Showing product results. 1 - 15 of 182 products found.
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UniTest Inc.
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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B&K Precision Corporation
Unlike other handheld instruments such as LCR meters that make measurements using an AC signal with a specific test frequency, the 830C measures capacitance by applying a constant current that briefly charges, then discharges the connected capacitor.
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XP-8500 - Lorlin Test Systems
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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PeakTech Prüf- und Messtechnik GmbH
Digital LCR measuring device for resistance, capacitance and inductance with high-resolution dual multifunction display. Components can be measured in series or in parallel and the LCR meter also offers the choice between automatic and manual range selection.
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MME-ECT 20 - Minmax Electronics
MME-ADIT 40 is the latest MICROPROCESSOR based IC Tester from MINMAX ELECTRONICS. It functionally tests a wide variety of digital ICs up to 40 pins and Linear/Analog ICs up to 20 pins.
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Imapact 7BT - Lorlin Test Systems
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface.
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34XX - FETservice, Inc
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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TH9520A - Changzhou Tonghui Electronic Co., Ltd.
■ Six-in-one comprehensive analysis: High-power AC withstand voltage analysis DC voltage analysis Insulation resistance analysis Turn-to-turn insulation analysis DC low resistance analysis Inductance test analysis (option) ■ High-resolution: 7-inch 800 × 480 dots, TFT-LCD display
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TH9520 - Changzhou Tonghui Electronic Co., Ltd.
■ Six-in-one comprehensive analysis: High-power AC withstand voltage analysis DC voltage analysis Insulation resistance analysis Turn-to-turn insulation analysis DC low resistance analysis Inductance test analysis ■ High-resolution: 7-inch 800 × 480 dots, TFT-LCD display
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Sefram
RLC measurement bridges allow all precision measurements on components, either directly or by remote control.
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Testing Kits - Detectortesters
Solo testers are available either as separate components or as complete kits – configured both by height and application. The price of complete kits is usually less than the sum of the component parts.
