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Showing results 4426 - 4440 of 4583 products found.

  • Phase Sequence Meters

    Beha-Amprobe

    Phase sequence meter is used for detecting the sequence of the supply in three-phase electric circuits. Since the direction of rotation of three phase electric motors can be changed by changing the phase sequence of supply. And also the correct operation of measuring instruments like 3 phase energy meter and automatic control of devices also depend on the phase sequence. Different types of phase sequence testers are available in today’s market like contact or non contact, static or rotating, etc., in a wide range of voltage or power ratings.

  • STIL, WGL & VCD/EVCD Graphical Display & Validation Tool

    DFTView - Source III, Inc.

    DFTView is the first product on the market that allows you to simultaneously display STIL and WGL source code with their equivalent graphical waveforms. This enables test engineers to debug complex test programs more efficiently and accurately. DFTView can be used for pre-silicon validation of test patterns after translation, often in conjunction with VTRAN, or it can be used post-silicon to diagnose real-time tester problems.

  • Stimulus Induced Fault Testing

    SIFT - FA Instruments

    SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.

  • Surface Analysis

    Bruker AXS GmbH

    Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.

  • Surface Analysis

    Bruker Daltonics

    Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.

  • Surface Analysis

    Bruker Nano Analytics

    Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.

  • Surge / DC Hi-Pot Consoles

    HC Model - PJ Electronics, Inc.

    (Surge / Hi-Pot Consoles) - Now available in High Voltage models - 35,40 & 50KV. The HC Model offers Surge / DC Hi-Pot testing capabilities! The "HC" Model has all of the features of our "C" Model plus a DC Hi-Pot Tester. DC Hi-Pot includes dual LED panel meters that display direct read out of current and voltage, with overcurrent safety trip and the capability of ascertaining Polarization Index (PI) Test results.

  • Surge with 3 Phase Transfer Switch Consoles

    TC Model - PJ Electronics, Inc.

    (Surge with 3 Phase Transfer Switch Consoles)  Although all PJ Surge Testers are capable of testing 3 Phase Motors, this "TC" Model has the same characteristics as the "C" Model, but includes a Built-in 3 Phase Test Selector Switch that facilitates 3 phase motor testing by mechanically re-positioning the ground terminal.

  • Switch Mainframe

    SW1002 - HIOKI E.E. Corp

    Switch between voltmeter and battery tester while testing. 264 channels max. (2-wire) to 72 channels max. (4-terminal pair). Circuit design friendly for impedance measurements that minimize errors between channels (Effect: 0.01% f.s.*). For BT4560 100 mΩ range, R measurements, and a measurement frequency of 1 kHz. For OCV measurement, internal resistance measurement, and external potential measurement of battery cells. Measure battery modules up to 60 V DC.

  • Switch Mainframe

    SW1001 - HIOKI E.E. Corp

    Switch between voltmeter and battery tester while testing. 66 channels max. (2-wire) to 18 channels max. (4-terminal pair). Circuit design friendly for impedance measurements that minimize errors between channels (Effect: 0.01% f.s.*). For BT4560 100 mΩ range, R measurements, and a measurement frequency of 1 kHz. For OCV measurement, internal resistance measurement, and external potential measurement of battery cells. Measure battery modules up to 60 V DC.

  • Handheld Return Loss Meter

    JW3308 - Shanghai Joinwit optoelectronic Tech,co.,Ltd

    JW3308 optical return loss meter is designed to measure a variety of optical devices, optical link return loss, optical fiber connector quality control is applied to the site of an optimized solution. Can be used separately optical return loss tester, insertion loss meter, optical power meter, light source, and having a data storage function.

  • LEON Desktop

    Konrad Technologies GmbH

    Based on standard PXI chassis and optionally equipped with the ABex technology, the LEON Desktop offers test engineers a flexible and cost effective test solution for desktop use or integration in customized test systems. It can easily be extended by functional test and boundary scan modules. As well as all testers of Leon Family the KT LEON Desktop is based on the multifunction card KT-PXI-501.Benefits Easy implementation Low cost Test in paralell Open Platform PXI Extrem modular

  • In-Line Hot Test Handler

    IHT - IPTE Factory Automation n.v.

    The IHT is an automatic Integrated Hot Tester for testing PCBs at a high temperature. The IHT consists of an oven section, followed by a test section. Its exchangeable bed of nails and press-on part stands for a fast product changeover without the intervention of service personnel. The upper-plate of the IHT moves under servo control, allowing very fast and accurate locking of the PCB on the fixture. Underneath the test section is sufficient room for testing equipment.

  • Installation Testers/Adapters

    Testboy GmbH

    Using five glow lamps, the rotary field tester, Testboy TV 410N, indicates the presence of all three phases and, through their sequence, determines the correct order of the phases. The housing is made from impact-resistant, unbreakable ABS plastic, the fully insulated 4 mm sockets and the associated comprehensive and adaptable connection cable set provide safe testing and rapid determination of the phasing in a three-phase system.

  • LT Cable Fault Locator

    Techno Instrumentation (India) Private Limited

    Inbuilt DC High voltage tester (Hipot) for cable fault detection.Inbuilt burning facility of more than 300 mA for high resistance faults.Surge generation(Thumping) up to 5 kV with 750 Joules energy.Cable fault distance locator for finding the distance to faults.Finding the exact location of fault using an Underground cable fault locator(Digipoint).