Showing recent results 1 - 15 of 131 products found.
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UniTest Inc.
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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B&K Precision Corporation
Component testing is a method where testing of each component in an application is done separately. Suppose, in an application there are 5 components. Testing of each 5 components separately and efficiently is called as component testing.
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Aplab Limited
A new generation of impedance test equipment with high accuracy, wide measurement range and six digits resolution. Being featured with test frequency up to 300kHz, test voltage of 5mV ~ 2V, built-in -5V ~ 5V DC bias and -10V ~ 10V DC voltage source output, it can meet all requirements for measuring components and materials and provide guarantees for production line quality assurance, incoming inspection and laboratory precision measurements. The Handler, RS232C and GPIB interfaces as well as improved command system provided by the instrument make it easier to build the test system.
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XP-8500 - Lorlin Test Systems
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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PeakTech Prüf- und Messtechnik GmbH
Digital LCR measuring device for resistance, capacitance and inductance with high-resolution dual multifunction display. Components can be measured in series or in parallel and the LCR meter also offers the choice between automatic and manual range selection.
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Imapact 7BT - Lorlin Test Systems
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface.
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TOS2000CT Series - Twintex Electronics Co., Ltd
Dual channel 20MHz/40MHz/50MHz10 times sweep magnificationTV synchronization; X-Y modeHigh illumination internal graticule CRTJapanese encoded switch, reliable and durableFully sealed durable attenuation switchALT triggering function, enabling simultaneous observation of two independent signals.
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34XX - FETservice, Inc
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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HF Test System - S.E.A. Datentechnik GmbH
With the component tester a complete system is available which allows testing of components for wireless communication
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TH840 - Matco Tools
*Test a variety of circuits without having to remove or disassemble components, significantly speeding up diagnosing failed component issues*Quickly test relays, coils, fuel injectors, spark plugs, solenoid valves, EGR valves, ISA valves and motors without having to remove or back probe wires*Move the tester side to side over component in question and if component is activated the tester will beep
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Testing Kits - Detectortesters
Solo testers are available either as separate components or as complete kits – configured both by height and application. The price of complete kits is usually less than the sum of the component parts.
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PeakTech Prüf- und Messtechnik GmbH
An extremely practical component tester for LEDs and other components. The device outputs an automatically raised output voltage between 0 to 300 V DC, which adapts to the connected load so that the sensitive components are not destroyed. Particularly suitable for the service and repair workshop.
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Lorlin Test Systems
The Double-Impact Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The system uses a Windows 10® 64-BIT OS and a USB 2.0.
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CR - Cirris Systems Corporation
As a wire harness tester, a cable tester, a continuity tester, a component tester, and a guided harness-assembly aid, the Easy-wire CR tester is versatile. The easy-wire CR features Windows based software that allows you to create custom graphics of your connectors and light LEDs to guide the harness assembly process. Test Points: 256-32,000, Test Current: 6.5 mA max
