, INC. Contact Info Send To Colleague Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by ...more -
ZERO INSERTION FORCE ARIES ELECTRONICS, INC. Contact Info Send To Colleague PGA TEST AND BURN-IN SOCKETS. A strong, metal cam activates the normally closed contacts, preventing dependency on plastic for contact force. The handle can be provided on right or left hand side. Consult factory for special handle requirements. ...more -
CSP/MicroBGA ARIES ELECTRONICS, INC. Contact Info Send To Colleague Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. ...more -
CT-1 - Burn-in Board Continuity Tester Micro Control Company Contact Info Send To Colleague Burn-in Board Coninuity Tester. Verifies burn-in board continuity and component tolerances. 768 I/O channels, can be forced to the constant current source or grounded independently. Highly accurate measurement of resistance, voltage, and capacitance using a pair of precision instrumentation amplifiers. Optional foot switch or keyboard control ...more -
ABES-IV - Automatic Burn-In\Environmental Systems for Logic and Memory Devices Micro Control Company Contact Info Send To Colleague Automatic Burn-In/Environmental System for Logic and Memory Devices. Up to 256 digital I/O channels per burn-in board. Up to 130 amps of programmable power to the devices under test (5 separate voltages). Large system capacity of up to 32 burn-in boards; Large burn-in boards with 20.25 inches x 21.5 inches of socket space. ...more -
3M Textool SOIC Sockets 3M Company Contact Info Send To Colleague With decades of experience on the market, 3M Textool SOIC Sockets provide a proven, reliable test and burn-in interface for JEDEC SO style packages in pin counts of 8 to 28. ...more -
Test Sockets Synergetix Contact Info Send To Colleague Test Socket features; pitches from 0,40mm, solutions for any device (including area array and peripheral devices for any footprint), high performance burn-in to high frequency producton and characterization socket. ...more -
HPB-1 - High-Power Burn-In System Micro Control Company Contact Info Send To Colleague High-Power Burn-In System. This system is for burn-in of devices up to 20 watts is available with ABES-IV or ABES-V electronics and test capability. Individual temperature control for each device under test up to 20 Watts.Tests high-pin-count devices to IEEE Standard 1149 specifications. Optional per-socket temperature control on up to 24 devi ...more -
Quad Flat Pack (QFP) Sockets PLASTRONICS SOCKET COMPANY, INC. Contact Info Send To Colleague Available in 0.50 and 0.65 mm Pitches. The worlds only Pressure Mount QFP sockets! Save time and money with maintenance on burn-in boards. Meets Jedec spec MS-026 ...more -
Leadless Chip Carrier (LCC) Sockets PLASTRONICS SOCKET COMPANY, INC. Contact Info Send To Colleague Plastronics LCC sockets have been in use for test and burn-in since 1982 providing a low-cost, reliable test solution for manual and automatic loading. Offering the widest selection of LCC sockets in the world, Plastronics offers 3 new socket options specifically designed for Amkors VisionPak" packages. These sockets are designed for ...more -
Lead Tip Contacting (SSOP) Sockets PLASTRONICS SOCKET COMPANY, INC. Contact Info Send To Colleague True Zero Insertion Force (ZIF) Socket. Design simplicity. Optimal airflow during burn-in. Automated or manual loading Timely delivery. Device probing and testing through open top design. Trapped contacts Compact size ...more
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