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- Pickering Interfaces Ltd.
product
PXI Precision Resistor Module 9-Channel, 1.5 to 6.97k
40-297-024
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Test Fixture and Test Programing
Landrex Technologies Co., Ltd.
Test Fixture and Test Programing
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Test Tables / Test Consoles
Adaptronic test tables and test consoles are a decisive component of the adaptronic kit for the assembly of comfortable and high-quality test systems for the wiring test of manufactured cable harnesses of all types.
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Test Probes / Test Fixtures
INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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Test Fixtures & Test Sets
Keysight test fixtures are used to hold electronic components or materials (physically and electrically) in order to perform various measurements. Keysight offers a variety of test fixtures from Parametric, Dialectrice, Liquid test fixtures and more.Some of our test fixtures allow you to connect directly to your measurement instrument, while others require various adapters.
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Function Test and In-Circuit Test
CT350
ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Military Communications Test
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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FADEC/EEC Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Test Products & Platforms
Save yourself months of work on test specifications, component ordering, assembly and trial-and-error operation.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Test Accelerometer Sensitivity And Noise Test
Accelerometer Test Unit
*Quick and Accurate Accelerometer Test*Battery operation*All tests use 32-bit resolution A to D Converter*All data downloaded to PC via Ethernet link*Records all data to a flexible easy to use database*Records time and date of tests
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Test Software
Yelo Test Environment V5.0
The Yelo Test Environment (YTE) is an automated test environment developed by Yelo. Test sequences can be developed for multiple products and are tailored to customer needs and specifications. Flexibility in testing is a key benefit of the YTE and is provided to the user by allowing management of test sequence order. There is also the ability for the user to change the test limits or parameters for more or less stringent testing depending on requirements.
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Test Adapters / Aeroflex Test System
52xx / 5300
We develop and manufacture test adapters for your existing interface including documentation and test program
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Temperature shock test chambers test
TSS series
The operating principle of Schocktestprfschrank based of two superposed test rooms (top hot chamber, cold chamber below), between which a car with the test specimens is moved up and down by the large thermal shock test equipment may be subjected
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Shock Test System, Battery Test
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's shock test system used to measure and determine the impact resistance of a product or package. It is mainly used to evaluate the reliability of the function and the integrity of the structure of the test product under impact environment. Suitable for impact testing of aerospace, aerospace, marine, military, consumer electronics, automotive, household appliances and display equipment.