Burn-In System

The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.

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Topics

Systems
Burn-In
Test Systems
System Test
Integrated Circuit
High Frequency
Circuit
Monitoring
Ovens
Drivers